Download or read book Test Resource Partitioning for System on a Chip written by Vikram Iyengar and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.

Download or read book System on Chip written by Bashir M. Al-Hashimi and published by IET. This book was released on 2006-01-31 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Download or read book Advances in VLSI and Embedded Systems written by Zuber Patel and published by Springer Nature. This book was released on 2020-08-28 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.

Download or read book Power Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Download or read book Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation written by Alfredo Benso and published by Springer Science & Business Media. This book was released on 2005-12-15 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.

Download or read book Oscillation Based Test in Mixed Signal Circuits written by Gloria Huertas Sánchez and published by Springer Science & Business Media. This book was released on 2007-06-03 with total page 459 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Download or read book The Core Test Wrapper Handbook written by Francisco da Silva and published by Springer Science & Business Media. This book was released on 2006-09-15 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500.

Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Download or read book Defect Oriented Testing for Nano Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Download or read book Power Constrained Testing of VLSI Circuits written by Nicola Nicolici and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Download or read book Dependable Computing EDCC 2005 written by Mario Dal Cin and published by Springer. This book was released on 2005-03-31 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is always a special honor to chair the European Dependable Computing C- ference (EDCC). EDCC has become one of the well-established conferences in the ?eld of dependability in the European research area. Budapest was selected as the host of this conference due to its traditions in organizing international scienti?c events and its traditional role of serving as a meeting point between East and West. EDCC-5 was the ?fth in the series of these high-quality scienti?c conf- ences. In addition to the overall signi?cance of such a pan-European event, this year’s conference was a special one due to historic reasons. The roots of EDCC date back to the moment when the Iron Curtain fell. Originally, two groups of scientists from di?erent European countries in Western and Eastern Europe – who were active in research and education related to dependability created a – joint forum in order to merge their communities as early as in 1989. This trend has continued up to today. This year’s conference was the ?rst one where the overwhelming majority of the research groups belong to the family of European nations united in the European Union. During the past 16 years we observed that the same roots in all the professional, cultural and scienti?c senses led to a seamless integration of these research communities previously separated ar- ?cially for a long time. EDCC has become one of the main European platforms to exchange new - searchideasinthe?eldofdependability.

Download or read book Embedded Processor Based Self Test written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2004-12-20 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.

Download or read book Testing Static Random Access Memories written by Said Hamdioui and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

Download or read book Emerging Nanotechnologies written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2007-12-08 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.