Download or read book Synthesis Methodology for Built in At speed Testing written by Yinghua Li and published by . This book was released on 2005 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digest of Technical Papers written by and published by . This book was released on 1988 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Evaluation Methodology Basics written by E. Jane Davidson and published by SAGE. This book was released on 2005 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: Evaluation Methodology Basics introduces evaluation by focusing on the main kinds of 'big picture' questions that evaluations usually need to answer, and how the nature of such questions are linked to evaluation methodology choices. The author: shows how to identify the right criteria for your evaluation; discusses how to objectively figure out which criteria are more important than the others; and, delves into how to combine a mix of qualitative and quantitative data with 'relevant values' (such as needs) to draw explicitly evaluative conclusions.
Download or read book Synthesis Techniques for Pseudo Random Built In Self Test written by Nur A. Touba and published by . This book was released on 1996 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: Built-in self-test (BIST) techniques enable an integrated circuit (IC) to test itself. BIST reduces test and maintenance costs for an IC by eliminating the need for expensive test equipment and by allowing fast location of failed ICs in a system. BIST also allows an IC to be tested at its normal operating speed which is very important for detecting timing faults. Despite all of these advantages, BIST has seen limited use in industry because of area and performance overhead and increased design time. This dissertation presents automated techniques for implementing BIST in a way that minimizes area and performance overhead. A low-overhead approach for BIST is to use a linear feedback shift register (LFSR) to apply pseudorandom test patterns to the circuit-under-test. Unfortunately, many circuits contain random-pattern-resistant faults which limit the fault coverage that can be obtained for pseudo-random BIST. Several different approaches for solving this problem are presented. A logic synthesis procedure that performs testability-driven factoring to generate a random pattern testable design is presented. By considering random pattern testability during the factoring process, the overhead can be minimized. For hand-designed circuits or circuits that are not synthesizable, an innovative test point insertion procedure is described for inserting test points to make the circuit random pattern testable. A path tracing procedure is used for test point placement. A few of the existing primary inputs are ANDed together to form signals that drive the control points. These innovations result in fewer test points than previous methods. If it is not possible or not desirable to modify the circuit-under-test, then a procedure is described for synthesizing mapping logic that can placed at the output of the LFSR to transform the pseudorandom patterns so that they provide the required fault coverage. Much less overhead is required compared with weighted pattern testing methods. Lastly, a technique is described for placing bitfixing logic at the serial output of an LFSR to embed deterministic test patterns for the random pattern resistant faults in the pseudorandom bit sequence. This method does not require any performance overhead beyond what is needed for scan.
Download or read book Design of Systems on a Chip Design and Test written by Ricardo Reis and published by Springer Science & Business Media. This book was released on 2007-05-06 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.
Download or read book System Synthesis with VHDL written by Petru Eles and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 373 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded systems are usually composed of several interacting components such as custom or application specific processors, ASICs, memory blocks, and the associated communication infrastructure. The development of tools to support the design of such systems requires a further step from high-level synthesis towards a higher abstraction level. The lack of design tools accepting a system-level specification of a complete system, which may include both hardware and software components, is one of the major bottlenecks in the design of embedded systems. Thus, more and more research efforts have been spent on issues related to system-level synthesis. This book addresses the two most active research areas of design automation today: high-level synthesis and system-level synthesis. In particular, a transformational approach to synthesis from VHDL specifications is described. System Synthesis with VHDL provides a coherent view of system synthesis which includes the high-level and the system-level synthesis tasks. VHDL is used as a specification language and several issues concerning the use of VHDL for high-level and system-level synthesis are discussed. These include aspects from the compilation of VHDL into an internal design representation to the synthesis of systems specified as interacting VHDL processes. The book emphasizes the use of a transformational approach to system synthesis. A Petri net based design representation is rigorously defined and used throughout the book as a basic vehicle for illustration of transformations and other design concepts. Iterative improvement heuristics, such as tabu search, simulated annealing and genetic algorithms, are discussed and illustrated as strategies which are used to guide the optimization process in a transformation-based design environment. Advanced topics, including hardware/software partitioning, test synthesis and low power synthesis are discussed from the perspective of a transformational approach to system synthesis. System Synthesis with VHDL can be used for advanced undergraduate or graduate courses in the area of design automation and, more specifically, of high-level and system-level synthesis. At the same time the book is intended for CAD developers and researchers as well as industrial designers of digital systems who are interested in new algorithms and techniques supporting modern design tools and methodologies.
Download or read book Optimal VLSI Architectural Synthesis written by Catherine H. Gebotys and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 293 pages. Available in PDF, EPUB and Kindle. Book excerpt: Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support interfaces to analog, asynchronous, and other complex processes. They also fail to incorporate testability. The OASIC (optimal architectural synthesis with interface constraints) architectural synthesizer and the CATREE (computer aided trees) synthesizer demonstrate how these problems can be solved. Traditionally architectural synthesis is viewed as NP hard and there fore most research has involved heuristics. OASIC demonstrates by using an IP approach (using polyhedral analysis), that most input algo rithms can be synthesized very fast into globally optimal architectures. Since a mathematical model is used, complex interface constraints can easily be incorporated and solved. Research in test incorporation has in general been separate from syn thesis research. This is due to the fact that traditional test research has been at the gate or lower level of design representation. Nevertheless as technologies scale down, and complexity of design scales up, the push for reducing testing times is increased. On way to deal with this is to incorporate test strategies early in the design process. The second half of this text examines an approach for integrating architectural synthesis with test incorporation. Research showed that test must be considered during synthesis to provide good architectural solutions which minimize Xlll area delay cost functions.
Download or read book Electronic Design Automation for IC System Design Verification and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.
Download or read book Digital Design and Fabrication written by Vojin G. Oklobdzija and published by CRC Press. This book was released on 2017-12-19 with total page 656 pages. Available in PDF, EPUB and Kindle. Book excerpt: In response to tremendous growth and new technologies in the semiconductor industry, this volume is organized into five, information-rich sections. Digital Design and Fabrication surveys the latest advances in computer architecture and design as well as the technologies used to manufacture and test them. Featuring contributions from leading experts, the book also includes a new section on memory and storage in addition to a new chapter on nonvolatile memory technologies. Developing advanced concepts, this sharply focused book— Describes new technologies that have become driving factors for the electronic industry Includes new information on semiconductor memory circuits, whose development best illustrates the phenomenal progress encountered by the fabrication and technology sector Contains a section dedicated to issues related to system power consumption Describes reliability and testability of computer systems Pinpoints trends and state-of-the-art advances in fabrication and CMOS technologies Describes performance evaluation measures, which are the bottom line from the user’s point of view Discusses design techniques used to create modern computer systems, including high-speed computer arithmetic and high-frequency design, timing and clocking, and PLL and DLL design
Download or read book Electronic Design Automation written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2009-03-11 with total page 971 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes
Download or read book Proceedings of the Seventh International Symposium on High level Synthesis written by International Symposium on High-Level Synthesis and published by . This book was released on 1994 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Boundary Scan Test written by Harry Bleeker and published by Springer Science & Business Media. This book was released on 2011-06-28 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.
Download or read book Digital Design Using VHDL written by William J. Dally and published by Cambridge University Press. This book was released on 2016 with total page 685 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides students with a system-level perspective and the tools they need to understand, analyze and design complete digital systems using VHDL. It goes beyond the design of simple combinational and sequential modules to show how such modules are used to build complete systems, reflecting digital design in the real world.
Download or read book Nanocatalysts in Biofuel Process Optimization written by Mohammad Rehan and published by Frontiers Media SA. This book was released on 2021-11-26 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Dissertation Abstracts International written by and published by . This book was released on 2006 with total page 790 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
