Download or read book NBS Technical Note written by and published by . This book was released on 1979-08 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Download or read book Spectral Techniques and Fault Detection written by Marg Karpovsky and published by Elsevier. This book was released on 2012-12-02 with total page 619 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.
Download or read book Testing and Reliable Design of CMOS Circuits written by Niraj K. Jha and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 239 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
Download or read book Large Scale Integration Digital Testing written by T. F. Leedy and published by . This book was released on 1979 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1981 with total page 1370 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-25 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book Design of Logic Systems written by DAVID PROTHEROE DOUGLAS LEWIN and published by Springer. This book was released on 2013-11-21 with total page 713 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Modern VLSI Design written by Wayne Wolf and published by Pearson Education. This book was released on 2002-01-14 with total page 703 pages. Available in PDF, EPUB and Kindle. Book excerpt: For Electrical Engineering and Computer Engineering courses that cover the design and technology of very large scale integrated (VLSI) circuits and systems. May also be used as a VLSI reference for professional VLSI design engineers, VLSI design managers, and VLSI CAD engineers. Modern VSLI Design provides a comprehensive “bottom-up” guide to the design of VSLI systems, from the physical design of circuits through system architecture with focus on the latest solution for system-on-chip (SOC) design. Because VSLI system designers face a variety of challenges that include high performance, interconnect delays, low power, low cost, and fast design turnaround time, successful designers must understand the entire design process. The Third Edition also provides a much more thorough discussion of hardware description languages, with introduction to both Verilog and VHDL. For that reason, this book presents the entire VSLI design process in a single volume.
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Download or read book Advances in Computers written by and published by Academic Press. This book was released on 1987-06-01 with total page 489 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Computers
Download or read book IEEE Intercon Conference Record written by and published by . This book was released on 1975 with total page 678 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliable Computer Systems written by Daniel P. Siewiorek and published by CRC Press. This book was released on 1998-12-15 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Download or read book Reliable Computer Systems written by Daniel Siewiorek and published by Digital Press. This book was released on 2014-06-28 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Download or read book Technical Information Indexes written by United States. Naval Air Systems Command and published by . This book was released on 1975 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:
