Download or read book Reliability Yield and Stress Burn In written by Way Kuo and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.
Download or read book Reliability Yield and Stress Burn In written by Way Kuo and published by . This book was released on 2014-09-01 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Springer Handbook of Engineering Statistics written by Hoang Pham and published by Springer Science & Business Media. This book was released on 2006 with total page 1135 pages. Available in PDF, EPUB and Kindle. Book excerpt: In today’s global and highly competitive environment, continuous improvement in the processes and products of any field of engineering is essential for survival. This book gathers together the full range of statistical techniques required by engineers from all fields. It will assist them to gain sensible statistical feedback on how their processes or products are functioning and to give them realistic predictions of how these could be improved. The handbook will be essential reading for all engineers and engineering-connected managers who are serious about keeping their methods and products at the cutting edge of quality and competitiveness.
Download or read book Statistical Quality Technologies written by Yuhlong Lio and published by Springer. This book was released on 2019-08-09 with total page 409 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explores different statistical quality technologies including recent advances and applications. Statistical process control, acceptance sample plans and reliability assessment are some of the essential statistical techniques in quality technologies to ensure high quality products and to reduce consumer and producer risks. Numerous statistical techniques and methodologies for quality control and improvement have been developed in recent years to help resolve current product quality issues in today’s fast changing environment. Featuring contributions from top experts in the field, this book covers three major topics: statistical process control, acceptance sampling plans, and reliability testing and designs. The topics covered in the book are timely and have a high potential impact and influence to academics, scholars, students and professionals in statistics, engineering, manufacturing and health.
Download or read book System on Chip written by Bashir M. Al-Hashimi and published by IET. This book was released on 2006-01-31 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
Download or read book Thermal and Power Management of Integrated Circuits written by Arman Vassighi and published by Springer Science & Business Media. This book was released on 2006-06-01 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
Download or read book Statistical Modeling for Degradation Data written by Ding-Geng (Din) Chen and published by Springer. This book was released on 2017-08-31 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on the statistical aspects of the analysis of degradation data. In recent years, degradation data analysis has come to play an increasingly important role in different disciplines such as reliability, public health sciences, and finance. For example, information on products’ reliability can be obtained by analyzing degradation data. In addition, statistical modeling and inference techniques have been developed on the basis of different degradation measures. The book brings together experts engaged in statistical modeling and inference, presenting and discussing important recent advances in degradation data analysis and related applications. The topics covered are timely and have considerable potential to impact both statistics and reliability engineering.
Download or read book Interlayer Dielectrics for Semiconductor Technologies written by Shyam P Muraka and published by Elsevier. This book was released on 2003-10-13 with total page 459 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor technologies are moving at such a fast pace that new materials are needed in all types of application. Manipulating the materials and their properties at atomic dimensions has become a must. This book presents the case of interlayer dielectrics materials whilst considering these challenges. Interlayer Dielectrics for Semiconductor Technologies cover the science, properties and applications of dielectrics, their preparation, patterning, reliability and characterisation, followed by the discussion of different materials including those with high dielctric constants and those useful for waveguide applications in optical communications on the chip and the package.* Brings together for the FIRST time the science and technology of interlayer deilectrics materials, in one volume* written by renowned experts in the field* Provides an up-to-date starting point in this young research field.
Download or read book General Society Student Poster Session written by A. H, Suroviec and published by The Electrochemical Society. This book was released on 2016-09-21 with total page 71 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Statistics and Simulation written by Jürgen Pilz and published by Springer. This book was released on 2018-05-17 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features original contributions and invited review articles on mathematical statistics, statistical simulation and experimental design. The selected peer-reviewed contributions originate from the 8th International Workshop on Simulation held in Vienna in 2015. The book is intended for mathematical statisticians, Ph.D. students and statisticians working in medicine, engineering, pharmacy, psychology, agriculture and other related fields. The International Workshops on Simulation are devoted to statistical techniques in stochastic simulation, data collection, design of scientific experiments and studies representing broad areas of interest. The first 6 workshops took place in St. Petersburg, Russia, in 1994 – 2009 and the 7th workshop was held in Rimini, Italy, in 2013.
Download or read book Artificial Intelligence Big Data and Data Science in Statistics written by Ansgar Steland and published by Springer Nature. This book was released on 2022-11-15 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the interplay between statistics, data science, machine learning and artificial intelligence, with a focus on environmental science, the natural sciences, and technology. It covers the state of the art from both a theoretical and a practical viewpoint and describes how to successfully apply machine learning methods, demonstrating the benefits of statistics for modeling and analyzing high-dimensional and big data. The book’s expert contributions include theoretical studies of machine learning methods, expositions of general methodologies for sound statistical analyses of data as well as novel approaches to modeling and analyzing data for specific problems and areas. In terms of applications, the contributions deal with data as arising in industrial quality control, autonomous driving, transportation and traffic, chip manufacturing, photovoltaics, football, transmission of infectious diseases, Covid-19 and public health. The book will appeal to statisticians and data scientists, as well as engineers and computer scientists working in related fields or applications.
Download or read book Reliability Prediction from Burn In Data Fit to Reliability Models written by Joseph Bernstein and published by Academic Press. This book was released on 2014-03-06 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. - The ability to include reliability calculations and test results in their product design - The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions - Have accurate failure rate calculations for calculating warrantee period replacement costs
Download or read book Naval Research Logistics written by and published by . This book was released on 2004 with total page 608 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook of Military Industrial Engineering written by Adedeji B. Badiru and published by CRC Press. This book was released on 2009-02-25 with total page 830 pages. Available in PDF, EPUB and Kindle. Book excerpt: In light of increasing economic and international threats, military operations must be examined with a critical eye in terms of process design, management, improvement, and control. Although the Pentagon and militaries around the world have utilized industrial engineering (IE) concepts to achieve this goal for decades, there has been no single reso
Download or read book Istfa 2003 written by ASM International and published by ASM International. This book was released on 2003-01-01 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Failure Analysis written by Marius Bazu and published by John Wiley & Sons. This book was released on 2011-03-08 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Download or read book Nonvolatile Memory Technologies with Emphasis on Flash written by Joe Brewer and published by John Wiley & Sons. This book was released on 2011-09-23 with total page 766 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presented here is an all-inclusive treatment of Flash technology, including Flash memory chips, Flash embedded in logic, binary cell Flash, and multilevel cell Flash. The book begins with a tutorial of elementary concepts to orient readers who are less familiar with the subject. Next, it covers all aspects and variations of Flash technology at a mature engineering level: basic device structures, principles of operation, related process technologies, circuit design, overall design tradeoffs, device testing, reliability, and applications.
