Download or read book Short term Annealing in Silicon Devices After Fission and Fusion Irradiations written by and published by . This book was released on 1977 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The described technique estimates the transient recovery of a semiconductor device to a short pulse of damaging radiation. Unlike previous techniques this method uses meaningful parameters, at relevant fluences, of typical mil. spec. devices. Using existing simulation facilities steady state (seconds) irradiations are proposed and a Fredholm integral equation is unfolded to obtain the transient response. The technique, which is applicable to both neutron and gamma radiation, is demonstrated by a simulated neutron irradiation transient recovery experiment. Applied to weapons systems the technique facilitates accurate predictions of electronic recovery times after exposure of the system to a weapons burst. It also obviates the necessity of building new pulsed simulation machines for direct measurement of transient recovery.
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1975 with total page 1090 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Energy Research Abstracts written by and published by . This book was released on 1984 with total page 728 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Charge state Effects on Annealing of Electron irradiated Silicon written by H. M. DeAngelis and published by . This book was released on 1974 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: Radiation-induced defects can alter the properties of silicon and thereby degrade the performance of devices used in electronic and optoelectronic subsystems that must operate in nuclear and space radiation environments. The factors that produce or affect the stability of these defects are important considerations in developing methods for hardening devices to nuclear radiation. The annealing behavior of the E center, a prominent defect in electron-irradiated float-zone phosphorous-doped silicon, can be monitored by capacitance measurement techniques used with silicon Schottky barrier diodes. The defect charge state can be controlled during annealing by applying a reverse bias. It has been shown that although the E center is more stable in the negative charge state, it anneals more readily in the neutral charge state. It has been found that the capacitance measurement technique provides details of the properties of discrete radiation-induced defects not possible to obtain through the more conventional measurements of the Hall effect, conductivity, and carrier lifetime. (Author).
Download or read book INIS Atomindeks written by and published by . This book was released on 1979 with total page 1524 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Short term Annealing in Semiconductor Materials and Devices written by J. W. Harrity and published by . This book was released on 1967 with total page 92 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1992 with total page 1572 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Government Reports Announcements Index written by and published by . This book was released on 1978 with total page 836 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1981 with total page 680 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 684 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1981 with total page 684 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1980 with total page 686 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Technical Abstract Bulletin written by and published by . This book was released on 1968 with total page 952 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Government Reports Announcements written by and published by . This book was released on 1973-07-10 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Government reports annual index written by and published by . This book was released on 199? with total page 1064 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Particle Physics Reference Library written by Christian W. Fabjan and published by Springer Nature. This book was released on 2020 with total page 1083 pages. Available in PDF, EPUB and Kindle. Book excerpt: This second open access volume of the handbook series deals with detectors, large experimental facilities and data handling, both for accelerator and non-accelerator based experiments. It also covers applications in medicine and life sciences. A joint CERN-Springer initiative, the "Particle Physics Reference Library" provides revised and updated contributions based on previously published material in the well-known Landolt-Boernstein series on particle physics, accelerators and detectors (volumes 21A, B1,B2,C), which took stock of the field approximately one decade ago. Central to this new initiative is publication under full open access
Download or read book Physics Briefs written by and published by . This book was released on 1993 with total page 1206 pages. Available in PDF, EPUB and Kindle. Book excerpt:
