Download or read book Test par faisceau d lectrons et analyse d images written by Jean-Philippe Pierrel and published by . This book was released on 1992 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: CE TRAVAIL PORTE SUR L'ETUDE ET LA MISE EN UVRE D'UN SYSTEME INDUSTRIEL D'ANALYSE DE DEFAILLANCES DE CIRCUITS INTEGRES, EN L'ABSENCE DE DONNEES DE CONCEPTION, ET BASE SUR LE TEST PAR FAISCEAU D'ELECTRONS. LE PRINCIPE CONSISTE A COMPARER LES INFORMATIONS ELECTRIQUES (IMAGES STROBOSCOPIQUES ET COURBES) ISSUES DU COMPOSANT DEFAILLANT A CELLES D'UN CIRCUIT DE REFERENCE. LE DEVELOPPEMENT DE CES TECHNIQUES DE TEST A NECESSITE L'AUTOMATISATION DES PROCEDURES D'ACQUISITION. POUR RESOUDRE LE PROBLEME MAJEUR DE LA PROCEDURE DE COMPARAISON, A SAVOIR LE RECYCLAGE SPATIAL, NOUS AVONS MIS EN UVRE DES TECHNIQUES BASEES SUR LA CORRELATION D'IMAGES. CES TRAVAUX ONT DEBOUCHE SUR LA PRESENTATION DU SYSTEME DE DIAGNOSTIC ET DE RESULTATS OBTENUS AU COURS D'ANALYSES

Download or read book Test de circuit int gr s par faisceau d lectrons written by Hélène Frémont and published by . This book was released on 1988 with total page 402 pages. Available in PDF, EPUB and Kindle. Book excerpt: LE TRAVAIL PRESENTE COMPORTE UNE ETUDE THEORIQUE ET EXPERIMENTALE DE LA MESURE DE POTENTIEL SOUS FAISCEAU D'ELECTRONS A TRAVERS LES COUCHES ISOLANTES, PAR LA TECHNIQUE DU COUPLAGE CAPACITIF. UNE EXTENSION DU "MODE IMAGE" (RELEVE QUALITATIF) AU "MODE MESURE" (RELEVE QUANTITATIF) EST PRESENTEE. LES PHENOMENES DE CHARGE DES ISOLANTS ET D'ETALEMENT DE POTENTIEL ENTRE PISTES METALLIQUES SONT ANALYSES, ET LEUR IMPACT SUR LES PERFORMANCES EST EVALUE, A LA FOIS PAR MESURE DIRECTE ET PAR SIMULATIONS NUMERIQUES EN DEUX DIMENSIONS

Download or read book INDUSTRIALISATION D UNE METHODE DE LOCALISATION DE DEFAUTS SUR CIRCUITS INTEGRES PAR CRISTAUX LIQUIDES written by PASCALE.. VERGUIN DULIEUX and published by . This book was released on 1994 with total page 157 pages. Available in PDF, EPUB and Kindle. Book excerpt: L'EVOLUTION DRASTIQUE DE LA TECHNOLOGIE DE FABRICATION DES CIRCUITS INTEGRES REND DIFFICILE L'UTILISATION DES OUTILS D'ANALYSE CLASSIQUES. PARMI CES DERNIERS, LES CRISTAUX LIQUIDES PERMETTENT NEANMOINS LA LOCALISATION D'UN DEFAUT PHYSIQUE OU ELECTRIQUE SUR CIRCUIT INTEGRE. CETTE ETUDE A POUR OBJET DE PRECISER DANS QUELLES LIMITES ET SOUS QUELLES CONDITIONS LA METHODE DE TEST PAR CRISTAUX LIQUIDES RESTE VIABLE DANS UN ENVIRONNEMENT INDUSTRIEL. COMPAREE AUX OUTILS D'ANALYSE ACTUELLEMENT DISPONIBLES, CETTE METHODE, QUI AUTORISE A LA FOIS LA DETECTION DE POINTS CHAUDS ET LA VISUALISATION EN CONTRASTE DE POTENTIEL D'UN CIRCUIT EN FONCTIONNEMENT, REVELE UN TAUX DE COUVERTURE DE DEFAUTS ELEVE. SA LIMITE D'UTILISATION EN FREQUENCE EN FAIT UN OUTIL COMPLEMENTAIRE DU TEST PAR FAISCEAU D'ELECTRONS. MAIS LA MISE EN UVRE DES CRISTAUX LIQUIDES SOULEVE LES PROBLEMES DE LA FIABILITE ET DE LA REPRODUCTIBILITE DES MANIPULATIONS. AINSI, LA PRESENCE D'UN RELIEF EN SURFACE DU CIRCUIT SOUS TEST POURRA NUIRE A L'INTERPRETATION. DE MEME, LES ETAPES DE PREPARATION DE L'EXPERIENCE POURRONT METTRE EN PERIL LE CIRCUIT, SOUVENT UNIQUE, PRESENTANT LA DEFAILLANCE. AUSSI S'EFFORCERA-T-ON AU COURS DE CE TRAVAIL DE METTRE EN PLACE DES PROCEDES BIEN MAITRISES QUI MINIMISERONT LES RISQUES D'ERREURS. LA METHODE DE TEST PAR CRISTAUX LIQUIDES EST SUFFISAMMENT ATTRACTIVE POUR QUE L'ON S'ATTACHE A LA RENDRE FIABLE. ELLE PERMET EN EFFET LE TEST IN SITU DES COMPOSANTS DEFAILLANTS, CE QUI EVITE DE REPRODUIRE ARTIFICIELLEMENT LES CONDITIONS D'APPARITION DU DEFAUT AU RISQUE DE LE FAIRE DISPARAITRE, ET QUI AUTORISE L'UTILISATION DU PROGRAMME DE TEST NON MODIFIE D'UNE CARTE ELECTRONIQUE COMPLETE. C'EST CE QUI FAIT LA PARTICULARITE DE LA METHODE PAR RAPPORT AUX AUTRES DISPONIBLES ACTUELLEMENT. C'EST AUSSI L'ARGUMENT QUI A MOTIVE NOTRE CHOIX DANS UN CONTEXTE DE FABRICATION DE CARTES ELECTRONIQUES COMPLEXES

Download or read book Beam Injection Assessment of Defects in Semiconductors written by and published by . This book was released on 1989 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Download or read book Etude de la contr labilit des circuits int gr s par faisceaux d lectrons written by Dominique Micollet and published by . This book was released on 1988 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: Cette thèse propose quelques solutions au problème du développement de la contrôlabilité par faisceaux d'électrons. La première partie de ce travail passe en revue les phénomènes lies aux faisceaux d'électrons ainsi que les possibilités offertes par les faisceaux de photons. La seconde partie traite plus particulièrement du phénomène Ebic. Son étude théorique et expérimentale dans le cas d'une jonction Planar pn amène à la conclusion que la contrôlabilité requiert des énergies de faisceaux très supérieures à celles de l'observation, exigence qui induit d'importantes perturbations du faisceau. Ces dernières sont analyséss et quelques solutions proposées pour les reduire. La seconde conclusion de l'Ebic est que le faisceau ne permettra pas le contrôle du circuit dans une amplification du courant induit. La dernière partie de ce travail décrit des méthodes de conception de dispositifs MOS capables de contrôler un circuit lorsqu'ils sont actives par un faisceau. Ces méthodes sont basées sur l'assemblage de divers éléments tels que des charges ou des amplificateurs. Ces éléments sont étudiés séparément et leurs règles d'assemblage assurent la compatibilité des niveaux électriques pour une technologie donnée. Leurs essais sont rapportes en fin de travail

Download or read book Test par faisceau d electrons et analyse d images contribution au diagnostic automatique et assiste de pannes dans les circuits integres written by Jean-Philippe Pierrel and published by . This book was released on 1992 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Etude de circuits int gr s par contraste de potentiel written by Philippe Perdu and published by . This book was released on 1994 with total page 490 pages. Available in PDF, EPUB and Kindle. Book excerpt: NOUS UTILISONS LE CONTRASTE DE POTENTIEL LORS DE L'ANALYSE DE DEFAILLANCE DE CIRCUITS INTEGRES. CE CONTRASTE RESULTE DE L'OBSERVATION D'UN CIRCUIT INTEGRE EN FONCTIONNEMENT DANS UN MICROSCOPE ELECTRONIQUE A BALAYAGE. LE RELEVE DE TENSIONS CONTINUES EST PERTURBE PAR L'ACCUMULATION DE CHARGES POSITIVES DANS LA COUCHE DE PASSIVATION DES CIRCUITS INTEGRES. L'ANALYSE DE CE PHENOMENE DE CHARGE, MONTRE LES LIMITES DU MODELE DE LA BARRIERE DE POTENTIEL. NOUS AVONS ETABLI UN MODELE ELECTROSTATIQUE BASE SUR LE CALCUL DU CHAMP ELECTRIQUE EN TOUT POINT DE L'ISOLANT ET DE LA CHAMBRE DU MICROSCOPE. PAR SES EFFETS SUR LA TRAJECTOIRE DES ELECTRONS SECONDAIRES, CE CHAMP MODIFIE LE SPECTRE ET LE TAUX DE REEMISSION. LES VALEURS THEORIQUES OBTENUES CORRESPONDENT AUX VALEURS EXPERIMENTALES ET MONTRENT QU'UN CONTRASTE DE POTENTIEL STATIQUE PEUT ETRE RELEVE SI LA COUCHE DE PASSIVATION EST RECOUVERTE D'UNE COUCHE CONDUCTRICE. LE SONT DES SOLUTIONS POSSIBLES POUR ELIMINER CETTE CHARGE, NOUS POUVONS GRAVER LA COUCHE DE PASSIVATION OU LA COUVRIR D'UNE COUCHE ANTISTATIQUE. LA GRAVURE SECHE, MOINS RISQUEE QUE LA GRAVURE PAR VOIE HUMIDE, PEUT INDUIRE DES DERIVES PARAMETRIQUES, FORMER DES TRANCHEES ET GRAVER DES JOINTS DE GRAIN. LE DEPOT DE LIQUIDE PRESENTE UNE FAIBLE REPRODUCTIBILITE, UN EFFET LIMITE DANS LE TEMPS ET UNE POLLUTION DU CIRCUIT. LES DEPOTS DE CARBONE PAR EVAPORATION SONT REPRODUCTIBLES, UNIFORMES ET OPTIMISABLES. ILS N'ALTERENT NI LE CIRCUIT NI SON COMPORTEMENT ELECTRIQUE. ILS NE SONT PAS EFFICACES DANS TOUS LES CAS. A L'AIDE DE TROIS PLANS D'EXPERIENCES, L'ETUDE DES CONSEQUENCES DES TECHNIQUES DE PREPARATION SUR LA SENSIBILITE DU COMPOSANT A L'IRRADIATION CAUSEE PAR LE FAISCEAU D'ELECTRONS PRIMAIRES MONTRE QUE LES CIRCUITS GRAVES SONT LES PLUS SENSIBLES

Download or read book Reliability of High Power Mechatronic Systems 2 written by Abdelkhalak El Hami and published by Elsevier. This book was released on 2017-10-17 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt: This second volume of a series dedicated to the reliability of high-power mechatronic systems focuses specifically on issues, testing and analysis in automotive and aerospace applications. In the search to improve industrial competitiveness, the development of methods and tools for the design of products is especially pertinent in the context of cost reduction. This book proposes new methods that simultaneously allow for a quicker design of future mechatronic devices in the automotive and aerospace industries while guaranteeing their increased reliability. The reliability of these critical elements is further validated digitally through new multi-physical and probabilistic models that could ultimately lead to new design standards and reliable forecasting. - Presents a methodological guide that demonstrates the reliability of fractured mechatronic components and devices - Includes numerical and statistical models to optimize the reliability of the product architecture - Develops a methodology to characterize critical elements at the earliest stage in their development

Download or read book Acta electronica written by and published by . This book was released on 1984 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Comptes rendus de l Acad mie des sciences written by and published by . This book was released on 2000 with total page 720 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Canadian Journal of Electrical and Computer Engineering written by and published by . This book was released on 1995 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Backscatter Diffraction in Materials Science written by Adam J. Schwartz and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Download or read book Romanian Journal of Physics written by and published by . This book was released on 2007 with total page 530 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Government Reports Annual Index written by and published by . This book was released on 1992 with total page 1130 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Directory of Scientific and Technological Capabilities in Canadian Industry 1977 written by Canada. Ministry of State, Science and Technology and published by Ministry of State, Science and Technology. This book was released on 1978 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Physics of Radiation Therapy written by Faiz M. Khan and published by Lippincott Williams & Wilkins. This book was released on 2012-03-28 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dr. Khan's classic textbook on radiation oncology physics is now in its thoroughly revised and updated Fourth Edition. It provides the entire radiation therapy team—radiation oncologists, medical physicists, dosimetrists, and radiation therapists—with a thorough understanding of the physics and practical clinical applications of advanced radiation therapy technologies, including 3D-CRT, stereotactic radiotherapy, HDR, IMRT, IGRT, and proton beam therapy. These technologies are discussed along with the physical concepts underlying treatment planning, treatment delivery, and dosimetry. This Fourth Edition includes brand-new chapters on image-guided radiation therapy (IGRT) and proton beam therapy. Other chapters have been revised to incorporate the most recent developments in the field. This edition also features more than 100 full-color illustrations throughout. A companion Website will offer the fully searchable text and an image bank.