Download or read book Reliability Evaluation of LSI Microcircuits written by James H. Lindwedel and published by . This book was released on 1973 with total page 211 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objectives of this evaluation were to (1) define common failure modes; (2) document failure analysis; and (3) develop better and lower cost electrical and stress test techniques for predicting, assessing, and assuring the reliability of LSI microcircuits. The approach to the evaluation included a canvass of the industry for failure modes experienced, tests used, and available process and logic function types. Next, an optimized and practical set of electrical tests and electrical-thermal stress tests were formulated for a quantity of 595 devices selected having hermetically sealed packages and manufacturing date in the first quarter of 1971. Process types included PMOS, PMOS ion implant, PMOS silicon gate, PMOS molybdenum gate, CMOS, bipolar, discretionary wired bipolar and Schottky diode clamped bipolar. Logic functions included a decade counter, five shift registers, a digital multiplier, five random access memories, and a time buffer register. Following the stress tests, devices were life tested at 125 C under dynamic excitation, power and load. Failed devices were analyzed at the subcomponent level. Related efforts included in the evaluation are covered in this report, such as failure modes experienced, tests, normal stabilities for device test data, and test effectiveness, for MOS and bipolar LSI microcircuits, and a failure rate prediction for several MOS microcircuits. (Author).
Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1974 with total page 888 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by and published by . This book was released on 1975 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Kieron A. Dey and published by . This book was released on 1981 with total page 443 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Evaluation of Polymer Coated Multi Chip Multi Level Microelectronic Assemblies written by John R. Szedon and published by . This book was released on 1975 with total page 123 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this program was to consider reliability factors relating to polymer coated, beam lead chip, hybrid microcircuits fabricated on substrates with multi-level conductors. Such assemblies were considered as a means to reduce the cost and volume of conventional electronic subsystems using discrete microcircuits in hermetic packages. Monolithic large scale integration (LSI) is one potential means of achieving the desired goals, but it involves difficulties in testing, it is not repairable, and it becomes economical only in large production volumes. Hybrids permit using less complex circuit chips produced with high yield and at lower cost than LSI circuits. Such hybrids could be tested during assembly and malfunctioning chips could be replaced before final encapsulation as necessary. Beam lead contacts offer potential economies in contact bonding and improved reliability. Multi-level conductor substrates should provide the interconnection complexity needed to realize the desired electronic functions. The use of silicon nitride over silicon dioxide as the primary passivation on beam lead circuit chips should given higher reliability as regards surface-related failures.
Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1979 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1982 with total page 1282 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Download or read book Reliability Evaluation of ECL Microcircuits written by E. T. Lewis and published by . This book was released on 1976 with total page 308 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of this study was to undertake a detailed analysis and reliability evaluation of ECL microcircuits available for use in high speed digital circuits. Special emphasis was placed on the effects of electromigration. The selected devices included SSI and MSI integration, one and two level metallization from a total of four major vendors. Metallization included aluminum with a silicon dopant, aluminum with copper and silicon dopants and pure aluminum with a titanium-tungsten barrier. Detail construction analysis and electrical characterization including thermal resistances were performed on all devices. Devices which failed during the performance of life testing were electrically categorized and physically analyzed to establish failure modes and mechanisms.
Download or read book Microcircuit Device Reliability Trend Analysis written by and published by . This book was released on 1985 with total page 371 pages. Available in PDF, EPUB and Kindle. Book excerpt: MDR-21 is a study of microcircuit field failure data based on various microcircuit types (digital SSI, MSI, LSI, linear, interface, memory and VLSI). The report includes failure rate data based on actual field failure records (data acquired from MDR-21A) calculated with Bayesian statistics. Failure distribution information is also presented in a quantifiable assembly of descriptive failure-related terms. Equipment-level comparisons were made to determine the impact on reliability relative to variations in manufacturers requirements. The text is complete with graphical representations and narratives in support of the study findings. Keywords include: Reliability trends; Bayesian statistics; Failure indicator/Mode distributions; Chi-square; Equipment manufacturer; and Influences.
Download or read book Reference Manual for Telecommunications Engineering written by Roger L. Freeman and published by Wiley-Interscience. This book was released on 1985 with total page 1568 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digest Defense Documentation Center written by Defense Documentation Center (U.S.) and published by . This book was released on 1975 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Technical Program written by and published by . This book was released on 1976 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book NBS Technical Note written by and published by . This book was released on 1979-08 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliable Computer Systems written by Daniel P. Siewiorek and published by CRC Press. This book was released on 1998-12-15 with total page 908 pages. Available in PDF, EPUB and Kindle. Book excerpt: This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Download or read book R D Abstracts written by Technology Reports Centre (Great Britain) and published by . This book was released on 1979 with total page 732 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Handbook for Silicon Monolithic Microcircuits Reliability assessment of monolithic microcircuits by J D Adams et al written by Texas Instruments Incorporated and published by . This book was released on 1969 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:
