Download or read book Secondary Ion Mass Spectrometry and Auger Electron Spectroscopy Semiquantitative Analysis of Metal Alloys written by LE. Davis and published by . This book was released on 1978 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: Secondary ion mass spectroscopy (SIMS) and Auger electron spectroscopy (AES) data were obtained for metal alloys of known bulk composition. The measurements were made from the same surface regions of the alloys and then compared to measurements of elemental standards to facilitate quantitative analysis. The SIMS data were obtained with and without a residual oxygen base pressure to investigate the role of oxygen enhancement in determining surface composition. Compositions of a nimonic and lead-bronze alloy as determined by AES and SIMS were compared and the differences discussed in terms of secondary ion yields and sputtering effects.
Download or read book Secondary Ion Mass Spectroscopy of Solid Surfaces written by V. T. Cherepin and published by CRC Press. This book was released on 2020-04-28 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
Download or read book Quantitative Surface Analysis of Materials written by Symposium on Progress in Quantitative Surface Analysis and published by ASTM International. This book was released on 1986-03 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary Ion Mass Spectrometry written by Kurt F. J. Heinrich and published by . This book was released on 1975 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Spectroscopy for Chemical Analysis Secondary Ion Mass Spectrometry and Ion Scattering Spectroscopy Studies of Titanium Alloys written by Yun Hee Park and published by . This book was released on 1983 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Surface Analysis Techniques for Metallurgical Applications written by Robert S. Carbonara and published by . This book was released on 1976 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary Ion Mass Spectrometry written by J. C. Vickerman and published by Oxford University Press, USA. This book was released on 1989 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Download or read book Metals Abstracts written by and published by . This book was released on 1993 with total page 606 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary Ion Mass Spectrometry written by Fred Stevie and published by Momentum Press. This book was released on 2015-09-15 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Download or read book Secondary Ion Mass Spectrometry written by Paul van der Heide and published by John Wiley & Sons. This book was released on 2014-08-19 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Download or read book Five year Index to ASTM Technical Papers and Reports written by American Society for Testing and Materials and published by . This book was released on 1976 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary Ion Mass Spectrometry written by Robert G. Wilson and published by Wiley-Interscience. This book was released on 1989-11-16 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.
Download or read book Physics Briefs written by and published by . This book was released on 1994 with total page 1224 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary Ion Mass Spectrometry SIMS II written by A. Benninghoven and published by . This book was released on 1979 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Metals Abstracts Index written by and published by . This book was released on 1983 with total page 894 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary Ion Mass Spectrometry written by A. Benninghoven and published by Springer. This book was released on 1984 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book A Comparison Between Auger Electron Spectroscopy AES and Secondary Ion Mass Stpectrometry SIMS on Well Characte written by H. Niehus and published by . This book was released on 1974 with total page 16 pages. Available in PDF, EPUB and Kindle. Book excerpt:
