Download or read book X Ray Diffraction Imaging written by Joel Greenberg and published by CRC Press. This book was released on 2018-11-02 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike. Teaches novel methods for X-ray diffraction imaging Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms Features state-of-the-art work of international authors from both academia and industry. Includes practical applications in the medical, industrial, and security sectors

Download or read book X ray Diffraction Imaging written by Joel Alter Greenberg and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explores novel use of X-ray diffraction technology that opens an entirely new field of looking at objects, human organs, baggage suitcases, or contraband substances. The ability to perform spatially-resolved material discrimination significantly enhances the performance of medical and industrial radiography, as well as contraband and explosives detection systems. To this end, a number of approaches have been developed, including fluorescence, hyperspectral transmission, phase contrast, and coherent scatter imaging, that are explained throughout the book. Featuring chapters written by an international selection of authors from both academia and industry, the book covers both imaging and detection in practical applications for medical, industrial, and security fields.

Download or read book Coherent Domain Optical Methods written by Valery V. Tuchin and published by Springer Science & Business Media. This book was released on 2004-10-15 with total page 963 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the first time in one set of books, coherent-domain optical methods are discussed in the framework of various applications, which are characterized by a strong light scattering. A few chapters describe basic research containing the updated results on coherent and polarized light non-destructive interactions with a scattering medium, in particular, diffraction, interference, and speckle formation at multiple scattering. These chapters allow for understanding coherent-domain diagnostic techniques presented in later chapters. A large portion of Volume I is dedicated to analysis of various aspects of optical coherence tomography (OCT) - a very new and growing field of coherent optics. Two chapters on laser scanning confocal microscopy give insight to recent extraordinary results on in vivo imaging and compare the possibilities and achievements of confocol, excitation multiphoton, and OCT microscopy. This two volume reference contains descriptions of holography, interferometry and optical heterodyning techniques in their application for diagnostics of turbid materials. The most prospective methods of coherent and polarization optical imaging and spectroscopy, including polarization-sensitive optical coherent tomography, polarization diffusion wave spectroscopy, and elastic and quasi-elastic light scattering spectroscopies and image techniques, are presented.

Download or read book X Ray Diffraction Imaging of Biological Cells written by Masayoshi Nakasako and published by Springer. This book was released on 2018-03-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.

Download or read book X Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Download or read book Two dimensional X ray Diffraction written by Bob B. He and published by John Wiley & Sons. This book was released on 2018-05-18 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.

Download or read book Inverse Fan Beam X ray Diffraction Imaging with Applications in Liquids Identification written by Johannes Delfs and published by Cuvillier Verlag. This book was released on 2013-06-28 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Inverse Fan-beam (IF) confi guration for X-ray Diffraction Imaging (XDI) and its capability of identifying liquid and amorphous substances for the purpose of explosive detection are described and investigated. Material specifi c information can be obtained by measuring x-ray diffraction profi-les from selected volume elements within inhomogeneous extended objects. This new technique can be used to fi ngerprint liquid explosives and may eliminate the inconvenience, uncertainty, and expense associated with monitoring liquids separately from hand luggage at airport checkpoints. Design concepts for multi-detector arrangements, a multidirectional primary collimator and the scatter imaging collimator are presented and evaluated using numerical procedures. A computer program using ray-tracing methods is described for calculating the primary beam profi le, the scattering angle distribution, and the radiation effi ciency with respect to the x-ray collimation geometry. Synchrotron x-ray diffraction measurements were performed on various liquids which are of interest for security applications. The diffraction profi les are presented and the key features which are potentially suitable for the purpose of explosive detection identifi ed. Material specific information is obtained about the morphology and its effective atomic number. Several additional parameters describing the structure and density of the object under investigation can be derived from the peaks in the molecular interference function.

Download or read book Nanoscale Photonic Imaging written by Tim Salditt and published by Springer Nature. This book was released on 2020-06-09 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: This open access book, edited and authored by a team of world-leading researchers, provides a broad overview of advanced photonic methods for nanoscale visualization, as well as describing a range of fascinating in-depth studies. Introductory chapters cover the most relevant physics and basic methods that young researchers need to master in order to work effectively in the field of nanoscale photonic imaging, from physical first principles, to instrumentation, to mathematical foundations of imaging and data analysis. Subsequent chapters demonstrate how these cutting edge methods are applied to a variety of systems, including complex fluids and biomolecular systems, for visualizing their structure and dynamics, in space and on timescales extending over many orders of magnitude down to the femtosecond range. Progress in nanoscale photonic imaging in Göttingen has been the sum total of more than a decade of work by a wide range of scientists and mathematicians across disciplines, working together in a vibrant collaboration of a kind rarely matched. This volume presents the highlights of their research achievements and serves as a record of the unique and remarkable constellation of contributors, as well as looking ahead at the future prospects in this field. It will serve not only as a useful reference for experienced researchers but also as a valuable point of entry for newcomers.

Download or read book X Ray Metrology in Semiconductor Manufacturing written by D. Keith Bowen and published by CRC Press. This book was released on 2018-10-03 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.

Download or read book Elements of Modern X ray Physics written by Jens Als-Nielsen and published by John Wiley & Sons. This book was released on 2011-04-04 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: “The publication of Jens Als-Nielsen and Des McMorrow’s Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation… a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics…” – Physics Today, 2002

Download or read book Coherent X Ray Optics written by David Paganin and published by OUP Oxford. This book was released on 2006-01-12 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gives a thorough treatment of the rapidly-expanding field of coherent x-ray optics, which has recently experienced something of a renaissance with the availability of third-generation synchrotron sources. It is the first book of its kind. The author begins with a treatment of the fundamentals of x-ray diffraction for both coherent and partially coherent radiation, together with the interactions of x-rays with matter. X-ray sources, optics elements and detectors are then discussed, with an emphasis on their role in coherent x-ray optics. Various facets of coherent x-ray imaging are then discussed, including holography, interferometry, self imaging, phase contrast and phase retrieval. Lastly, the foundations of the new field of singular x-ray optics are examined. Most topics are developed from first principles, with numerous references given to the contemporary research literature. This book will be useful to x-ray physicists and students, together with optical physicists and engineers who wish to learn more about the fascinating subject of coherent x-ray optics.

Download or read book Nanobeam X Ray Scattering written by Julian Stangl and published by John Wiley & Sons. This book was released on 2013-09-10 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive overview of the possibilities and potential of X-ray scattering using nanofocused beams for probing matter at the nanoscale, including guidance on the design of nanobeam experiments. The monograph discusses various sources, including free electron lasers, synchrotron radiation and other portable and non-portable X-ray sources. For scientists using synchrotron radiation or students and scientists with a background in X-ray scattering methods in general.

Download or read book Computer Simulation Tools for X ray Analysis written by Sérgio Luiz Morelhão and published by Springer. This book was released on 2015-10-05 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research. Besides fundamental concepts, MatLab routines are provided, showing how to test and implement the concepts. The major difficult in analysing materials by X-ray techniques is that it strongly depends on simulation software. This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. It provides to a young student the knowledge that would take more than 20 years to acquire by working on X-rays and relying on the available textbooks. The scientific productivity worldwide is growing at a breakneck pace, demanding ever more dynamic approaches and synergies between different fields of knowledge. To master the fundamentals of X-ray physics means the opportunity of working at an infiniteness of fields, studying systems where the organizational understanding of matter at the atomic scale is necessary. Since the discovery of X radiation, its usage as investigative tool has always been under fast expansion afforded by instrumental advances and computational resources. Developments in medical and technological fields have, as one of the master girders, the feasibility of structural analysis offered by X-rays. One of the major difficulties faced by beginners in using this fantastic tool lies in the analysis of experimental data. There are only few cases where it is possible to extract structural information directly from experiments. In most cases, structure models and simulation of radiation-matter interaction processes are essential. The advent of intense radiation sources and rapid development of nanotechnology constantly creates challenges that seek solutions beyond those offered by standard X-ray techniques. Preparing new researchers for this scenario of rapid and drastic changes requires more than just teaching theories of physical phenomena. It also requires teaching of how to implement them in a simple and efficient manner. In this book, fundamental concepts in applied X-ray physics are demonstrated through available computer simulation tools. Using MatLab, more than eighty routines are developed for solving the proposed exercises, most of which can be directly used in experimental data analysis. Therefore, besides X-ray physics, this book offers a practical programming course in modern high-level language, with plenty of graphic and mathematical tools.

Download or read book Medical Imaging Systems written by Andreas Maier and published by Springer. This book was released on 2018-08-02 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.

Download or read book Multiscale X Ray Analysis of Biological Cells and Tissues by Scanning Diffraction and Coherent Imaging written by Jan-David Nicolas and published by Göttingen University Press. This book was released on 2019 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understanding the intricate details of muscle contraction has a long-standing tradition in biophysical research. X-ray diffraction has been one of the key techniques to resolve the nanometer-sized molecular machinery involved in force generation. Modern, powerful X-ray sources now provide billions of X-ray photons in time intervals as short as microseconds, enabling fast time-resolved experiments that shed further light on the complex relationship between muscle structure and function. Another approach harnesses this power by repeatedly performing such an experiment at different locations in a sample. With millions of repeated exposures in a single experiment, X-ray diffraction can seamlessly be turned into a raster imaging method, neatly combining real- and reciprocal space information. This thesis has focused on the advancement of this scanning scheme and its application to soft biological tissue, in particular muscle tissue. Special emphasis was placed on the extraction of meaningful, quantitative structural parameters such as the interfilament distance of the actomyosin lattice in cardiac muscle. The method was further adapted to image biological samples on a range of scales, from isolated cells to millimeter-sized tissue sections. Due to the ‘photon-hungry’ nature of the technique, its full potential is often exploited in combination with full-field imaging techniques. From the vast set of microscopic tools available, coherent full-field X-ray imaging has proven to be particularly useful. This multimodal approach allows to correlate two- and three-dimensional images of cells and tissue with diffraction maps of structure parameters. With the set of tools developed in this thesis, scanning X-ray diffraction can now be efficiently used for the structural analysis of soft biological tissues with overarching future applications in biophysical and biomedical research.

Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2012-10-14 with total page 775 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Download or read book X Ray Imaging written by Harry E. Martz and published by CRC Press. This book was released on 2016-10-26 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt: While books on the medical applications of x-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-Ray Imaging fills the need for a comprehensive work on modern industrial x-ray imaging. It reviews the fundamental science of x-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital x-ray imaging system.