Download or read book Microcircuit Device Reliability Memory digital Lsi written by K.A. Dey and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Kieron A. Dey and published by . This book was released on 1981 with total page 462 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains data on memory and digital LSI device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparison of predicted with observed failure rates is given, predictions being carried out to MIL-HDBK-217C. This book includes a new section on failure analysis results not included in previous editions. (Author).

Download or read book Microcircuit Device Reliability written by Kieron A. Dey and published by . This book was released on 1981 with total page 443 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Henry C. Rickers and published by . This book was released on 1977 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendia of Microcircuit Reliability data is divided into several sections. One section summarizes memory and LSI(Large Scale Integration) test and field data. These analyses include the summarization of screening and environmental test results, life test data, reliability demonstration data, failure summaries and the comparison of observed and MIL-HDBK-217B predicted failure rates. In another section, screening, environmental, life, reliability demonstration tests and field experience data are presented for memory and LSI devices in detail. The detailed data is presented in sections according to device function and further ordered by device technology and complexity.

Download or read book Microcircuit Device Reliability written by Henry C. Rickers and published by . This book was released on 1977 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Henry C. Rickers and published by . This book was released on 1975 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Memory LSI Data Summer 1979 written by Mark R. Klein and published by . This book was released on 1979 with total page 221 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendia of Microcircuit Reliability data is divided into two sections. Section one summarizes memory and LSI test and field data. These analyses include the summarization of life test data, reliability demonstration data, and the comparison of observed and MIL-HDBK-217C predicted failure rates. In section two, life, equipment level tests and field experience data are presented for memory and LSI devices in detail. The detailed data are presented in sections according to device function and are further order by device technology and complexity.

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by and published by . This book was released on 1984 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Memory LSI Data Prepared written by Henry C. Rickers and published by . This book was released on 1977 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Trend Analysis written by and published by . This book was released on 1985 with total page 371 pages. Available in PDF, EPUB and Kindle. Book excerpt: MDR-21 is a study of microcircuit field failure data based on various microcircuit types (digital SSI, MSI, LSI, linear, interface, memory and VLSI). The report includes failure rate data based on actual field failure records (data acquired from MDR-21A) calculated with Bayesian statistics. Failure distribution information is also presented in a quantifiable assembly of descriptive failure-related terms. Equipment-level comparisons were made to determine the impact on reliability relative to variations in manufacturers requirements. The text is complete with graphical representations and narratives in support of the study findings. Keywords include: Reliability trends; Bayesian statistics; Failure indicator/Mode distributions; Chi-square; Equipment manufacturer; and Influences.

Download or read book Memory LSI Data written by Mark R. Klein and published by . This book was released on 1979 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1974 with total page 888 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Memory LSI Data written by Henry C. Rickers and published by . This book was released on 1977 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Evaluation of LSI Microcircuits written by James H. Lindwedel and published by . This book was released on 1973 with total page 211 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objectives of this evaluation were to (1) define common failure modes; (2) document failure analysis; and (3) develop better and lower cost electrical and stress test techniques for predicting, assessing, and assuring the reliability of LSI microcircuits. The approach to the evaluation included a canvass of the industry for failure modes experienced, tests used, and available process and logic function types. Next, an optimized and practical set of electrical tests and electrical-thermal stress tests were formulated for a quantity of 595 devices selected having hermetically sealed packages and manufacturing date in the first quarter of 1971. Process types included PMOS, PMOS ion implant, PMOS silicon gate, PMOS molybdenum gate, CMOS, bipolar, discretionary wired bipolar and Schottky diode clamped bipolar. Logic functions included a decade counter, five shift registers, a digital multiplier, five random access memories, and a time buffer register. Following the stress tests, devices were life tested at 125 C under dynamic excitation, power and load. Failed devices were analyzed at the subcomponent level. Related efforts included in the evaluation are covered in this report, such as failure modes experienced, tests, normal stabilities for device test data, and test effectiveness, for MOS and bipolar LSI microcircuits, and a failure rate prediction for several MOS microcircuits. (Author).

Download or read book Microcircuit Device Reliability Digital Detailed Data written by Mark R. Klein and published by . This book was released on 1976 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliable Computer Systems written by Daniel P. Siewiorek and published by CRC Press. This book was released on 1998-12-15 with total page 908 pages. Available in PDF, EPUB and Kindle. Book excerpt: This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors