Download or read book Simulation in the Design of Digital Electronic Systems written by John B. Gosling and published by Cambridge University Press. This book was released on 1993-10-29 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorithms for digital electronic system simulators, together with timing verification as well as structural limitations and problems.

Download or read book Introduction to IDDQ Testing written by S. Chakravarty and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

Download or read book Dissertation Abstracts International written by and published by . This book was released on 2008 with total page 1006 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings of the Estonian Academy of Sciences Engineering written by and published by . This book was released on 1995 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Dependable Computing EDCC 1 written by Klaus Echtle and published by Springer Science & Business Media. This book was released on 1994-09-21 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the proceedings of the First European Dependable Computing Conference (EDCC-1), held in Berlin, Germany, in October 1994. EDCC is the merger of two former European events on dependable computing. The volume comprises 34 refereed full papers selected from 106 submissions. The contributions address all current aspects of dependable computing and reflect the state of the art in dependable systems research and advanced applications; among the topics covered are hardware and software reliability, safety-critical and secure systems, fault-tolerance and detection, verification and validation, formal methods, hardware and software testing, and parallel and distributed systems.

Download or read book Qualitative Reasoning about Physical Systems written by Daniel G Bobrow and published by Elsevier. This book was released on 2012-12-02 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume brings together current work on qualitative reasoning. Its publication reflects the maturity of qualitative reasoning as a research area and the growing interest in problems of reasoning about physical systems.The papers present knowledge bases for a number of very different domains, including heat flow, transistors, and digital computation. A common theme of all these papers is explaining how physical systems work. An important shared criterion is that the behavioral description must be compositional, that is the description of a system's behavior must be derivable from the structure of the system.This material should be of interest to anyone concerned with automated reasoning about the real (physical) world.

Download or read book IBM Journal of Research and Development written by and published by . This book was released on 1999 with total page 958 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Computational Intelligence written by Kurosh Madani and published by Springer. This book was released on 2012-12-22 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: The present book includes a set of selected extended papers from the third International Joint Conference on Computational Intelligence (IJCCI 2011), held in Paris, France, from 24 to 26 October 2011. The conference was composed of three co-located conferences: The International Conference on Fuzzy Computation (ICFC), the International Conference on Evolutionary Computation (ICEC), and the International Conference on Neural Computation (ICNC). Recent progresses in scientific developments and applications in these three areas are reported in this book. IJCCI received 283 submissions, from 59 countries, in all continents. This book includes the revised and extended versions of a strict selection of the best papers presented at the conference.

Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-25 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.

Download or read book ISTFA 2012 written by ASM International and published by ASM International. This book was released on 2012 with total page 643 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Detection Supervision and Safety of Technical Processes 2006 written by Hong-Yue Zhang and published by Elsevier. This book was released on 2007-03-01 with total page 1576 pages. Available in PDF, EPUB and Kindle. Book excerpt: The safe and reliable operation of technical systems is of great significance for the protection of human life and health, the environment, and of the vested economic value. The correct functioning of those systems has a profound impact also on production cost and product quality. The early detection of faults is critical in avoiding performance degradation and damage to the machinery or human life. Accurate diagnosis then helps to make the right decisions on emergency actions and repairs. Fault detection and diagnosis (FDD) has developed into a major area of research, at the intersection of systems and control engineering, artificial intelligence, applied mathematics and statistics, and such application fields as chemical, electrical, mechanical and aerospace engineering. IFAC has recognized the significance of FDD by launching a triennial symposium series dedicated to the subject. The SAFEPROCESS Symposium is organized every three years since the first symposium held in Baden-Baden in 1991. SAFEPROCESS 2006, the 6th IFAC Symposium on Fault Detection, Supervision and Safety of Technical Processes was held in Beijing, PR China. The program included three plenary papers, two semi-plenary papers, two industrial talks by internationally recognized experts and 258 regular papers, which have been selected out of a total of 387 regular and invited papers submitted. * Discusses the developments and future challenges in all aspects of fault diagnosis and fault tolerant control * 8 invited and 36 contributed sessions included with a special session on the demonstration of process monitoring and diagnostic software tools

Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR

Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Extending the Reach of Self test Approaches in VLSI written by I̊smet Bayraktaroğlu and published by . This book was released on 2001 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Models in Hardware Testing written by Hans-Joachim Wunderlich and published by Springer Science & Business Media. This book was released on 2009-11-12 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.

Download or read book Knowledge Based System Diagnosis Supervision and Control written by S.G. Tzafestas and published by Springer Science & Business Media. This book was released on 2013-11-22 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is in the area of Systems Diagnosis. Supervision and Control that Knowledge-Based Techniques have had their most significant impact in recent years. In this volume. Spyros Tzafestas has ably put together the current state of the art of the application of Artificial Intelligence concepts to problems of Systems Diagnosis. All the authors in this edited work are distinguished internationally. recognized experts on various aspects of Artificial Intelligence and its applications. and the coverage of the field that they provide is both readable and authoritative. The sixteen chapters break down in a natural way into three broad categories i.e •• (a) introduction to the applications of Expert Systems in Engineering. (b) Knowledge-based systems architectures. models and techniques for fault diagnosis. supervision and real time control and finally. (c) applications and case studies in three specific 'areas. namely: Manufacturing. Chemical Processes and Communications Networks. The final chapter provides a com prehensive survey of the field with an extensive bibliography. The mix of original scientific articles. tutorial and survey papers makes this col lection a very timely and valuable addition to the literature in this important field. MADAN G. SINGH Professor of Information Engineering at U.M.I.S.T.