Download or read book Fourteenth IEEE VLSI Test Symposium written by and published by IEEE Computer Society. This book was released on 1996-01-01 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on
Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Download or read book 2023 IEEE 41st VLSI Test Symposium VTS written by and published by . This book was released on 2023 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2004 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 2017 IEEE 35th VLSI Test Symposium VTS written by IEEE Staff and published by . This book was released on 2017-04-09 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems
Download or read book VLSI Design 2001 Fourteenth International Conference on VLSI Design written by VLSI Society of India and published by . This book was released on 2001 with total page 596 pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Conference on VLSI Design was started in 1985 as a workshop and from this start has grown into an international conference on VLSI design. The proceedings are dedicated to all aspects of integrated circuit design, technology, and related computer-aided design (CAD).
Download or read book 2018 IEEE 36th VLSI Test Symposium VTS written by IEEE Staff and published by . This book was released on 2018-04-22 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems
Download or read book 2023 IEEE 41st VLSI Test Symposium VTS written by IEEE Staff and published by . This book was released on 2023-04-24 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems, the aim of this conference is to provide an international forum for these experts to promote, share, and discuss various issues and developments in the growing filed of VLSI Test
Download or read book 14th IEEE VLSI Test Symposium written by and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design Automation and Test in Europe written by Rudy Lauwereins and published by Springer Science & Business Media. This book was released on 2008-01-08 with total page 499 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
Download or read book 2016 IEEE 34th VLSI Test Symposium VTS written by IEEE Staff and published by . This book was released on 2016-04-25 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug, and repair of microelectronic circuits and systems
Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Download or read book Multi run Memory Tests for Pattern Sensitive Faults written by Ireneusz Mrozek and published by Springer. This book was released on 2018-07-06 with total page 135 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Download or read book Dependable Multicore Architectures at Nanoscale written by Marco Ottavi and published by Springer. This book was released on 2017-08-28 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
Download or read book Field Programmable Logic and Applications The Roadmap to Reconfigurable Computing written by Reiner W. Hartenstein and published by Springer. This book was released on 2003-06-29 with total page 872 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the proceedings volume of the 10th International Conference on Field Programmable Logic and its Applications (FPL), held August 27 30, 2000 in Villach, Austria, which covered areas like reconfigurable logic (RL), reconfigurable computing (RC), and its applications, and all other aspects. Its subtitle "The Roadmap to Reconfigurable Computing" reminds us, that we are currently witnessing the runaway of a breakthrough. The annual FPL series is the eldest international conference in the world covering configware and all its aspects. It was founded 1991 at Oxford University (UK) and is 2 years older than its two most important competitors usually taking place at Monterey and Napa. FPL has been held at Oxford, Vienna, Prague, Darmstadt, London, Tallinn, and Glasgow (also see: http://www. fpl. uni kl. de/FPL/). The New Case for Reconfigurable Platforms: Converging Media. Indicated by palmtops, smart mobile phones, many other portables, and consumer electronics, media such as voice, sound, video, TV, wireless, cable, telephone, and Internet continue to converge. This creates new opportunities and even necessities for reconfigurable platform usage. The new converged media require high volume, flexible, multi purpose, multi standard, low power products adaptable to support evolving standards, emerging new standards, field upgrades, bug fixes, and, to meet the needs of a growing number of different kinds of services offered to zillions of individual subscribers preferring different media mixes.
