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Book Thin Film Characterization by a Guided Light Technique

Download or read book Thin Film Characterization by a Guided Light Technique written by Stanley Robert Czyzak (CAPT, USAF.) and published by . This book was released on 1975 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Thin Film Characterization by a Guided Light Technique

Download or read book Thin Film Characterization by a Guided Light Technique written by Stanley R. Czyzak and published by . This book was released on 1975 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt: Zinc telluride films were fabricated by sputtering onto glass substrates using argon as the sputtering gas and ion exchange waveguides were made by exchanging the sodium atoms of a glass substrate for the silver atoms of a silver nitrate bath. Guided light techniques were than applied to both the zinc telluride films and the ion exchange waveguides in order to determine the modes of propagation. The waveguide modes were determined in the ion exchange waveguides but there were not any modes of propagation observed in the zinc telluride films. The determination of the modes of propagation for the ion exchange waveguides allowed their characterization to be done. (Author).

Book Advanced Characterization Techniques for Thin Film Solar Cells

Download or read book Advanced Characterization Techniques for Thin Film Solar Cells written by Daniel Abou-Ras and published by John Wiley & Sons. This book was released on 2016-07-13 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

Book Advanced Characterization Techniques for Thin Film Solar Cells

Download or read book Advanced Characterization Techniques for Thin Film Solar Cells written by Uwe Rau and published by John Wiley & Sons. This book was released on 2011-05-25 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method. The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. Furthermore, they deal with specific device-related topics and include a selection of material and surface/interface analysis methods that have recently proven their relevance. Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D. For students in physics, solid state physicists, materials scientists, PhD students in material sciences, materials institutes, semiconductor physicists, and those working in the semiconductor industry, as well as being suitable as supplementary reading in related courses.

Book Optical Characterization of Thin Solid Films

Download or read book Optical Characterization of Thin Solid Films written by Olaf Stenzel and published by Springer. This book was released on 2018-03-09 with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

Book Spectroscopic Ellipsometry

Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.

Book Thin Films on Glass

Download or read book Thin Films on Glass written by Hans Bach and published by Springer Science & Business Media. This book was released on 2003-07-10 with total page 466 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book, entitled Thin Films on Glass, is one of a series reporting on research and development activities on products and processes conducted by the Schott Group. The scientifically founded development of new products and technical pro cesses has traditionally been of vital importance to Schott and has always been performed on a scale determined by the prospects for application of our special glasses. Since the reconstruction of the Schott Glaswerke in Mainz, the scale has increased enormously. The range of expert knowledge required could never have been supplied by Schott alone. It is also a tradition in our company to cultivate collaboration with customers, universities, and research institutes. Publications in numerous technical journals, which since 1969 we have edited to a regular schedule as Forschungsberichte - 'research reports' - describe the results of these cooperations. They contain up-to-date infor mation on various topics for the expert but are not suited as survey material for those whose standpoint is more remote. This is the point where we would like to place our series, to stimulate the exchange of thoughts, so that we can consider from different points of view the possibilities offered by those incredibly versatile materials, glass and glass ceramics. We would like to share the knowledge won through our research and development at Schott in cooperation with the users of our materials with scientists and engineers, interested customers and friends, and with the employees of our firm.

Book Masters Theses in the Pure and Applied Sciences

Download or read book Masters Theses in the Pure and Applied Sciences written by Wade H. Shafer and published by Springer Science & Business Media. This book was released on 2013-11-21 with total page 307 pages. Available in PDF, EPUB and Kindle. Book excerpt: Masters Theses in the Pure and Applied Sciences was first conceived, published, and dis· seminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) *at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the ac· tivity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all concerned if the printing and distribution of the volume were handled by an international publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Corporation of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 20 (thesis year 1975) a total of 10,374 theses titles from 28 Canadian and 239 United States universities. We are sure that this broader base for theses titles reported will greatly enhance the value of this important annual reference work. The organization of Volume 20 is identical to that of past years. It consists of theses titles arranged by discipline and by university within each discipline.

Book Thin Films for Optical Systems

Download or read book Thin Films for Optical Systems written by Flory and published by CRC Press. This book was released on 1995-07-06 with total page 608 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work presents advances in thin films for applications in the fields of integrated optics, micro-optics, optical telecommunications and optoelectronics. It delineates the performance characteristics needed for graded coatings, damage-resistant laser coatings and many others. Basic theory and applications are illustrated.

Book Handbook of Thin Films  Five Volume Set

Download or read book Handbook of Thin Films Five Volume Set written by Hari Singh Nalwa and published by Academic Press. This book was released on 2001-10-29 with total page 661 pages. Available in PDF, EPUB and Kindle. Book excerpt: This five-volume handbook focuses on processing techniques, characterization methods, and physical properties of thin films (thin layers of insulating, conducting, or semiconductor material). The editor has composed five separate, thematic volumes on thin films of metals, semimetals, glasses, ceramics, alloys, organics, diamonds, graphites, porous materials, noncrystalline solids, supramolecules, polymers, copolymers, biopolymers, composites, blends, activated carbons, intermetallics, chalcogenides, dyes, pigments, nanostructured materials, biomaterials, inorganic/polymer composites, organoceramics, metallocenes, disordered systems, liquid crystals, quasicrystals, and layered structures. Thin films is a field of the utmost importance in today's materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices. Advanced, high-performance computers, high-definition TV, digital camcorders, sensitive broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are but a few examples of miniaturized device technologies that depend the utilization of thin film materials. The Handbook of Thin Films Materials is a comprehensive reference focusing on processing techniques, characterization methods, and physical properties of these thin film materials.

Book Surface and Thin Film Analysis

Download or read book Surface and Thin Film Analysis written by Gernot Friedbacher and published by John Wiley & Sons. This book was released on 2011-03-31 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Book A Guide to Materials Characterization and Chemical Analysis

Download or read book A Guide to Materials Characterization and Chemical Analysis written by John P. Sibilia and published by John Wiley & Sons. This book was released on 1996-12-17 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written both for the novice and for the experienced scientist, this miniature encyclopedia concisely describes over one hundred materials methodologies, including evaluation, chemical analysis, and physical testing techniques. Each technique is presented in terms of its use, sample requirements, and the engineering principles behind its methodology. Real life industrial and academic applications are also described to give the reader an understanding of the significance and utilization of technique. There is also a discussion of the limitations of each technique.

Book Spatially Resolved Characterization in Thin Film Photovoltaics

Download or read book Spatially Resolved Characterization in Thin Film Photovoltaics written by Matevž Bokalič and published by Springer. This book was released on 2015-01-22 with total page 106 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is devoted to the spatial characterization of solar cells and PV modules. It is written both as a monograph as well as a succinct guide for the state-of-the-art spatial characterization techniques and approaches. Amongst the approaches discussed are visual imaging, electro- and photo-luminescence imaging, thermography, and light beam induced mapping techniques. Emphasis is given on the luminescence image acquisition and interpretation due to its great potential. Characterization techniques are accompanied by simulation tools. The contents are aimed at a readership of students and senior researchers in R&D as well as engineers in industry who are newcomers to the spatial characterization of either solar cells or PV modules. The concepts and approaches presented herein are based on but not limited to case studies of real thin-film PV devices. Key features:  Review of spatially resolved characterization techniques and accompanying SPICE simulations in photovoltaics  Use of spatially resolved characterization techniques and their combinations for the identification of inhomogeneities in small area CdTe and dye-sensitized solar cells  Case studies of electroluminescence imaging of commercial PV modules (c-Si, CIGS, CdTe, a-Si, tandem and triple junction thin-film-Si) The contents are aimed at a readership of students and senior researchers in R&D as well as engineers in industry who are newcomers to the spatial characterization of either solar cells or PV modules. The concepts and approaches presented herein are based on but not limited to case studies of real thin-film PV devices. Key features:  Review of spatially resolved characterization techniques and accompanying SPICE simulations in photovoltaics  Use of spatially resolved characterization techniques and their combinations for the identification of inhomogeneities in small area CdTe and dye-sensitized solar cells  Case studies of electroluminescence imaging of commercial PV modules (c-Si, CIGS, CdTe, a-Si, tandem and triple junction thin-film-Si)

Book Handbook of sol gel science and technology  2  Characterization and properties of sol gel materials and products

Download or read book Handbook of sol gel science and technology 2 Characterization and properties of sol gel materials and products written by Sumio Sakka and published by Springer Science & Business Media. This book was released on 2004 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book 5 Th International Thin Films Congress

Download or read book 5 Th International Thin Films Congress written by and published by . This book was released on 1982 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Characterization of Organic Thin Films

Download or read book Characterization of Organic Thin Films written by Abraham Ulman and published by Butterworth-Heinemann. This book was released on 1995 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.

Book A Practical Guide to Optical Metrology for Thin Films

Download or read book A Practical Guide to Optical Metrology for Thin Films written by Michael Quinten and published by John Wiley & Sons. This book was released on 2012-09-24 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.