Download or read book Proceedings Gettering and Defect Engineering in the Semiconductor Technology GADEST 87 written by H. Richter and published by . This book was released on 1987 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in the Semiconductor Technology written by H. Richter and published by . This book was released on 1987 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in the Semiconductor Technology GADEST 87 written by H. Richter and published by . This book was released on 1987 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in the Semiconductor Technology GADEST 87 written by H. Richter and published by . This book was released on 1987* with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in Semiconductor Technology written by Hermann G. Grimmeiss and published by Trans Tech Publications Ltd. This book was released on 1993-12-12 with total page 650 pages. Available in PDF, EPUB and Kindle. Book excerpt: Solid State Phenomena Vols. 32-33
Download or read book Gettering and Defect Engineering in Semiconductor Technology VI written by Hans Richter and published by Trans Tech Publications Ltd. This book was released on 1995-07-13 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: At the present time, Si-based technology is undergoing a transition to the next generation of substrates, having a diameter of 300 mm. The fundamental physical limits are being approached in terms of miniaturization, increased chip area, faster switching speeds, and diversity of operations. This raises the question of the intrinsic limits of the currently predominant semiconductor, silicon, and of those circumstances where it may be advantageous to turn to materials such as GaAs, InP, or SiC.
Download or read book Gettering and Defect Engineering in Semiconductor Technology IX written by Vito Raineri and published by Trans Tech Publications Ltd. This book was released on 2001-11-30 with total page 850 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gettering and Defect Engineering in Semiconductor Technology are discussed here,with particular emphasis being placed on device applications. Fundamental aspects,as well as technological problems which are associated with defects in electronic materials and devices, are addressed. Volume is indexed by Thomson Reuters CPCI-S (WoS). The topics in this volume were selected on the basis that single-crystal Si, and Si-based, semiconductors will dominate microelectronics until far into the 21st century. The main reason for the overwhelming success of silicon technology is economic: the production cost per area increases by a factor of 5, or even 10, on going from 200 mm Si wafers to compound semiconductors or other substrate materials.
Download or read book Gettering and Defect Engineering in Semiconductor Technology VII written by Cor Claeys and published by Trans Tech Publications Ltd. This book was released on 1997-07-25 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect control relies more and more upon advanced fabrication approaches such as the use of slow pulling rates and hydrogen annealing. Gettering techniques remain of key importance in enhancing the device yield.
Download or read book Gettering and Defect Engineering in Semiconductor Technology written by and published by . This book was released on 2005 with total page 844 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in Semiconductor Technology X written by Hans Richter and published by Trans Tech Publications Ltd. This book was released on 2003-09-30 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters CPCI-S (WoS). This volume is a collection of papers presented at the 10th International Autumn Meeting on "Gettering and Defect Engineering in Semiconductor Technology - GADEST 2003," which took place from the 21st to the 26th of September 2003 at the Seehotel Zeuthen, in the state of Brandenburg, Germany. The Seehotel Zeuthen, near Berlin, was an excellent location at which to provide a forum for interactions between scientists and engineers engaged in the field of semiconductor defect physics, materials science and technology; and to reflect upon aspects of the coming era of conversion from micro-electronics to nano-electronics. In addition, a particular ambition was to strengthen the interactions and exchanges between communities working in the fields of crystalline silicon for electronics and photovoltaics.
Download or read book Proceedings of the 2nd International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology written by GADEST. 2, 1987, Garzau and published by . This book was released on 1987 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in Semiconductor Technology VIII written by Hermann G. Grimmeiss and published by Trans Tech Publications Ltd. This book was released on 1999-08-11 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ever since the invention of the transistor, a fantastic and continual growth in silicon technology has been witnessed; leading to yet more complex functions and higher densities of devices. The current book summarises the key issues of this field. Among other topics, the outlook for silicon wafer technology and silicon materials engineering in the next millennium is reviewed and new approaches to the production of a 200 GHz silicon-based devices are described. Possible applications of dislocation luminescence in silicon are discussed as well as the hopes for, and limitations of, the Si:Er - based 1.54 mm emitter. Various properties of silicon-based materials and heterojunctions are characterised by using novel and state-of-the-art measurement techniques. Hydrogen- and oxygen-related defects, rare-earth impurities as well as radiation and gettering effects are discussed from various points of view.
Download or read book Gettering and Defect Engineering in Semiconductor Technology XI written by Bernard Pichaud and published by Trans Tech Publications Ltd. This book was released on 2005-12-15 with total page 830 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters CPCI-S (WoS). This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at La Badine at the Giens peninsula south of France.
Download or read book Gettering and Defect Engineering in Semiconductor Technology XIII written by Martin Kittler and published by Trans Tech Publications Ltd. This book was released on 2009-10-28 with total page 610 pages. Available in PDF, EPUB and Kindle. Book excerpt: This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices.
Download or read book Proceedings of the International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology written by and published by . This book was released on 1997 with total page 572 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in the Semiconductor Technology written by Helmut Richter and published by . This book was released on 1987 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Gettering and Defect Engineering in the Semiconductor Technology written by H. Richter and published by . This book was released on 1985 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt:
