Download or read book This Issue Includes Selected Papers From IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT written by R. Leveugle and published by . This book was released on 2002 with total page 94 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Selected Papers from IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT written by International Symposium on Defect and Fault Tolerance in VLSI Systems and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Selected Papers From IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT written by Régis Leveugle and published by . This book was released on 2003 with total page 94 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Defect and Fault Tolerance in VLSI Systems written by Israel Koren and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Download or read book Defect and Fault Tolerance in VLSI Systems written by C.H. Stapper and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Download or read book 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2001 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the proceedings of the International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001).
Download or read book 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFT written by and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFTS written by IEEE Staff and published by . This book was released on 2015-10-12 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
Download or read book 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFT written by and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
Download or read book Defect and Fault Tolerance in Vlsi Systems dft 2002 17th Ieee International Symposium written by Ieee International Symposium On Defect And Fault Tolerance In Vlsi Systems and published by . This book was released on 2002 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2000 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.
Download or read book DFT 2002 written by and published by IEEE. This book was released on 2002 with total page 441 pages. Available in PDF, EPUB and Kindle. Book excerpt: These 45 papers from the November 2002 symposium discuss techniques to assess and enhance the yield, reliability, and availability of VLSI systems. Several of the contributors present new approaches to fault simulation and injection, concurrent error detection, yield prediction, and sequential circu
Download or read book DFT 2007 written by Cristiana Bolchini and published by IEEE. This book was released on 2007-01-01 with total page 537 pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT 2007 covers the traditional DFT topics including defect tolerance, error correction, reliability evaluation and analysis, fault tolerant designs, and test and diagnosis. In addition, relatively new topics are covered as well, including approaches for defect and fault tolerance in network-on-chips, nanotechnology, DNA self-assembled networks, and soft errors.Contents:Reliable NoCs and SoCs, Single Event Effects, Defect and Fault Tolerance, Fault Injection and Reliability Analysis, Testing and Design for Testability, Soft Errors, Dependable Solutions for Memories and Storage, Reliable Design Techniques, Emerging Technologies, Reliable Applications
Download or read book Foundations and Practice of Security written by Nur Zincir-Heywood and published by Springer. This book was released on 2019-05-02 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the revised selected papers of the 11th International Symposium on Foundations and Practice of Security, FPS 2018, held in Montreal, QC, Canada, in March 2018. The 16 full papers, 1 short paper, 1 position paper and 2 invited papers presented in this book, were carefully reviewed and selected from 51 submissions. They cover a range of topics including mobile security; cloud security and big data; IoT security; software security, malware analysis, and vulnerability detection; cryptography; cyber physical security and hardware security; and access control.
Download or read book 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2003-01-01 with total page 607 pages. Available in PDF, EPUB and Kindle. Book excerpt: The DFT 2003 Symposium encompasses a wide range of topics in the research, design and implementation of VLSI systems that are defect- and fault-tolerant. This is the 18th symposium and throughout these years DFT's unique emphasis on theory and practice continues to provide an ideal source for developers and researchers to present and discuss innovative work covering a multitude of topics.
Download or read book DFT 2005 written by Robert Aitken and published by . This book was released on 2005 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT 2005 showcases the latest research results on yield analysis and modeling, scan design and test data compression, reconfiguration, error correcting codes and circuits, and fault detection and tolerance for sensor and flash memory. Its also covers delay fault test and timing consideration, interconnect test, approaches for soft error, on-line and concurrent fault detection, fault and error tolerant systems, and test scheduling and software-based test.
Download or read book DFT 2011 written by and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
