Download or read book Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1977 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing for single intermittent failures in combinational circuits by maximizing the probability of fault detection written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1977 with total page 54 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1977 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Optimal random testing of single intermittent failures in combinational circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1976 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Detection of Intermittent Faults in Sequential Circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1978 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
Download or read book Model and Random Testing Properties of Intermittent Faults in Combinational Circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1977 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Evolution of Fault Tolerant Computing written by A. Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 467 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1978 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Download or read book FTCS 8 written by and published by . This book was released on 1978 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Optimum Statistical Fault Detection in Combinational Circuits written by S. Amaranathan and published by . This book was released on 1980 with total page 158 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Download or read book 3rd USA Japan Computer Conference Proceedings written by and published by . This book was released on 1978 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Diagnosis of Intermittent Faults in Digital Systems written by Samir Kamal and published by . This book was released on 1972 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Computational Aspects of Detection Probabilities of Faults in General Combinational Circuits written by Samia Abd El-Fattah Ali and published by . This book was released on 1989 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Comprehensive Fault Diagnosis of Combinational Circuits written by David B. Lavo and published by . This book was released on 2002 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test generation and fault diagnosis for multiple faults in combinational circuits written by Stanford University. Computer Systems Laboratory and published by . This book was released on 1983 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
