Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1976-06 with total page 1216 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Eighth National Conference on Electron Probe Analysis written by and published by . This book was released on 1973 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metallography written by Abrams H. and published by ASTM International. This book was released on 1986 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metron written by and published by . This book was released on 1973 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: Measurement, control, automation.

Download or read book Literature 1973 Part 1 written by Siegfried Böhme and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 618 pages. Available in PDF, EPUB and Kindle. Book excerpt: Astronomy and Astrophysics Abstracts, which has appeared in semi-annual volumes since 1969, is de voted to the recording, summarizing and indexing of astronomical publications throughout the world. It is prepared under the auspices of the International Astronomical Union (according to a resolution adopted at the 14th General Assembly in 1970). Astronomy and Astrophysics Abstracts aims to present a comprehensive documentation of literature in all fields of astronomy and astrophysics. Every effort will be made to ensure that the average time interval between the date of receipt of the original literature and publication of the abstracts will not exceed eight months. This time interval is near to that achieved by monthly abstracting journals, com pared to which our system of accumulating abstracts for about six months offers the advantage of greater convenience for the user. Volume 9 contains literature published in 1973 and received before August 15, 1973; some older liter ature which was received late and which is not recorded in earlier volumes is also included. We acknowledge with thanks contributions to this volume by Dr. J. Bouska, who surveyed journals and publications in the Czech language and supplied us with abstracts in English, and by the Common wealth Scientific and Industrial Research Organization (C.S.I.R.O.), Sydney, for providing titles and abstracts of papers on radio astronomy.

Download or read book Metallography A Practical Tool for Correlating the Structure and Properties of Materials written by and published by ASTM International. This book was released on 1974 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1976 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

Download or read book National Union Catalog written by and published by . This book was released on 1980 with total page 1032 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes entries for maps and atlases.

Download or read book Accessions of Unlimited Distribution Reports written by and published by . This book was released on 1972-08-25 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Micron written by and published by . This book was released on 1974 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: The international journal of electron microscopy, electron probe micro-analysis & associated techniques.

Download or read book Semiannual List of Publications and Patents with Abstracts written by United States. Agricultural Research Service. Western Utilization Research Branch and published by . This book was released on 1971 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings of the Twenty Fourth Annual Conference on Applications of X Ray Analysis written by R. W. Gould and published by . This book was released on 1976 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Bibliography and Index of Geology written by and published by . This book was released on 1985 with total page 1696 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Microscopy 1974 Physical written by J. V. Sanders and published by . This book was released on 1974 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Union List of Conference Proceedings in New Zealand Libraries written by National Library of New Zealand and published by University of Washington Press. This book was released on 1977 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization of Solid Surfaces written by Philip F. Kane and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 675 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.