Download or read book Mechanisms of Transient Radiation Effects State of the Art written by V. A. J. VAN LINT and published by . This book was released on 1962 with total page 1 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Mechanisms of Transient Radiation Effects written by V. A. J. van Lint and published by . This book was released on 1968 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of this report is to provide readers with an understanding of the interaction of nuclear radiation with matter in electronic components and devices and the resulting effects which could adversely affect their performance. This information will serve as a background for understanding transient radiation effects in electronics (TREE) and, if necessary, as a basis for making crude estimates of expected effects when no experimental data are available. Included are discussions of displacement, ionization and chemical effects, and a note on shielding requirements. For each type of effect, the steps leading from the primary interaction between the radiation and a target atom to the physical manifestation, i.e., changes in the macroscopic properties, are summarized. Some rules are provided for estimating the magnitudes of the effects, and these rules are illustrated by applying them to typical electronic devices.
Download or read book Basic Mechanisms of Transient Radiation Effects in the Thin Film Transistor written by C. C. Berggren and published by . This book was released on 1966 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt: This program includes studies of active device intrinsic response and has as its broad objective the study of this intrinsic response for the majority carrier thin-film transistor. For this study fundamental solid state behavior is described in terms of active device circuit parameters and leads ultimately to radiation hard circuit design by manipulation of device design parameters.
Download or read book An Investigation of Basic Mechanisms of Transient High Energy Radiation Effects in Insulators and Semiconductors written by V. R. Honnold and published by . This book was released on 1964 with total page 65 pages. Available in PDF, EPUB and Kindle. Book excerpt: This program was concerned with developing a thorough understanding, in solid state theory, of the effect produced in electronic materials by nuclear weapon radiation. The program was directed in such a way as to provide an answer to the following practical questions. Given a weapon time history, what are the physical processes and what are the mechanisms that determine their response time during and after exposure to pulsed high energy radiation. More specifically, it is important to determine the nature of that process, in a given material, either semiconductor or insulator, that is rate limiting, since, in general, the response will not be governed by a single simple process. (Author).
Download or read book Basic Mechanisms of Radiation Effects in Electronic Materials and Devices written by and published by . This book was released on 1987 with total page 91 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report reviews the primary physical processes underlying the response of electronic materials and devices to radiation as well as the relationship of these processes to the modes of circuit degradation and failure. An overview presents brief discussions of the major radiation environments of practical interest, the interaction of radiation with solid targets, common terminology of radiation exposure, and the primary radiation effects in electronic materials, including ionization effects (radiation-induced photocurrents and space charge buildup) and atomic displacement damage effects. An emphasis is given to the problem of total-dose ionization response, primarily in metal-oxide-semiconductor (MOS) systems. In particular, a description of the basic physical phenomena underlying the complex time history of the MOS radiation response is given, and some implications of the time-dependent response for issues of radiation testing, hardness assurance and radiation response prediction are pointed out. There is also discussion on the implications of scaling down the gate oxide thickness and on the increasingly important problem of radiation-induced leakage currents. Keywords: Radiation effects, Ionizing radiation, Nuclear weapons effects, Microelectronics, Metal oxide semiconductor devices, Bipolar devices, Total dose ionization, Transient radiation, Single event upset.
Download or read book TRANSIENT RADIATION EFFECTS written by D. M. J. Compton and published by . This book was released on 1963 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this research program is to gain a greater understanding of the basic mechanisms of transient radiation effects in materials and components by separating them into individual physical phenomena. Each of these phenomena is then studied as a function of the type, energy, and dose rate of the radiation, and with appropriate variation of the experimental parameters. Five phenomena were studied during this research program. It is believed that most of the important manifestations of transient radiation effects produced by pulsed irradiation of an electronic circuit can be ascribed to phenomena discussed or to their combinations. In the period, most effort was placed on two programs: (1) study of the transient conductivity induced in plastic films, and (2) the development of means of measuring secondary emission from metals as a function of the angle and energy of emission. (Author).
Download or read book Mechanisms of Radiation Effects in Electronic Materials written by Victor A. Vanlint and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Mechanisms of Radiation Effects in Electronic Materials written by V. A. J. Van Lint and published by John Wiley & Sons. This book was released on 1980 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Study of Transient Radiation Effects on Microelectronics written by Edward J. Steele and published by . This book was released on 1967 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose was to determine microcircuit vulnerability in a transient radiation environment. Microcircuits constructed by different fabrication techniques were experimentally evaluated in an ionizing and bulk displacement radiation environment to study the basic failure mechanisms. Test specimens were of three basic circuit types; gates, flip-flops, and amplifiers. Fabrication techniques represented were monolithic p-n junction isolation, monolithic oxide-isolation, multiple chip, thin-film compatible, and thin-film hybrid. Circuit failure thresholds were determined as a function of fan-out, ambient temperature requirements, and electrical parameter degradation. Experimental study consisted of measuring transient responses in pulsed ionizing radiation environments, and determining bulk displacement effects from exposure to a reactor neutron/gamma environment. Failure mechanisms were analytically related to the characteristics of the circuit design and fabrication technique. (Author).
Download or read book Immediate Transient Effects of Ionizing Radiation on Some Visceral Reflex Mechanisms written by Carol Marie Sidel and published by . This book was released on 1967 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Study of Transient Radiation Effects on Microelectronics Volume I Introduction Experimental Study Digital Logic Gate Study written by James P. Raymond and published by . This book was released on 1965 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose was to compare microcircuits of differing construction techniques to determine their relative vulnerability, to study basic radiation-induced failure mechanisms, and to relate these mechanisms to both construction technique and circuit design. Test specimens were of three basic circuit types of five different fabrication techniques. Circuit types included digital logic gates, flip-flops, and differential or digital sense amplifiers. Fabrication techniques represented monolithic, multiple-chip, thin film compatible, oxide-isolation, and thin-film hybrid. Experimental study consisted of determining the electrical circuit performance parameters, the transient response in pulsed ionizing radiation environments, and permanent degradation from exposure to a pulsed reactor neutron/gamma environment. Failure mechanisms were, when possible, related analyticall, to the characteristics of the circuit and the fabrication technique. (Author).
Download or read book Radiation Effects on Integrated Circuits and Systems for Space Applications written by Raoul Velazco and published by Springer. This book was released on 2019-04-10 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
Download or read book Report on Transient Radiation Effects on Electronic Components and Semiconductor Devices written by D. C. Jones and published by . This book was released on 1963 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Transient Radiation Effects on Coaxial Cables written by G. R. Hopkins and published by . This book was released on 1962 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Varying amounts and types of shielding provided large changes in relative components of flux, both with pulsing and steady-state modes of operation. The data were analyzed for each type of radiation. Although the effects have been analyzed in some detail, more investigation is required to supply more accurate numbers. Special experiments should provide clues as to which of several possible mechanisms are involved.
Download or read book Health Risks from Exposure to Low Levels of Ionizing Radiation written by Committee to Assess Health Risks from Exposure to Low Levels of Ionizing Radiation and published by National Academies Press. This book was released on 2006-03-23 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the seventh in a series of titles from the National Research Council that addresses the effects of exposure to low dose LET (Linear Energy Transfer) ionizing radiation and human health. Updating information previously presented in the 1990 publication, Health Effects of Exposure to Low Levels of Ionizing Radiation: BEIR V, this book draws upon new data in both epidemiologic and experimental research. Ionizing radiation arises from both natural and man-made sources and at very high doses can produce damaging effects in human tissue that can be evident within days after exposure. However, it is the low-dose exposures that are the focus of this book. So-called “late” effects, such as cancer, are produced many years after the initial exposure. This book is among the first of its kind to include detailed risk estimates for cancer incidence in addition to cancer mortality. BEIR VII offers a full review of the available biological, biophysical, and epidemiological literature since the last BEIR report on the subject and develops the most up-to-date and comprehensive risk estimates for cancer and other health effects from exposure to low-level ionizing radiation.
Download or read book Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and published by World Scientific. This book was released on 2004-07-29 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Download or read book Radiation Effects on Thin film Microelectronics written by Virgil H. Strahan and published by . This book was released on 1966 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt: The report describes the program to investigate the mechanisms of transient radiation effects on thin-film passive components. The effects under study included secondary emission effects, radiation-induced conductivity, memory and accumulated dose effects and damage by neutron irradiation. Radiation sources used were the 2 MeV and 600 keV flash X-ray machines, LINAC, and Fast Burst Reactor (FBR). A group of thin-film capacitors for studying the various effects was designed and fabricated. These capacitors were irradiated in air and in vacuum to determine the relative importance of the ambient environment on the total radiation-induced disturbance. Particular attention was paid to the effects of materials in the immediate proximity of the devices under study to determine methods of minimizing the effects of transient radiation.
