Download or read book High Resolution X Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2004-08-27 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Download or read book High Resolution X Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Download or read book High Resolution X Ray Diffractometry And Topography written by D.K. Bowen and published by CRC Press. This book was released on 1998-02-05 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
Download or read book Thin Film Analysis by X Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Download or read book Synchrotron Light Sources and Free Electron Lasers written by Eberhard J. Jaeschke and published by Springer. This book was released on 2016-05-27 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardly any other discovery of the nineteenth century did have such an impact on science and technology as Wilhelm Conrad Röntgen’s seminal find of the X-rays. X-ray tubes soon made their way as excellent instruments for numerous applications in medicine, biology, materials science and testing, chemistry and public security. Developing new radiation sources with higher brilliance and much extended spectral range resulted in stunning developments like the electron synchrotron and electron storage ring and the freeelectron laser. This handbook highlights these developments in fifty chapters. The reader is given not only an inside view of exciting science areas but also of design concepts for the most advanced light sources. The theory of synchrotron radiation and of the freeelectron laser, design examples and the technology basis are presented. The handbook presents advanced concepts like seeding and harmonic generation, the booming field of Terahertz radiation sources and upcoming brilliant light sources driven by laser-plasma accelerators. The applications of the most advanced light sources and the advent of nanobeams and fully coherent x-rays allow experiments from which scientists in the past could not even dream. Examples are the diffraction with nanometer resolution, imaging with a full 3D reconstruction of the object from a diffraction pattern, measuring the disorder in liquids with high spatial and temporal resolution. The 20th century was dedicated to the development and improvement of synchrotron light sources with an ever ongoing increase of brilliance. With ultrahigh brilliance sources, the 21st century will be the century of x-ray lasers and their applications. Thus, we are already close to the dream of condensed matter and biophysics: imaging single (macro)molecules and measuring their dynamics on the femtosecond timescale to produce movies with atomic resolution.
Download or read book X Ray Optics written by Yuri Shvyd'ko and published by Springer. This book was released on 2013-11-11 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt: The use of x rays has moved in the forefront of science and technology in the second half of the 20th century. This progress has been greatly stimulated by the advent of synchrotron x-ray sources in the 1960s. The undulator-based synchrotron radiation sources which have appeared in the last decade of the 20th century gave a new impetus to such development. The brilliance of the x-ray sources has increased by 12 orders of magnitude in 40 years and this trend does not show any signs of stagnation. The future x-ray sources of the 21th century based on free-electron lasers driven by linear accelerators will provide sub-picosecond radiation pulses with by many orders of magnitude higher brilliance and full transverse coherence. The x-ray sources of the newest generation offer a possibility to realize more than ever before the great potential of x-ray optics and, as a consequence, to elaborate new sophisticated instrumentation with unprecedented resolution and eventually to move in new directions of research in x-ray technology, materials science, fundamental physics, life sciences, etc.
Download or read book X ray Scattering from Semiconductors written by Paul F. Fewster and published by World Scientific. This book was released on 2000 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.
Download or read book X ray Scattering written by Alicia Esther Ares and published by BoD – Books on Demand. This book was released on 2017-01-25 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.
Download or read book X Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Download or read book High Resolution X Ray Scattering from Thin Films and Multilayers written by Vaclav Holy and published by Springer. This book was released on 1998-12-11 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt: This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
Download or read book High Resolution X ray Scattering and Diffraction written by and published by . This book was released on 1983 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Basic Concepts of X Ray Diffraction written by Emil Zolotoyabko and published by John Wiley & Sons. This book was released on 2014-02-10 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
Download or read book Theoretical Concepts of X Ray Nanoscale Analysis written by Andrei Benediktovich and published by Springer Science & Business Media. This book was released on 2013-09-07 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
Download or read book X Ray Multiple Wave Diffraction written by Shih-Lin Chang and published by Springer Science & Business Media. This book was released on 2004-06-24 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. X-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in X-ray diffraction.
Download or read book Biological Small Angle Scattering Techniques Strategies and Tips written by Barnali Chaudhuri and published by Springer. This book was released on 2017-12-07 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a clear, comprehensible and up-to-date description of how Small Angle Scattering (SAS) can help structural biology researchers. SAS is an efficient technique that offers structural information on how biological macromolecules behave in solution. SAS provides distinct and complementary data for integrative structural biology approaches in combination with other widely used probes, such as X-ray crystallography, Nuclear magnetic resonance, Mass spectrometry and Cryo-electron Microscopy. The development of brilliant synchrotron small-angle X-ray scattering (SAXS) beam lines has increased the number of researchers interested in solution scattering. SAS is especially useful for studying conformational changes in proteins, highly flexible proteins, and intrinsically disordered proteins. Small-angle neutron scattering (SANS) with neutron contrast variation is ideally suited for studying multi-component assemblies as well as membrane proteins that are stabilized in surfactant micelles or vesicles. SAS is also used for studying dynamic processes of protein fibrillation in amyloid diseases, and pharmaceutical drug delivery. The combination with size-exclusion chromatography further increases the range of SAS applications. The book is written by leading experts in solution SAS methodologies. The principles and theoretical background of various SAS techniques are included, along with practical aspects that range from sample preparation to data presentation for publication. Topics covered include techniques for improving data quality and analysis, as well as different scientific applications of SAS. With abundant illustrations and practical tips, we hope the clear explanations of the principles and the reviews on the latest progresses will serve as a guide through all aspects of biological solution SAS. The scope of this book is particularly relevant for structural biology researchers who are new to SAS. Advanced users of the technique will find it helpful for exploring the diversity of solution SAS methods and applications. Chapter 3 of this book is available open access under a CC BY 4.0 license at link.springer.com.
Download or read book High Resolution X ray Scattering and Diffraction written by and published by . This book was released on 1983 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: In the general class of high resolution x-ray scattering studies experiments one analyzes the distribution of photon energies and wave vectors resulting from illumination of a sample with collimated monochromatic radiation. Applications abound in the field of structural physics, which may be described as the study of structures for their intrinsic physical interest. This includes studies of novel states of matter, phase transitions, and dynamics. As both the wave vector and the energy of scattered photons are of interest, one may conceptually divide high resolution experimental setups for this work into two classes: those with high Q-resolution (momemtum transfer analysis) and those with high E-resolution (energy transfer analysis). The former class is exemplified by the existing experimental station on SSRL wiggler experimental station VII-2 and the proposed high Q-resolution wiggler station for NSLS Phase II. The latter class is dependent on extremely high flux, as discussed more fully below, and the possibility of constructing a high E-resolution scattering station fed by an x-ray undulator is one of the exciting opportunities presented by the proposed construction of a 6 GeV storage ring.
Download or read book Medical Imaging Systems written by Andreas Maier and published by Springer. This book was released on 2018-08-02 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
