Download or read book Simulation Model for Hot carrier induced Degradation of CMOS Analog Circuits written by Wilson Yap Chan and published by . This book was released on 1994 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Hot carrier Reliability of CMOS Integrated Circuits written by Jone Fang Chen and published by . This book was released on 1998 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Analog IC Reliability in Nanometer CMOS written by Elie Maricau and published by Springer Science & Business Media. This book was released on 2013-01-11 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Download or read book Device Modeling for Analog and RF CMOS Circuit Design written by Trond Ytterdal and published by John Wiley & Sons. This book was released on 2003-08-01 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: Bridges the gap between device modelling and analog circuit design. Includes dedicated software enabling actual circuit design. Covers the three significant models: BSIM3, Model 9 &, and EKV. Presents practical guidance on device development and circuit implementation. The authors offer a combination of extensive academic and industrial experience.
Download or read book Analog Circuit Design written by Herman Casier and published by Springer Science & Business Media. This book was released on 2011-02-01 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analog Circuit Design contains the contribution of 18 tutorials of the 19th workshop on Advances in Analog Circuit Design. Each part discusses a specific to-date topic on new and valuable design ideas in the area of analog circuit design. Each part is presented by six experts in that field and state of the art information is shared and overviewed. This book is number 20 in this successful series of Analog Circuit Design, providing valuable information and excellent overviews of: Robust Design, chaired by Herman Casier, Consultant Sigma Delta Converters, chaired by Prof. Michiel Steyaert, Catholic University Leuven RFID, chaired by Prof. Arthur van Roermund, Eindhoven University of Technology Analog Circuit Design is an essential reference source for analog circuit designers and researchers wishing to keep abreast with the latest development in the field. The tutorial coverage also makes it suitable for use in an advanced design course.
Download or read book Hot carrier Reliability of Integrated Circuits written by Khandker Nazrul Quader and published by . This book was released on 1993 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Nano scale CMOS Analog Circuits written by Soumya Pandit and published by CRC Press. This book was released on 2018-09-03 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability concerns and the limitations of process technology can sometimes restrict the innovation process involved in designing nano-scale analog circuits. The success of nano-scale analog circuit design requires repeat experimentation, correct analysis of the device physics, process technology, and adequate use of the knowledge database. Starting with the basics, Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design introduces the essential fundamental concepts for designing analog circuits with optimal performances. This book explains the links between the physics and technology of scaled MOS transistors and the design and simulation of nano-scale analog circuits. It also explores the development of structured computer-aided design (CAD) techniques for architecture-level and circuit-level design of analog circuits. The book outlines the general trends of technology scaling with respect to device geometry, process parameters, and supply voltage. It describes models and optimization techniques, as well as the compact modeling of scaled MOS transistors for VLSI circuit simulation. • Includes two learning-based methods: the artificial neural network (ANN) and the least-squares support vector machine (LS-SVM) method • Provides case studies demonstrating the practical use of these two methods • Explores circuit sizing and specification translation tasks • Introduces the particle swarm optimization technique and provides examples of sizing analog circuits • Discusses the advanced effects of scaled MOS transistors like narrow width effects, and vertical and lateral channel engineering Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design describes the models and CAD techniques, explores the physics of MOS transistors, and considers the design challenges involving statistical variations of process technology parameters and reliability constraints related to circuit design.
Download or read book Aging Degradation and Countermeasures written by Shailesh More and published by Sudwestdeutscher Verlag Fur Hochschulschriften AG. This book was released on 2012 with total page 140 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the outcome of investigations on the effects of aging mechanisms induced parameter shifts and performance degradation in analog and mixed signal integrated circuits. Degradation induced due to aging mechanisms like bias temperature instability, conducting and non-conducting hot carrier injection in NMOS and PMOS devices leads to increased challenges in design of reliable circuits in deep-submicrometer CMOS technologies. The lifetime degradation induces threshold voltage and drain current shifts that can result into mismatch in matched transistor pairs which is especially important for analog and mixed signal circuit's accuracy. The investigations are done based on analytical evaluation, aging simulation and measurements using sample circuits implemented in state-of-the-art 32nm high-k metal gate CMOS technology. Calibration and correction techniques suitable for overcoming time varying aging induced circuit performance degradation are proposed and investigated. This book is structured to guide the reader from important aging mechanisms, over to aging degradation in analog and mixed signal building blocks and countermeasures to overcome these effects.
Download or read book IEEE TENCON 2003 written by and published by Allied Publishers. This book was released on 2003 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the International Conference on Microelectronics written by and published by . This book was released on 2001 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Bias Temperature Instability for Devices and Circuits written by Tibor Grasser and published by Springer Science & Business Media. This book was released on 2013-10-22 with total page 805 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Download or read book Microelectronics Education written by Adrian M. Ionescu and published by Springer Science & Business Media. This book was released on 2013-03-19 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book key contributions on developments and challenges in research and education on microelectronics, microsystems and related areas are published. Topics of interest include, but are not limited to: emerging fields in design and technology, new concepts in teaching, multimedia in microelectronics, industrial roadmaps and microelectronic education, curricula, nanoelectronics teaching, long distance education. The book is intended for academic education level and targets professors, researchers and PhDs involved in microelectronics and/or more generally, in electrical engineering, microsystems and material sciences. The 2004 edition of European Workshop on Microelectronics Education (EWME) is particularly focused on the interface between microelectronics and bio-medical sciences.
Download or read book Predicting CMOS Hot Carrier Degradation in VLSI Circuits written by Erhong Li and published by . This book was released on 1999 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design and Modeling of Low Power VLSI Systems written by Sharma, Manoj and published by IGI Global. This book was released on 2016-06-06 with total page 423 pages. Available in PDF, EPUB and Kindle. Book excerpt: Very Large Scale Integration (VLSI) Systems refer to the latest development in computer microchips which are created by integrating hundreds of thousands of transistors into one chip. Emerging research in this area has the potential to uncover further applications for VSLI technologies in addition to system advancements. Design and Modeling of Low Power VLSI Systems analyzes various traditional and modern low power techniques for integrated circuit design in addition to the limiting factors of existing techniques and methods for optimization. Through a research-based discussion of the technicalities involved in the VLSI hardware development process cycle, this book is a useful resource for researchers, engineers, and graduate-level students in computer science and engineering.
Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 2304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Hot Carrier Degradation in Semiconductor Devices written by Tibor Grasser and published by Springer. This book was released on 2014-10-29 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Download or read book Hot Carrier Degradation in Analogue CMOS Circuits written by Michael John KIVI and published by . This book was released on 1993 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
