Download or read book Transmission Electron Microscopy of Silicon VLSI Circuits and Structures written by Robert B. Marcus and published by Wiley-Interscience. This book was released on 1983 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Transmission Electron Microscopy of Silicon VLSI Circuits and Structure written by Robert B. Marcus and published by . This book was released on 1984 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2017-12-19 with total page 3276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.

Download or read book Silicide Technology for Integrated Circuits written by Institution of Electrical Engineers and published by IET. This book was released on 2004-12-21 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book to provide guidance on the development and application of metal silicide technology as it emerges from the scientific to the prototype and manufacturing stages. Other key topics covered are fundamentals, present and future silicide technology for Si-based devices, and characterisation methods. Suitable for engineers and students in microelectronics.

Download or read book ULSI Semiconductor Technology Atlas written by Chih-Hang Tung and published by John Wiley & Sons. This book was released on 2003-10-06 with total page 688 pages. Available in PDF, EPUB and Kindle. Book excerpt: More than 1,100 TEM images illustrate the science of ULSI The natural outgrowth of VLSI (Very Large Scale Integration), Ultra Large Scale Integration (ULSI) refers to semiconductor chips with more than 10 million devices per chip. Written by three renowned pioneers in their field, ULSI Semiconductor Technology Atlas uses examples and TEM (Transmission Electron Microscopy) micrographs to explain and illustrate ULSI process technologies and their associated problems. The first book available on the subject to be illustrated using TEM images, ULSI Semiconductor Technology Atlas is logically divided into four parts: * Part I includes basic introductions to the ULSI process, device construction analysis, and TEM sample preparation * Part II focuses on key ULSI modules--ion implantation and defects, dielectrics and isolation structures, silicides/salicides, and metallization * Part III examines integrated devices, including complete planar DRAM, stacked cell DRAM, and trench cell DRAM, as well as SRAM as examples for process integration and development * Part IV emphasizes special applications, including TEM in advanced failure analysis, TEM in advanced packaging development and UBM (Under Bump Metallization) studies, and high-resolution TEM in microelectronics This innovative guide also provides engineers and managers in the microelectronics industry, as well as graduate students, with: * More than 1,100 TEM images to illustrate the science of ULSI * A historical introduction to the technology as well as coverage of the evolution of basic ULSI process problems and issues * Discussion of TEM in other advanced microelectronics devices and materials, such as flash memories, SOI, SiGe devices, MEMS, and CD-ROMs

Download or read book Istfa 98 written by ASM International and published by ASM International. This book was released on 1998-01-01 with total page 453 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Silicon written by and published by . This book was released on 1986 with total page 1144 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Analytical Techniques for Thin Films written by K. N. Tu and published by Elsevier. This book was released on 2013-10-22 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt: Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.

Download or read book Industrial Applications Of Electron Microscopy written by Zhigang Li and published by CRC Press. This book was released on 2002-12-04 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.

Download or read book Scanning Electron Microscopy X Ray Microanalysis and Analytical Electron Microscopy written by Charles E. Lyman and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Introduction to Optoelectronic Sensors written by Giancarlo C. Righini and published by World Scientific. This book was released on 2009 with total page 585 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Preface -- Part I: Optoelectronic Sensors Technologies -- 1. Fiber and Integrated Optics Sensors: Fundamentals and Applications G. C. Righini, A. G. Mignani, I. Cacciari and M. Brenci -- 1. Introduction -- 2. Fiber and Integrated Optics: Fundamentals of Waveguiding -- 3. Waveguide Sensors: Basic Working Principle -- 4. Fiber Optic Sensors -- 5. Long-Period Optical Fiber Grating Sensors -- 6. Micro-structured Fiber Sensors -- 7. Integrated Optic Sensors -- 8. Conclusions -- References -- 2. Fiber Bragg Grating Sensors: Industrial Applications C. Ambrosino, A. Iadicicco, S. Campopiano, A. Cutolo, M. Giordano and A. Cusano -- 1. Introduction -- 2. Fiber Bragg Gratings History -- 3. Fiber Bragg Gratings as Sensors -- 4. Civil Applications -- 5. Aerospace Applications -- 6. Energy Applications -- 7. Oil and Gas Applications -- 8. Transport Applications -- 9. Underwater Applications -- 10. Perspective and Challenges -- References -- 3. Distributed Optical Fiber Sensors R. Bernini, A. Minardo and L. Zeni -- 1. Introduction -- 2. Linear Backscattering Systems -- 3. Non-Linear Backscattering Systems -- 4. Non-Linear Forward-Scattering Systems -- 5. Conclusions -- References -- 4. Lightwave Technologies for Interrogation Systems of Fiber Bragg Gratings Sensors D. Donisi, R. Beccherelli and A. d'Alessandro -- 1. Introduction -- 2. Operating Principle of the Fiber Bragg Grating Sensor -- 3. FBG Interrogation Techniques -- 4. An Integrated Tunable Filter using Composite Holographic Grating -- 5. POLICRYPS Filterbased FBG Sensors Interrogation -- 6. Conclusions -- Acknowledgments -- References -- 5. Surface Plasmon Resonance: Applications in Sensors and Biosensors R. Rella and M. G. Manera -- 1. Introduction -- 2. SPR Theory -- 3. Optical Sensors based on Surface Plasmon Resonance -- 4. Application of SPR in Chemical Sensors and Biosensors -- 5. SPR Instrumentation: From Traditional SPR Instrument to SPR Imaging -- 6. Future Capabilities -- References -- 6. Microresonators for Sensing Applications S. Berneschi, G. Nunzi Conti, S. Pelli and S. Soria -- 1. Introduction -- 2. Whispering Gallery Modes in a Microsphere -- 3. WGM Resonators: Applications in Sensing -- Acknowledgments -- References -- 7. Photonic Crystals: Towards a Novel Generation of Integrated Optical Devices for Chemical and Biological Detection A. Ricciardi, C. Ciminelli, M. Pisco, S. Campopiano, C. E. Campanella, E. Scivittaro, M. N. Armenise, A. Cutolo and A. Cusano -- 1. Introduction -- 2. Photonic Crystals 190; Fundamental Principles -- 3. Functional Photonic Band Gap Components and Devices -- 4. Photonic Crystals for Chemical and Biological Sensing -- 5. Photonic Crystal Fibers Sensors -- 6. Perspectives and Challenges -- References -- 8. Micromachining Technologies for Sensor Applications P. M. Sarro, A. Irace and P. J. French -- 1. Introduction -- 2. Bulk Micromachining -- 3. Surface Micromachining -- 4. Characterization of Thin Film Membranes -- 5. Conclusions and Outlook -- References -- 9. Spectroscopic Techniques for Sensors S. Pelli, A. Chiasera, M. Ferrari and G. C. Righini -- 1. Introduction -- 2. Absorption, Reflectance and Transmission Measurements -- 3. Luminescence Measurements -- 4. Raman and Brillouin Measurements -- 5. Conclusions -- References -- 10. Laser Doppler Vibrometry P. Castellini, G. M. Revel". -- OCLC.

Download or read book The GEC Journal of Research written by and published by . This book was released on 1993 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Effect of Disorder and Defects in Ion Implanted Semiconductors Electrical and Physiochemical Characterization written by and published by Academic Press. This book was released on 1997-05-23 with total page 321 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defects in ion-implanted semiconductors are important and will likely gain increased importance in the future as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects whose origin and annealing characteristics will need to be addressed. Publications in this field mainly focus on the effects of ion implantation on the material and the modification in the implanted layer afterhigh temperature annealing. Electrical and Physicochemical Characterization focuses on the physics of the annealing kinetics of the damaged layer. An overview of characterization tehniques and a critical comparison of the information on annealing kinetics is also presented. Provides basic knowledge of ion implantation-induced defects Focuses on physical mechanisms of defect annealing Utilizes electrical and physico-chemical characterization tools for processed semiconductors Provides the basis for understanding the problems caused by the defects generated by implantation and the means for their characterization and elimination

Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1979 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Microscopy of Semiconducting Materials and ULSI Devices written by Clive Hayzelden and published by . This book was released on 1998 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first symposium on electron microscopy and materials for ultra-large scale integration (ULSI) at the Society's meeting attracted 34 papers by contributors from Asia, North America, and Europe. They cover specimen preparation and defect analysis in semiconductor devices; metallization, silicides, and diffusion barriers; the advanced characterization of ULSI structures, and semiconductor epitaxy and heterostructures. Annotation copyrighted by Book News, Inc., Portland, OR