Download or read book Models Measurement and Metrology Extending the Si written by William P Fisher Jr and published by Walter de Gruyter GmbH & Co KG. This book was released on 2024-09-23 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book focuses on the extension of quality-assured measurement and metrology into psychological and social domains. This is not only feasible and achievable, but also a pressing concern. Significant progress in developing a common conceptual system for measurement across the sciences has been made in recent collaborations between metrologists and psychometricians, as reported in the chapters of this book. Modeling, estimation, and interpretation of objectively reproducible unit quantities that support both general comparability and adaptation to unique local circumstances are demonstrated in fields as diverse as artificial intelligence, justice, and beauty perception.

Download or read book Industrial Engineering in the Industry 4 0 Era written by Numan M. Durakbasa and published by Springer Nature. This book was released on with total page 847 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Dynamic Measuring Systems written by Sascha Eichstädt and published by Walter de Gruyter GmbH & Co KG. This book was released on 2023-11-06 with total page 189 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the concepts at the basis of dynamic measuring systems: vocabulary, modelling, calibration, measurement data analysis, uncertainty evaluation. It also provides the mathematical foundations for signal processing, stochastic processes and control theory, necessary for the analysis of dynamic measurements. Concepts and practical approaches for dynamic calibration and dynamic measurement are introduced to the readership through concrete examples ranging from mechanical quantities and medical ultrasound to the Internet of Things (IoT).

Download or read book Systems Models and Measures written by Agnes Kaposi and published by Springer. This book was released on 1994 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Systems, Models and Measures seeks to bridge the gap between the 'classical' and the newer technologies by constructing a systematic measurement framework for both. The authors use their experience as consultants in systems, software and quality engineering to take the subject from concept and theory, via strategy and procedure, to tools and applications. The book clarifies the key notions of system, model, measurement, product, process, specification and design. Practical examples demonstrate the 'architecture' of measurement schemes, extending them to object-oriented and subjective measurement. A detailed case study provides a measurement strategy for formal specifications, including Prolog, Z and VDM. The reader will be able to formulate problems in measurable terms, appraise and compare formal specifications, assess and enhance existing measurement practices, and devise measurement schemes for describing objective characteristics and expressing value judgements.

Download or read book Metrological Infrastructure written by Beat Jeckelmann and published by Walter de Gruyter GmbH & Co KG. This book was released on 2023-07-24 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metrology is part of the essential but largely hidden infrastructure of the modern world. This book concentrates on the infrastructure aspects of metrology. It introduces the underlying concepts: International system of units, traceability and uncertainty; and describes the concepts that are implemented to assure the comparability, reliability and quantifiable trust of measurement results. It is shown what benefits the traditional metrological principles have in fields as medicine or in the evaluation of cyber physical systems.

Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials Devices and Processes 7 written by Dieter K. Schroder and published by The Electrochemical Society. This book was released on 2007 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.

Download or read book Metrology Inspection and Process Control for Microlithography written by and published by . This book was released on 1999 with total page 548 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma and published by CRC Press. This book was released on 2017-03-27 with total page 889 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Download or read book Silicon Materials Science and Technology written by and published by . This book was released on 1998 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1981 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1988 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 788 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Extended Abstracts written by Electrochemical Society and published by . This book was released on 1992 with total page 1150 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization and Metrology for ULSI Technology 2005 written by David G. Seiler and published by American Institute of Physics. This book was released on 2005-09-29 with total page 714 pages. Available in PDF, EPUB and Kindle. Book excerpt: The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise.

Download or read book Integrated Circuit Metrology Inspection and Process Control written by and published by . This book was released on 1991 with total page 654 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Integrated Circuit Metrology Inspection and Process Control V written by William H. Arnold and published by SPIE-International Society for Optical Engineering. This book was released on 1991 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 1904 pages. Available in PDF, EPUB and Kindle. Book excerpt: