Download or read book Fault Detection in Sequential Circuits written by Edward George Sable and published by . This book was released on 1973 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Test Mode Approach to Fault Detection in Sequential Circuits written by J. Rettig and published by . This book was released on 1969 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Detection in Asynchronous Sequential Circuits written by Jeng-Chuan Kau and published by . This book was released on 1970 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: "As the asynchronous sequential circuit has become more and more important to digital systems in recent years high reliability and simple maintenance of the circuit is stressed. This paper presents a fault-detection algorithm which will be applicable to most of the practical asynchronous sequential circuits. The asynchronous sequential circuit is treated from the combinatoric point of view. First the minimal set of states, both stable states and unstable states, sufficient to detect all possible faults of the circuit is found from the fault table. Then a test sequence is generated to go through these states. It is assumed that testing outputs can be added. Simple and systematic techniques are also presented for the construction of fault table and the generation of test sequence. The usefulness of this algorithm increases as the density of the stable states associated with the circuit increases"--Abstract, leaf ii.

Download or read book Fault Detection in Digital Circuits written by Arthur D. Friedman and published by Prentice Hall. This book was released on 1971 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Algorithm for Automatic Fault Detection in Sequential Circuits written by Donald Whitesell Hartman and published by . This book was released on 1968 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Detection of Intermittent Faults in Sequential Circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1978 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.

Download or read book Fault Detection in Sequential Circuits written by Vladimir Frantisek Berka and published by . This book was released on 1975 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Detection in Sequential Logic Circuits written by Thomas Charles Hartrum and published by . This book was released on 1969 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Test Mode Approach to Fault Detection in Sequential Circuit written by J. Rettig and published by . This book was released on 1969 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Stochastic Modeling in Fault Testing of Decomposable Sequential Circuits Through Computer Simulation written by Seong Yeon Choi and published by . This book was released on 1992 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this thesis, the detection of permanent faults in sequential circuits by random testing is analyzed utilizing the circuit partitioning approach together with a continuous parameter Markov model. Given a large decomposable sequential circuit, it is partitioned into several smaller partitions using either serial or parallel decomposition. For each partition with certain stuck faults specified, the original state table and its error version are derived from an analysis of the partition under fault-free and faulty conditions, respectively. Then by simulation of these two tables on a computer, the parameters of the desired Markov model are obtained. For a specified degree of confidence, it is easy to derive the parameters of the Markov model and to calculate the required lengths of random test patterns.

Download or read book Fault Diagnosis of Digital Circuits written by V. N. Yarmolik and published by John Wiley & Sons. This book was released on 1990 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.

Download or read book Self Fault Detection in Asynchronous Sequential Circuits written by Stanley Ray Groenig and published by . This book was released on 1971 with total page 41 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Detection in Fundamental mode Circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1972 with total page 92 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Diagnosis and Design for testability for Integrated Sequential Circuits written by Tao Li and published by . This book was released on 1985 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Diagnosis of Digital Systems written by Herbert Y. Chang and published by Krieger Publishing Company. This book was released on 1974 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Morgan & Claypool Publishers. This book was released on 2009 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References