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EBookClubs

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Book Surface Characterization for Computer Disks Wafers and Flat Panel Displays

Download or read book Surface Characterization for Computer Disks Wafers and Flat Panel Displays written by John C. Stover and published by . This book was released on 1999 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Flatness Roughness and Discrete Defects Characterization for Computer Disks Wafers and Flat Panel Displays II

Download or read book Flatness Roughness and Discrete Defects Characterization for Computer Disks Wafers and Flat Panel Displays II written by John C. Stover and published by SPIE-International Society for Optical Engineering. This book was released on 1998 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book National Semiconductor Metrology Program

Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book National Semiconductor Metrology Program

Download or read book National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Light Scattering and Nanoscale Surface Roughness

Download or read book Light Scattering and Nanoscale Surface Roughness written by Alexei A. Maradudin and published by Springer Science & Business Media. This book was released on 2010-05-10 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.

Book Surfactants in Precision Cleaning

Download or read book Surfactants in Precision Cleaning written by Rajiv Kohli and published by Elsevier. This book was released on 2021-10-21 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surfactants in Precision Cleaning: Removal of Contaminants at the Micro and Nanoscale is a single source of information on surfactants, emulsions, microemulsions and detergents for removal of surface contaminants at the micro and nanoscale. The topics covered include cleaning mechanisms, effect of surfactants, types of stable dispersions (emulsions, microemulsions, surfactants, detergents, etc.), cleaning technology, and cleaning applications. Users will find this volume an excellent resource on the use of stable dispersions in precision cleaning. - Single source of current information on surfactants, emulsions, microemulsions and detergents for precision cleaning applications - Includes a list of extensive reference sources - Discusses specific selection and properties of surfactants and their use in cleaning - Provides a guide for cleaning applications in different industry sectors

Book Nanoscale Calibration Standards and Methods

Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

Book Light Scattering from Microstructures

Download or read book Light Scattering from Microstructures written by Fernando Moreno and published by Springer. This book was released on 2008-01-11 with total page 293 pages. Available in PDF, EPUB and Kindle. Book excerpt: The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.

Book Machine Vision Applications in Industrial Inspection

Download or read book Machine Vision Applications in Industrial Inspection written by and published by . This book was released on 2000 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book International Aerospace Abstracts

Download or read book International Aerospace Abstracts written by and published by . This book was released on 1998 with total page 920 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Index of Conference Proceedings

Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 1999 with total page 844 pages. Available in PDF, EPUB and Kindle. Book excerpt: