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Book Fault Diagnosis of Digital Circuits

Download or read book Fault Diagnosis of Digital Circuits written by V. N. Yarmolik and published by John Wiley & Sons. This book was released on 1990 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.

Book Spectral Techniques and Fault Detection

Download or read book Spectral Techniques and Fault Detection written by Marg Karpovsky and published by Elsevier. This book was released on 2012-12-02 with total page 619 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.

Book VLSI Testing

    Book Details:
  • Author : Stanley Leonard Hurst
  • Publisher : IET
  • Release : 1998
  • ISBN : 9780852969014
  • Pages : 560 pages

Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR

Book Digital Circuit Testing

Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Book Testing and Diagnosis of VLSI and ULSI

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Book Digital Circuit Testing and Testability

Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.

Book Masters Theses in the Pure and Applied Sciences

Download or read book Masters Theses in the Pure and Applied Sciences written by Wade H. Shafer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt: Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thougtit that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volumes were handled by an interna tional publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 31 (thesis year 1986) a total of 11 ,480 theses titles trom 24 Canadian and 182 United States universities. We are sure that this broader base tor these titles reported will greatly enhance the value ot this important annual reterence work. While Volume 31 reports theses submitted in 1986, on occasion, certain univer sities do re port theses submitted in previousyears but not reported at the time.

Book Random Testing of Digital Circuits

Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-25 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

Book Advanced Automotive Fault Diagnosis

Download or read book Advanced Automotive Fault Diagnosis written by Tom Denton and published by Routledge. This book was released on 2016-07-07 with total page 365 pages. Available in PDF, EPUB and Kindle. Book excerpt: Learn all the skills you need to pass Level 3 and 4 Vehicle Diagnostic courses from IMI, City and Guilds and BTEC, as well as higher levels, ASE, AUR and other qualifications. Advanced Automotive Fault Diagnosis explains the fundamentals of vehicle systems and components and examines diagnostic principles as well as the latest techniques employed in effective vehicle maintenance and repair. Diagnostics, or fault finding, is an essential part of an automotive technician's work, and as automotive systems become increasingly complex there is a greater need for good diagnostics skills. For students new to the subject, this book will help to develop these skills, but it will also assist experienced technicians to further improve their performance and keep up with recent industry developments. Checked and endorsed by the Institute of to him to ensure that it is ideal for both independent and tutor-based study Diagnostics case studies to help you put the principles covered into real-life context Useful margin features throughout, including definitions, key facts and 'safety first' considerations

Book VLSI and Hardware Implementations using Modern Machine Learning Methods

Download or read book VLSI and Hardware Implementations using Modern Machine Learning Methods written by Sandeep Saini and published by CRC Press. This book was released on 2021-12-31 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: Machine learning is a potential solution to resolve bottleneck issues in VLSI via optimizing tasks in the design process. This book aims to provide the latest machine-learning–based methods, algorithms, architectures, and frameworks designed for VLSI design. The focus is on digital, analog, and mixed-signal design techniques, device modeling, physical design, hardware implementation, testability, reconfigurable design, synthesis and verification, and related areas. Chapters include case studies as well as novel research ideas in the given field. Overall, the book provides practical implementations of VLSI design, IC design, and hardware realization using machine learning techniques. Features: Provides the details of state-of-the-art machine learning methods used in VLSI design Discusses hardware implementation and device modeling pertaining to machine learning algorithms Explores machine learning for various VLSI architectures and reconfigurable computing Illustrates the latest techniques for device size and feature optimization Highlights the latest case studies and reviews of the methods used for hardware implementation This book is aimed at researchers, professionals, and graduate students in VLSI, machine learning, electrical and electronic engineering, computer engineering, and hardware systems.

Book NBS Special Publication

Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 398 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book FTCS 6

Download or read book FTCS 6 written by and published by . This book was released on 1976 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Scientific and Technical Aerospace Reports

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Micro Electronics and Telecommunication Engineering

Download or read book Micro Electronics and Telecommunication Engineering written by Devendra Kumar Sharma and published by Springer Nature. This book was released on 2022-02-28 with total page 813 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book presents high-quality papers from the Fourth International Conference on Microelectronics and Telecommunication Engineering (ICMETE 2021). It discusses the latest technological trends and advances in major research areas such as microelectronics, wireless communications, optical communication, signal processing, image processing, big data, cloud computing, artificial intelligence and sensor network applications. This book includes the contributions of national and international scientists, researchers, and engineers from both academia and the industry. The contents of this volume will be useful to researchers, professionals, and students alike.

Book Hybrid and Advanced Compression Techniques for Medical Images

Download or read book Hybrid and Advanced Compression Techniques for Medical Images written by Rohit M. Thanki and published by Springer. This book was released on 2019-02-22 with total page 107 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces advanced and hybrid compression techniques specifically used for medical images. The book discusses conventional compression and compressive sensing (CS) theory based approaches that are designed and implemented using various image transforms, such as: Discrete Fourier Transform (DFT), Discrete Cosine Transform (DCT), Discrete Wavelet Transform (DWT), and Singular Value Decomposition (SVD) and greedy based recovery algorithm. The authors show how these techniques provide simulation results of various compression techniques for different types of medical images, such as MRI, CT, US, and x-ray images. Future research directions are provided for medical imaging science. The book will be a welcomed reference for engineers, clinicians, and research students working with medical image compression in the biomedical imaging field. Covers various algorithms for data compression and medical image compression; Provides simulation results of compression algorithms for different types of medical images; Provides study of compressive sensing theory for compression of medical images.

Book Electronics System Design Techniques for Safety Critical Applications

Download or read book Electronics System Design Techniques for Safety Critical Applications written by Luca Sterpone and published by Springer Science & Business Media. This book was released on 2008-10-10 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: What is exactly “Safety”? A safety system should be defined as a system that will not endanger human life or the environment. A safety-critical system requires utmost care in their specification and design in order to avoid possible errors in their implementation that should result in unexpected system’s behavior during his operating “life”. An inappropriate method could lead to loss of life, and will almost certainly result in financial penalties in the long run, whether because of loss of business or because the imposition of fines. Risks of this kind are usually managed with the methods and tools of the “safety engineering”. A life-critical system is designed to 9 lose less than one life per billion (10 ). Nowadays, computers are used at least an order of magnitude more in safety-critical applications compared to two decades ago. Increasingly electronic devices are being used in applications where their correct operation is vital to ensure the safety of the human life and the environment. These application ranging from the anti-lock braking systems (ABS) in automobiles, to the fly-by-wire aircrafts, to biomedical supports to the human care. Therefore, it is vital that electronic designers be aware of the safety implications of the systems they develop. State of the art electronic systems are increasingly adopting progr- mable devices for electronic applications on earthling system. In particular, the Field Programmable Gate Array (FPGA) devices are becoming very interesting due to their characteristics in terms of performance, dimensions and cost.

Book Digital System Test and Testable Design

Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.