Download or read book Special Section on the 12th IEEE VLSI Test Symposium written by and published by . This book was released on 1995 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Section on the 12th IEEE VLSI Test Symposium written by W. Maly and published by . This book was released on 1995 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The 12th IEEE VLSI Test Symposium written by W. Maly and published by . This book was released on 1995 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 12th IEEE VLSI Test Symposium written by and published by . This book was released on 1994 with total page 466 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Test written by and published by . This book was released on 1994 with total page 466 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Issue on 16th IEEE VLSI Test Symposium VTS 98 written by VLSI Test Symposium and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1997 with total page 1468 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Test Symposium 12th IEEE written by and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Issue on the 16th IEEE VLSI Test Symposium VTS 98 written by and published by . This book was released on 1999 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Issue on the 16th IEEE VLSI Test Symposium VTS 98 written by Michael Nicolaidis and published by . This book was released on 1999 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 16th IEEE VLSI Test Symposium written by and published by . This book was released on 1998 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Test Symposium VTS 98 16th IEEE written by IEEE, Society Staff and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Test Symposium 21st IEEE written by IEEE Computer Society Staff and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Download or read book Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors written by José Rodrigo Azambuja and published by Springer. This book was released on 2014-07-07 with total page 107 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes fault tolerance techniques based on software and hardware to create hybrid techniques. They are able to reduce overall performance degradation and increase error detection when associated with applications implemented in embedded processors. Coverage begins with an extensive discussion of the current state-of-the-art in fault tolerance techniques. The authors then discuss the best trade-off between software-based and hardware-based techniques and introduce novel hybrid techniques. Proposed techniques increase existing fault detection rates up to 100%, while maintaining low performance overheads in area and application execution time.