Download or read book Effects of Radiation Damage on Scientific Charge Coupled Devices microform written by Timothy D. Hardy and published by National Library of Canada = Bibliothèque nationale du Canada. This book was released on 1997 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Damage Effects in Charge Coupled Devices written by Mark Stanford Robbins and published by . This book was released on 1992 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Damage Effect in Charge Coupled Devices written by Mark Stanford Robbins and published by . This book was released on 1992 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Effects of Radiation Damage on Scientific Charge Coupled Devices written by Timothy D. Hardy and published by . This book was released on 1997 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Damage in Charge Coupled Devices written by David Ryan Smith and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Effects on Charge Coupled Devices and Other MOS Structures written by Joseph R. Srour and published by . This book was released on 1978 with total page 179 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes results of radiation effects studies on charge-coupled devices (CCDs) and other MOS structures. Emphasis is placed on determining the basic mechanisms of the interaction of radiation with such devices with a view toward gaining understanding of benefit to developers of radiation-tolerant devices. A study of neutron damage mechanisms in CCDs was performed with emphasis placed on investigation of dark current increases.

Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by CRC Press. This book was released on 2018-09-03 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.

Download or read book Radiation Damage in Scientific Charge coupled Devices written by Niels Bassler and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific Charge coupled Devices written by James R. Janesick and published by SPIE Press. This book was released on 2001 with total page 936 pages. Available in PDF, EPUB and Kindle. Book excerpt: "The book provides invaluable information to scientists, engineers, and product managers involved with imaging CCDs, as well as those who need a comprehensive introduction to the subject."--Page 4 de la couverture

Download or read book Radiation Damage in Optical Charge Coupled Devices written by and published by . This book was released on 1996 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Handbook of Radiation Effects written by Andrew Holmes-Siedle and published by Oxford University Press, USA. This book was released on 1993 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: Of requirements for steady-state radiation sources -- Cosmic ray upset simulation -- Heavy ions -- Fission fragments -- Laser light -- Dosimetry for radiation testing -- Test procedures for semiconductor devices -- Comparison of space with military requirements -- Radiation response specifications -- Product assurance techniques and special radiation assessment -- ESA/SCC and ECSS specifications (Europe) -- BS 9000 specifications and CECC (Europe) -- MIL specifications (USA) -- ASTM specifications (USA) -- Electronic Industries Association EIA (USA) -- Comparison of standards -- Engineering materials -- Time-dependent effects and post-irradiation effects -- Radiation-hardening of semiconductor parts -- Methodology of total-dose hardening -- Hardening of a process -- Material preparation and cleaning -- Oxide growth -- Oxide anneal -- Gate electrode -- Modified gate insulators -- Field oxide hardening -- Other processing steps -- Hardening for total dose by 'layout' -- Hardening against transient radiation -- Pulsed gamma rays -- Single-event upsets -- Commercial radiation-hard and radiation-tolerant technologies -- Deep submicron technology -- Silicon on insulator (SOI) -- Standard products -- 'Fabless' manufacturer -- Hardening of parts other than silicon -- Equipment hardening and hardness assurance -- Elementary rules of hardening -- Hardening measures at the systems level -- Robots, diagnostics and military vehicles in penetrating radiation -- Manipulators for nuclear plant -- Hardening of a robotic vehicle.

Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Ronald Donald Schrimpf and published by World Scientific. This book was released on 2004 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Download or read book CCD Image Sensors in Deep Ultraviolet written by Flora Li and published by Springer Science & Business Media. This book was released on 2005-03 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.

Download or read book CCD Image Sensors in Deep Ultraviolet written by Flora Li and published by Springer Science & Business Media. This book was released on 2006-01-05 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.

Download or read book Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and published by World Scientific. This book was released on 2004-07-29 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Download or read book Radiation Effects in Advanced Semiconductor Materials and Devices written by C. Claeys and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

Download or read book Electron and Neutron Radiation Damage Effects on a Two phase CCD written by K. D. Stefanov and published by . This book was released on 1999 with total page 27 pages. Available in PDF, EPUB and Kindle. Book excerpt: