Download or read book Synthesis and Characterization of Silicon Nitride Thin Films and Their Application as Hermetic Coatings on Optical Fibers for Protection Against Hydrogen Penetration written by Qixian Lin and published by . This book was released on 1995 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book American Doctoral Dissertations written by and published by . This book was released on 1995 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Silicon Nitride Based Coatings Grown by Reactive Magnetron Sputtering written by Tuomas Hänninen and published by Linköping University Electronic Press. This book was released on 2018-02-13 with total page 73 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon nitride and silicon nitride-based ceramics have several favorable material properties, such as high hardness and good wear resistance, which makes them important materials for the coating industry. This thesis focuses the synthesis of silicon nitride, silicon oxynitride, and silicon carbonitride thin films by reactive magnetron sputtering. The films were characterized based on their chemical composition, chemical bonding structure, and mechanical properties to link the growth conditions to the film properties. Silicon nitride films were synthesized by reactive high power impulse magnetron sputtering (HiPIMS) from a Si target in Ar/N2 atmospheres, whereas silicon oxynitride films were grown by using nitrous oxide as the reactive gas. Silicon carbonitride was synthesized by two different methods. The first method was using acetylene (C2H2) in addition to N2 in a Si HiPIMS process and the other was co-sputtering of Si and C, using HiPIMS for Si and direct current magnetron sputtering (DCMS) for graphite targets in an Ar/N2 atmosphere. Langmuir probe measurements were carried out for the silicon nitride and silicon oxynitride processes and positive ion mass spectrometry for the silicon nitride processes to gain further understanding on the plasma conditions during film growth. The target current and voltage waveforms of the reactive HiPIMS processes were evaluated. The main deposition parameter affecting the nitrogen concentration of silicon nitride films was found to be the nitrogen content in the plasma. Films with nitrogen contents of 50 at.% were deposited at N2/Ar flow ratios of 0.3 and above. These films showed Si-N as the dominating component in Si 2p X-ray photoelectron spectroscopy (XPS) core level spectra and Si–Si bonds were absent. The substrate temperature and target power were found to affect the nitrogen content to a lower extent. The residual stress and hardness of the films were found to increase with the film nitrogen content. Another factors influencing the coating stress were the process pressure, negative substrate bias, substrate temperature, and HiPIMS pulse energy. Silicon nitride coatings with good adhesion and low levels of compressive residual stress were grown by using a pressure of 600 mPa, a substrate temperature below 200 °C, pulse energies below 2.5 Ws, and negative bias voltages up to 100 V. The elemental composition of silicon oxynitride films was shown to depend on the target power settings as well as on the nitrous oxide flow rate. Silicon oxide-like films were synthesized under poisoned target surface conditions, whereas films deposited in the transition regime between poisoned and metallic conditions showed higher nitrogen concentrations. The nitrogen content of the films deposited in the transition region was controlled by the applied gas flow rate. The applied target power did not affect the nitrogen concentration in the transition regime, while the oxygen content increased at decreasing target powers. The chemical composition of the films was shown to range from silicon-rich to effectively stoichiometric silicon oxynitrides, where no Si–Si contributions were found in the XPS Si 2p core level spectra. The film optical properties, namely the refractive index and extinction coefficient, were shown to depend on the film chemical bonding, with the stoichiometric films displaying optical properties falling between those of silicon oxide and silicon nitride. The properties of silicon carbonitride films were greatly influenced by the synthesis method. The films deposited by HiPIMS using acetylene as the carbon source showed silicon nitride-like mechanical properties, such as a hardness of ~ 20 GPa and compressive residual stresses of 1.7 – 1.9 GPa, up to film carbon contents of 30 at.%. At larger film carbon contents the films had increasingly amorphous carbon-like properties, such as densities below 2 g/cm3 and hardnesses below 10 GPa. The films with more than 30 at.% carbon also showed columnar morphologies in cross-sectional scanning electron microscopy, whereas films with lower carbon content showed dense morphologies. Due to the use of acetylene the carbonitride films contained hydrogen, up to ~ 15 at.%. The co-sputtered silicon carbonitride films showed a layered SiNx/CNx structure. The hardness of these films increased with the film carbon content, reaching a maximum of 18 GPa at a film carbon content of 12 at.%. Comparatively hard and low stressed films were grown by co-sputtering using a C target power of 1200 W for a C content around 12 at.%, a negative substrate bias less than 100 V, and a substrate temperature up to 340 °C.
Download or read book Silicon Nitride and Silicon Dioxide Thin Insulating Films VII written by Electrochemical Society. Meeting and published by The Electrochemical Society. This book was released on 2003 with total page 652 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Silicon Nitride Based Coatings Grown by Reactive Magnetron Sputtering written by Tuomas Hänninen and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon nitride and silicon nitride-based ceramics have several favorable material properties, such as high hardness and good wear resistance, which makes them important materials for the coating industry. This thesis focuses the synthesis of silicon nitride, silicon oxynitride, and silicon carbonitride thin films by reactive magnetron sputtering. The films were characterized based on their chemical composition, chemical bonding structure, and mechanical properties to link the growth conditions to the film properties. Silicon nitride films were synthesized by reactive high power impulse magnetron sputtering (HiPIMS) from a Si target in Ar/N 2 atmospheres, whereas silicon oxynitride films were grown by using nitrous oxide as the reactive gas. Silicon carbonitride was synthesized by two different methods. The first method was using acetylene (C 2 H 2 ) in addition to N 2 in a Si HiPIMS process and the other was co-sputtering of Si and C, using HiPIMS for Si and direct current magnetron sputtering (DCMS) for graphite targets in an Ar/N 2 atmosphere. Langmuir probe measurements were carried out for the silicon nitride and silicon oxynitride processes and positive ion mass spectrometry for the silicon nitride processes to gain further understanding on the plasma conditions during film growth. The target current and voltage waveforms of the reactive HiPIMS processes were evaluated. The main deposition parameter affecting the nitrogen concentration of silicon nitride films was found to be the nitrogen content in the plasma. Films with nitrogen contents of 50 at.% were deposited at N 2 /Ar flow ratios of 0.3 and above. These films showed Si-N as the dominating component in Si 2p X-ray photoelectron spectroscopy (XPS) core level spectra and Si–Si bonds were absent. The substrate temperature and target power were found to affect the nitrogen content to a lower extent. The residual stress and hardness of the films were found to increase with the film nitrogen content. Another factors influencing the coating stress were the process pressure, negative substrate bias, substrate temperature, and HiPIMS pulse energy. Silicon nitride coatings with good adhesion and low levels of compressive residual stress were grown by using a pressure of 600 mPa, a substrate temperature below 200 °C, pulse energies below 2.5 Ws, and negative bias voltages up to 100 V. The elemental composition of silicon oxynitride films was shown to depend on the target power settings as well as on the nitrous oxide flow rate. Silicon oxide-like films were synthesized under poisoned target surface conditions, whereas films deposited in the transition regime between poisoned and metallic conditions showed higher nitrogen concentrations. The nitrogen content of the films deposited in the transition region was controlled by the applied gas flow rate. The applied target power did not affect the nitrogen concentration in the transition regime, while the oxygen content increased at decreasing target powers. The chemical composition of the films was shown to range from silicon-rich to effectively stoichiometric silicon oxynitrides, where no Si–Si contributions were found in the XPS Si 2p core level spectra. The film optical properties, namely the refractive index and extinction coefficient, were shown to depend on the film chemical bonding, with the stoichiometric films displaying optical properties falling between those of silicon oxide and silicon nitride. The properties of silicon carbonitride films were greatly influenced by the synthesis method. The films deposited by HiPIMS using acetylene as the carbon source showed silicon nitride-like mechanical properties, such as a hardness of ~ 20 GPa and compressive residual stresses of 1.7 – 1.9 GPa, up to film carbon contents of 30 at.%. At larger film carbon contents the films had increasingly amorphous carbon-like properties, such as densities below 2 g/cm 3 and hardnesses below 10 GPa. The films with more than 30 at.% carbon also showed columnar morphologies in cross-sectional scanning electron microscopy, whereas films with lower carbon content showed dense morphologies. Due to the use of acetylene the carbonitride films contained hydrogen, up to ~ 15 at.%. The co-sputtered silicon carbonitride films showed a layered SiN x /CN x structure. The hardness of these films increased with the film carbon content, reaching a maximum of 18 GPa at a film carbon content of 12 at.%. Comparatively hard and low stressed films were grown by co-sputtering using a C target power of 1200 W for a C content around 12 at.%, a negative substrate bias less than 100 V, and a substrate temperature up to 340 °C.
Download or read book Nanocomposite Thin Films and Coatings written by Sam Zhang and published by Imperial College Press. This book was released on 2007 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials development has reached a point where it is difficult for a single material to satisfy the needs of sophisticated applications in the modern world. Nanocomposite films and coatings achieve much more than the simple addition of the constitutents OCo the law of summation fails to work in the nano-world. This book encompasses three major parts of the development of nanocomposite films and coatings: the first focuses on processing and properties, the second concentrates on mechanical performance, and the third deals with functional performance, including wide application areas ranging from mechanical cutting to solar energy and from electronics to medicine. Sample Chapter(s). Chapter 1: Magnetron Sputtered Hard and Yet Tough Nanocomposite Coatings With Case Studies: Nanocrystalline Tin Embedded in Amorphous SiNx (187 KB). Contents: Magnetron Sputtered Hard and Yet Tough Nanocomposite Coatings with Case Studies: Nanocrystalline TiN Embedded in Amorphous SiN x (S Zhang et al.); Magnetron Sputtered Hard and Yet Tough Nanocomposite Coatings with Case Studies: Nanocrystalline TiC Embedded in Amorphous Carbon (S Zhang et al.); Properties of Chemical Vapor Deposited Nanocrystalline Diamond and Nanodiamond/Amorphous Carbon Composite Films (S C Tjong); Synthesis, Characterization and Applications of Nanocrystalline Diamond Films (Z-Q Xu & A Kumar); Properties of Hard Nanocomposite Thin Films (J Musil); Nanostructured, Multifunctional Tribological Coatings (J J Moore et al.); Nanocomposite Thin Films for Solar Energy Conversion (Y-B Yin); Application of Silicon Nanocrystal in Non-Volatile Memory Devices (T P Chen); Nanocrystalline Silicon Films for Thin Film Transistor and Optoelectronic Applications (Y-J Choi et al.); Amorphous and Nanocomposite Diamond-Like Carbon Coatings for Biomedical Applications (T I T Okpalugo et al.); Nanocoatings for Orthopaedic and Dental Application (W-Q Yan). Readership: Undergraduates, postgraduates, researchers, scientists, college and university professors, research professionals, technology investors and developers, research enterprises, R&D research laboratories, academic and research libraries."
Download or read book Synthesis and Characterization of Silicon Nitride Films Deposited by Plasma Enhanced Chemical Vapor Deposition Using Diethylsilane written by Yanyao Yu and published by . This book was released on 1993 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Synthesis of Titanium Based Nitride Thin Films By Plasma Focus written by Tousif Hussain and published by LAP Lambert Academic Publishing. This book was released on 2012 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: The dense plasma focus system of energy 2.3 kJ was used to synthesize titanium based nitride thin films. The book contains the details of research work including the introduction, plasma focus experimental setup, results obtained and their detailed discussion. It reports growth of titanium based nitride thin films specifically titanium-aluminum nitrides, nano composite-titanium nitride/amorphous-silicon nitride, nano composite (titanium, aluminum) nitride/ amorphous-silicon nitride and titanium-silicon-nitride. The results of these experiments show the successful synthesis of titanium based nitride thin films using the plasma focus system. The research work is motivated by the remarkable mechanical, thermal and electronic properties of titanium based nitride thin films, having many applications ranging from coatings on cutting tools to diffusion barrier in microelectronics.
Download or read book Silicon Nitride and Silicon Dioxide Thin Insulating Films written by and published by . This book was released on 2001 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Silicon Nitride in Electronics written by Vi︠a︡cheslav Ivanovich Belyĭ and published by Elsevier Publishing Company. This book was released on 1988 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is an English version, expanded and brought up to date, of the Russian book published in 1982. It has been written by a group of authors - chemists and physicists - and is designed particularly for specialists who are developing semiconductor devices. Silicon nitride has long been familiar as a material used in the process of manufacturing fire-proof products. During the past decade, it has come into use as a thin dielectric film in electronics, and at present silicon nitride synthesis underlies the basic technology for integrated circuits. The monograph discusses the characteristics that determine the process of synthesis of silicon nitride films, their structure, chemical composition, optical and electrophysical properties, as well as various applications of silicon nitride in electronics.
Download or read book Synthesis and Characterization of Hydrogenated Aluminum Nitride AlN H Thin Films for Photovoltaic Applications written by Sandro Renato Espinoza Monsalve and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: AlN:H ist ein vielversprechendes Material unter anderem für die Oberflächenpassivierung in Silizium-Sonnenzellen, um höhere Effizienzen zu erreichen. Oberflächenpassivierung ist die Verminderung der Oberflächenrekombinationsrate von Ladungsträgern (Elektronen und Löcher). Um ein besseres Verständnis des AlN:H als Passivierungsschicht zu erhalten, ist es entscheidend, zuvor die strukturellen und morphologischen Eigenschaften von verschiedenen dünnen AlN:H Filmen zu kennen. Diese Masterarbeit untersucht den Einfluss von Wasserstoff auf die strukturellen und morphologischen Eigenschaften von hydrierten dünnen Aluminiumnitrid Filmen (AlN:H) mit einer Dicke von ~ 100 nm. Um dieses Ziel zu erreichen, wurden Proben durch reaktives Sputtering auf p-Typ c-Si (CZ, 100, Boron) unter Zugabe von drei verschiedenen Wasserstoffflüssen und bei unterschiedlichen Substrattemperaturen während der Deposition erzeugt. Die Charakterisierung und Analyse der dünnen Filme wurde mittels EDX, FTIR und GDOES Messungen für die Analyse der chemischen Zusammensetzung und mittels XRD und XRR Messungen für die strukturelle und morphologische Analyse durchgeführt. In dieser Arbeit wurde schließlich herausgefunden, dass der Wasserstoffgehalt in den dünnen Filmen einige morphologische und strukturelle Änderungen in dünnen AlN Filmen erzeugt. Alle abgelegten dünnen Filme haben die sechseckige wurtzite Kristallstruktur. Die XRD Messungen zeigen eine Abnahme des (002) Peaks und eine Erhöhung der (100) und (110) Peaks, mit Zunahmen des H2-Flusses. Diese Variation impliziert, dass sich die c-Achse des Films von senkrecht (002) zu parallel (100, 110) bezüglich der Substratoberfläche ändert. Die XRR Messwerte offenbaren, dass eine Zunahme des H2-Flusses die Oberflächenrauheit reduziert und die Grenzflächenrauheit (Rauigkeit zwischen zwei Flächen) unwesentliche Änderungen aufweist. Mittels GDOES Messungen wurde die Gegenwart von Wasserstoff im kompletten Dünnschichtvolumen bestätigt.
Download or read book Hermetic Coating on Optical Fibers written by and published by Information Gatekeepers Inc. This book was released on 1987 with total page 102 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Spectroscopic Ellipsometry Characterization of Thin film Silicon Nitride written by and published by . This book was released on 2001 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: We have measured and analyzed the optical characteristics of a series of silicon nitride thin films prepared by plasma-enhanced chemical vapor deposition on silicon substrates for photovoltaic applications. Spectroscopic ellipsometry measurements were made by using a two-channel spectroscopic polarization modulator ellipsometer that measures N, S, and C data simultaneously. The data were fit to a model consisting of air / roughness / SiN / crystalline silicon. The roughness was modeled using the Bruggeman effective medium approximation, assuming 50% SiN, 50% voids. The optical functions of the SiN film were parameterized using a model by Jellison and Modine. All the[Chi][sup 2] are near 1, demonstrating that this model works extremely well for all SiN films. The measured dielectric functions were used to make optimized SiN antireflection coatings for crystalline silicon solar cells.
Download or read book Synthesis and Characterization of Silicon Nitride Film Deposited by Plasma Enhanced Chemical Vapor Deposition from Ditertiary butyl Silane written by Kei-Turng Shih and published by . This book was released on 1991 with total page 158 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Synthesis of Multilayer Coatings by Plasma Enhanced Chemical Vapor Deposition written by and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon dioxide, silicon-containing polymer, silicon nitride, metal nitride, and germanium thin films were grown by electron cyclotron resonance (ECR) microwave plasma enhanced chemical vapor deposition (PECVD), and multilayer coatings were grown for high hardness and high corrosion resistance. Silicon dioxide was grown from hexamethyldisiloxane (HMDSO), 1,3,5,7-tetramethylcyclotetrasiloxane (TOMCTS), and ctamethylcyclotetrasiloxance (OMCTS) in a oxygen plasma. The grown silicon dioxide thin films were hard and colorless. Silicon nitride was grown from hexamethyldisiloxane (HMDSO) and tetramethylsilane (TMS) in an ammonia (NH3) plasma. The silicon nitride thin films grown from HMDSO were hard and transparent while the silicon nitride thin films grown from TMS were black and hard. Silicon-containing polymer was grown from 100% OMCTS. The polymer thin films are colorless, had relatively low hardness and very good salt-fog corrosion resistance. Titanium nitride, zirconium nitride, and chromium nitride were grown from titanium (IV) isopropoxide and tetrakis(dimethylamino)titanium, zirconium 2-methyl-2-butoxide and zirconium t-butoxide, and bis(ethylbenzene)chromium in an ammonia plasma. The grown titanium nitride and zirconium nitride thin films had characteristic gold coloring and high hardness while the grown chromium nitride thin films were black gray and had high hardness. Germanium thin films were grown from tetramethylgermane (TMG) in a argon plasma. The deposited germanium films were uniform and had polished-like shining surface. X-ray photoelectron spectroscopic (XPS) analyses showed the films contained 97 % germanium atomic concentration with less than 1 % carbon, and X-ray diffraction (XRD) analyses showed the films had the crystal structure of 220. Hard corrosion-resistant silicon-containing multilayer coatings were grown in a high-density microwave electron cyclotron resonance discharge. The multilayer coatings consist of a relatively soft silicon-containing polymer thin film as the bottom layer and a hard silicon dioxide or silicon nitride thin film as the top layer. Silicon-containing polymer thin films were grown from 100% OMCTS. Silicon dioxide and silicon nitride thin films were grown from OMCTS with O2 and HMDSO with NH3, respectively. The multilayer structures combined high surface hardnesses with good corrosion resistance, surviving 1800 to 2600 hours in an ASTM B117 salt-fog corrosion test. Multilayer coatings with a titanium nitride or zirconium nitride bottom layer and a transparent silicon-containing polymer or silicon dioxide top layer were grown in a high-density microwave electron cyclotron resonance discharge for protective or decorative coating application. The grown multilayer coatings had gold coloring and good film thickness.
Download or read book Characterization of Silicon Nitride Films written by Srinivasan Rajagopal Iyengar and published by . This book was released on 1991 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Silicon Nitride Silicon Dioxide and Emerging Dielectrics 11 written by Electrochemical society. Meeting and published by The Electrochemical Society. This book was released on 2011 with total page 950 pages. Available in PDF, EPUB and Kindle. Book excerpt: This issue of ECS Transactions contains the peer-reviewed full length papers of the International Symposium on Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics held May 1-6, 2011 in Montreal as a part of the 219th Meeting of The Electrochemical Society. The papers address a very diverse range of topics. In addition to the deposition and characterization of the dielectrics, more specific topics addressed by the papers include applications, device characterization and reliability, interface states, interface traps, defects, transistor and gate oxide studies, and modeling.
