Download or read book Structural Factors in the Fault Diagnosis of Combinational Networks written by Jeffrey Donald Russell and published by . This book was released on 1971 with total page 166 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Module Level Diagnosis of Combinational Networks written by Ramachendra Prahlada Batni and published by . This book was released on 1974 with total page 674 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fault Analysis of Combinational Logic Networks written by Lung-Hsiung Chang and published by . This book was released on 1974 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Structural Aspects of Diagnosable System Design written by Richard Alan Poisel and published by . This book was released on 1977 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1971 International Symposium on Fault Tolerant Computing written by and published by . This book was released on 1971 with total page 170 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Computer Aided Design of Digital Systems written by William Magda VanCleemput and published by . This book was released on 1976 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Download or read book Fault tolerant Computing written by Dhiraj K. Pradhan and published by . This book was released on 1986 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fault-tolerant computing has evolved into a broad discipline, one that encompasses all aspects of reliable computer design. Diverse areas of fault-tolerant study range from failure mechanisms in integrated circuits to the design of robust software. Fault-tolerant computing is driven by a number of key factors, including ultra-high reliability, reduced life-cycle costs, and long-life applications. This book is intended to be both introductory and suitable for advanced-level graduates. Chapters can be selected in various combinations to provide courses with different orientations.
Download or read book Cybernetics Abstracts written by and published by . This book was released on 1977 with total page 950 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Rational Fault Analysis written by Richard Saeks and published by Marcel Dekker. This book was released on 1977 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.
Download or read book Computer Aided Design of Digital Systems written by and published by . This book was released on 1960 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book FTCS 7 written by and published by . This book was released on 1977 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by John Wiley & Sons. This book was released on 2003-10-24 with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt: Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Download or read book Cumulative Index to Entire IEEE Group Transactions journals 1951 1971 Subject written by Nichigai Asoshiētsu and published by . This book was released on 1973 with total page 1156 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Download or read book Index to IEEE Periodicals written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1971 with total page 578 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the IEEE, IEEE Transactions, IEEE Journals, IEEE Spectrum.
Download or read book Digital Processes written by and published by . This book was released on 1979 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt:
