Download or read book In Situ Thin Film Measurements written by E. Pelletier and published by . This book was released on 1984 with total page 69 pages. Available in PDF, EPUB and Kindle. Book excerpt: The optical properties of vacuum-deposited thin films were studied in situ during deposition and in air after deposition at the Ecole Nationale Superieure de Physique, Marseille, and at the Optical Sciences Center, University of Arizona, with the objective of a better understanding of aspects of their behaviour determined largely by their microstructure. The basic measurements that were made in both institutes were similar, T and R after deposition and T during deposition, both as functions of wavelength in the visible and near infrared. The techniques for reducing the measurements to values of n, k and of inhomogeneity differed in certain respects but the results were similar. The scientific objectives were: (a) The measurement of the optical constants of thin-films in air after deposition. (b) The measurement of the optical constants of thin films in situ. (c) The study of the differences in the measurements under (a) and (b). (d) The study of aspects of the thin-film deposition process affecting the film performance as measured under (a) and (b). (e) The measurement of optical scattering from thin films and its relation with film structure.
Download or read book In Situ Real Time Characterization of Thin Films written by Orlando Auciello and published by John Wiley & Sons. This book was released on 2001 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Download or read book In Situ Measurement of Growing Thin Films by Energy Dispersive X Ray Reflectivity Theory and Experimental Design written by and published by . This book was released on 2001 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: A method for the in-situ measurement of thin-film growth by x-ray reflectivity is described. Description of the underlying theory is given. Real-time characterization of thickness and roughness variation during growth is possible via this technique. A deposition chamber for the implementation of these measurements has been designed and constructed. This apparatus is described, along with software developed for the purpose of data acquisition and analysis.
Download or read book In Situ Characterization of Thin Film Growth written by Gertjan Koster and published by Elsevier. This book was released on 2011-10-05 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth. With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. Chapters review electron diffraction techniques, including the methodology for observations and measurements Discusses the principles and applications of photoemission techniques Examines alternative in situ characterisation techniques
Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Download or read book Diffusive Gradients in Thin Films for Environmental Measurements written by William Davison and published by Cambridge University Press. This book was released on 2016-09-15 with total page 321 pages. Available in PDF, EPUB and Kindle. Book excerpt: An essential guide to the applications and usage of the diffusive gradients in thin-films (DGT) technique for students and professionals.
Download or read book In Situ Thin Film Measurement written by H. A. Macleod and published by . This book was released on 1984 with total page 46 pages. Available in PDF, EPUB and Kindle. Book excerpt: A scanning monochromator system for the monitoring of thin film deposition in a box coater is described. The system employs data from both a quartz crystal oscillator and a wide band transmission spectrometer. The spectrometer uses a holographic grating as its dispersive element and a CCD array to collect the data. All data is sent to a microcomputer where the information is displayed, stored, and analyzed. Several applications, including measurement of optical constants of optical constants of inhomogeneous films and characterization of moisture adsorption, are discussed.
Download or read book In situ Measurements of Localized Wear in Magnetic Thin film Rigid Disks written by Scott M. Forehand and published by . This book was released on 1996 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Rolling Contacts written by T. A. Stolarski and published by . This book was released on 2000 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Inspired by their many years of research collaboration, Stolarski (mechanical engineering, Brunel U., UK) and Tobe (Ashikaga Institute of Technology, Japan) have created this text with the aim of helping practicing designers, researchers, and postgraduate students (especially of engineering) to better understand, select, and design rolling contacts for mechanical devices and systems. The text presents the fundamentals of rolling friction, emphasizing the important engineering applications of rolling contacts. Applications described include rolling bearings, gears, road-tire and rail-wheel interactions, cam-tappet systems, and roll-forming of materials. Distributed by ASME. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book Thin Film Materials written by L. B. Freund and published by Cambridge University Press. This book was released on 2004-01-08 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2017-12-19 with total page 3276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Download or read book Thin Film Measurements written by Emile Pelletier and published by . This book was released on 1987 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book In Situ Spectroscopic Ellipsometry as a Surface Sensitive Tool to Probe Thin Film Growth written by and published by . This book was released on 1999 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt: Sputtered thin film and multilayer x-ray mirrors are made routinely at the Advanced Photon Source (APS) for the APS users. Precise film growth control and characterization are very critical in fabricating high-quality x-ray mirrors. Film thickness calibrations are carried out using in situ and ex situ spectroscopic ellipsometry, interferometry, and x-ray scattering. To better understand the growth and optical properties of different thin film systems, we have carried out a systematic study of sputtered thin films of Au, Rh, Pg Pd, Cu, and Cr, using in situ ellipsometry. Multiple data sets were obtained in situ for each film material with incremental thicknesses and were analyzed with their correlation in mind. We found that in situ spectroscopic ellipsometry as a surface-sensitive tool can also be used to probe the growth and morphology of the thin film system. This application of in situ spectroscopic ellipsometry for metal thin film systems will be discussed.
Download or read book Neural Networks and Deep Learning written by Charu C. Aggarwal and published by Springer. This book was released on 2018-08-25 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers both classical and modern models in deep learning. The primary focus is on the theory and algorithms of deep learning. The theory and algorithms of neural networks are particularly important for understanding important concepts, so that one can understand the important design concepts of neural architectures in different applications. Why do neural networks work? When do they work better than off-the-shelf machine-learning models? When is depth useful? Why is training neural networks so hard? What are the pitfalls? The book is also rich in discussing different applications in order to give the practitioner a flavor of how neural architectures are designed for different types of problems. Applications associated with many different areas like recommender systems, machine translation, image captioning, image classification, reinforcement-learning based gaming, and text analytics are covered. The chapters of this book span three categories: The basics of neural networks: Many traditional machine learning models can be understood as special cases of neural networks. An emphasis is placed in the first two chapters on understanding the relationship between traditional machine learning and neural networks. Support vector machines, linear/logistic regression, singular value decomposition, matrix factorization, and recommender systems are shown to be special cases of neural networks. These methods are studied together with recent feature engineering methods like word2vec. Fundamentals of neural networks: A detailed discussion of training and regularization is provided in Chapters 3 and 4. Chapters 5 and 6 present radial-basis function (RBF) networks and restricted Boltzmann machines. Advanced topics in neural networks: Chapters 7 and 8 discuss recurrent neural networks and convolutional neural networks. Several advanced topics like deep reinforcement learning, neural Turing machines, Kohonen self-organizing maps, and generative adversarial networks are introduced in Chapters 9 and 10. The book is written for graduate students, researchers, and practitioners. Numerous exercises are available along with a solution manual to aid in classroom teaching. Where possible, an application-centric view is highlighted in order to provide an understanding of the practical uses of each class of techniques.
Download or read book In situ Materials Characterization written by Alexander Ziegler and published by Springer Science & Business Media. This book was released on 2014-04-01 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Download or read book In Situ CPM Measurements of the Urbach Tail in C60 Thin Films written by Michael Heath Rasmussen and published by . This book was released on 1995 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book In Situ X ray Reflectivity Measurements of Thin Film Structural Evolution written by and published by . This book was released on 1993 with total page 17 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray reflectivity using energy dispersive X-ray detection has been used to investigate vacuum deposited thin films. A resolution of 0.3 nm for thickness in the range of 3--200 nm and of 0.05 nm for roughness in the range of 0.1--3 nm has been demonstrated. Further, it is shown that by using energy dispersive detection, spectra can be obtained in less than 500 s allowing real time studies to be performed. Thin, discrete Cr/Al deposits on quartz substrates have been investigated and the presence of a 1.5 nm thick Al/Cr intermetallic layer formed during room temperature deposition has been determined. During annealing at 250 C, the Cr layer thickness decreases linearly with time until approximately 4 nm is consumed in additional intermetallic formation; further annealing does not change the Cr layer thickness.
