Download or read book Generalized Multi Edge Analysis for K Edge Densitometry written by and published by . This book was released on 1998 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: In K-edge densitometry (KED), a continuous-energy x-ray beam is transmitted through a liquid sample. The actinide content of the sample can be measured through analysis of the transmitted portion of the x-ray beam. Traditional methods for KED analysis allow the simultaneous calculation of, at most, two actinide concentrations. A generalized multi-edge KED analytical method is presented, allowing up to six actinide concentrations to be calculated simultaneously. Applications of this method for hybrid KED/x-ray fluorescence (HKED) systems are discussed. Current HKED systems require the operator to know the approximate actinide content of each sample, and manually select the proper analysis mode. The new multi-edge KED technique allows rapid identification of the major actinide components in a sample, independent of actinide content. The proper HKED analysis mode can be selected automatically, without requiring sample content information from the user. Automatic HKED analysis would be especially useful in an analytical laboratory setting, where samples with truly unknown characteristics are encountered. Because this technique requires no hardware modifications, several facilities that use HKED may eventually benefit from this approach.
Download or read book Field Evaluation of a Combined K edge Densitometry and a K xrf System for Reprocessing Solutions Analysis written by H. Ottmar and published by . This book was released on 1992 with total page 13 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Nonlinear Fitting of Absorption Edges in K edge Densitometry Spectra written by and published by . This book was released on 1997 with total page 12 pages. Available in PDF, EPUB and Kindle. Book excerpt: A new method for analyzing absorption edges in K-Edge Densitometry (KED) spectra is introduced. This technique features a nonlinear function that specifies the empirical form of a broadened K-absorption edge. Nonlinear fitting of the absorption edge can be used to remove broadening effects from the KED spectrum. This allows more data near the edge to be included in the conventional KED fitting procedure. One possible benefit is enhanced precision of measured uranium and plutonium concentrations. Because no additional hardware is required, several facilities that use KED may eventually benefit from this approach. Applications of nonlinear KED fitting in the development of the Los Alamos National Laboratory (LANL) hybrid K-edge/x-ray fluorescence (XRF) densitometer system are described.
Download or read book The Hybrid K Edge written by H. Eberle and published by . This book was released on 1991 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book K edge Densitometer KED written by and published by . This book was released on 1993 with total page 109 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1979, a K-edge densitometer (KED) was installed by the Safeguards Assay group from Los Alamos National Laboratory in the PNC reprocessing plant at Tokai-mura, Japan. It uses an active nondestructive assay technique, KED, to measure the plutonium concentration of the product solution. The measurement uncertainty of an assay depends on the count time chosen, but can be 0.5% or better. The computer hardware and software were upgraded in 1992. This manual describes the operation of the instrument, with an emphasis on the user interface to the software.
Download or read book Development of a K edge densitometer for the on line measurement of U and Pu in the DNPE reprocessing plant written by L. Russen and published by . This book was released on 1985 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Semi empirical Modeling and Implementation of Hybrid K edge Densitometry for Pyroprocessing Applications written by Michael Paul Cooper and published by . This book was released on 2019 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The United States is currently looking at options for handling of spent nuclear fuel. Currently, there are ≈ 70, 000 metric tons of spent fuel in storage in the US alone. Pyroprocessing is a possible method for spent nuclear fuel reprocessing which was proven to work at Argonne National Laboratory. This masters thesis showcases a method for empirically modeling hybrid k-edge densitometry, one of the numerous possible safeguards needed for a reprocessing facility. This is accomplished by using MCNP to perform 54 sets of 2-stage simulations for KED and XRF, respectively. The end results are empirical linear functions for the magnitude of the k-edge drop of uranium and plutonium, as well as empirical functions for the XRF peaks for uranium and plutonium. These two empirical functions are functions of uranium concentration and plutonium to uranium mass fraction ratio, respectively. The semi-empirical functions are then implemented into the Sandia National Laboratory Separation and Safeguards Performance Model EChem (SSPM Echem) Simulink model. The SSPM is a Simulink model which can use modular safeguards functions for methods such as HKED, passive gamma, and passive neutron detection. These types of safeguards modules help to evaluate how much the standard error of inventory difference (SEID) is affected by additional safeguards, providing a quantifiable value. The empirical functions as well as multiple representative figures and tables are presented, showcasing the ability of the Simulink module to correctly predict the KED drops as well as the XRF peaks. The ultimate goal is to combine the KED and XRF into HKED measurements to get a value for the mass fraction of plutonium in salt. Plots showcasing the differences between the HKED module output and SSPM’s internal mass tracking are shown.
Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1971 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1971 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Bone Densitometry for Technologists written by Sydney Lou Bonnick and published by Springer Science & Business Media. This book was released on 2007-11-10 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: Sydney Lou Bonnick, MD, FACP, and Lori Ann Lewis, MRT, CDT, have updated and expanded their highly praised Bone Densitometry for Technologists to reflect the latest standards and developments in the field. Here radiologic technologists, nurse practitioners, physician assistants, and dedicated densitometry technologists can find new guidelines for bone density testing, new therapies for osteoporosis, and new treatment guidelines for osteoporosis, as well as new chapters on pediatric densitometry, body composition assessments, and the use of skeletal morphometry in diagnosis and fracture risk prediction.
Download or read book Analytical Techniques in Uranium Exploration and Ore Processing written by International Atomic Energy Agency and published by . This book was released on 1992 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1970 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Bureau of Standards 1970 written by Betty L. Oberholtzer and published by . This book was released on 1971 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Dosimetry in Diagnostic Radiology written by František Pernička and published by . This book was released on 2007 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This publication is intended to support those working in the field of diagnostic radiology dosimetry, both in standards laboratories involved in the calibration of dosimeters and those in clinical centres and hospitals where patient dosimetry and quality assurance measurements are of vital concern. This code of practice covers diverse dosimetric situations corresponding to the range of examinations found clinically, and includes guidance on dosimetry for general radiography, fluoroscopy, mammography, computed tomography and dental radiography. The material is presented in a practical way with guidance worksheets and examples of calculations. A set of appendices is also included with background and detailed discussion of important aspects of diagnostic radiology dosimetry.
Download or read book Thin Layer Chromatography for Binding Media Analysis written by Mary F. Striegel and published by Getty Publications. This book was released on 1997-04-24 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the study and conservation of art and artifacts, natural organic materials are frequently encountered in components such as coatings, binders, and adhesives. The identification of these materials is often crucial to the attempt to characterize the technologies employed by artists or craftspeople, understand the processes and causes of deterioration, and plan appropriate conservation treatments. Yet the limited resources of many conservation laboratories put many analysis techniques beyond their reach. Thin-layer chromatography can help fill this gap. The volume consists of a handbook, protocols, and guide to reference materials. The handbook serves as a primer for the basic application of thin-layer chromatography to the analysis of binding media, adhesives, and coatings found on cultural objects; the protocols provide step-by-step instructions for the laboratory procedures involved in typical analyses; and the guide to reference materials aids in the understanding of the types of materials and documentation needed for accurate analyses by thin-layer chromatography.
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
