Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Silicon 1981 written by Howard R. Huff and published by . This book was released on 1981 with total page 1076 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1983 with total page 1368 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metallization Systems for Integrated Circuits written by Rosemary P. Beatty and published by . This book was released on 1970 with total page 34 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book AGARD Lecture Series written by North Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development and published by . This book was released on 1970 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NASA Technical Note written by and published by . This book was released on 1970 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability and Maintainability RAM Training written by Vincent R. Lalli and published by . This book was released on 2000 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme of this manual is failure physics - the study of how products, hardware, software, and systems fail and what can be done about it. The intent is to impart useful information, to extend the limits of production capability, and to assist in achieving low-cost reliable products. In a broader sense the manual should do more. It should underscore the urgent need for mature attitudes toward reliability. Five of the chapters were originally presented as a classroom course to over 1000 Martin Marietta engineers and technicians. Another four chapters and three appendixes have been added. We begin with a view of reliability from the years 1940 to 2000. Chapter 2 starts the training material with a review of mathematics and a description of what elements contribute to product failures. The remaining chapters elucidate basic reliability theory and the disciplines that allow us to control and eliminate failures.

Download or read book NASA Reference Publication written by and published by . This book was released on 1992 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Physics 1975 written by and published by . This book was released on 1975 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reference Manual for Telecommunications Engineering written by Roger L. Freeman and published by Wiley-Interscience. This book was released on 1985 with total page 1568 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advances in Electronics and Electron Physics written by and published by Academic Press. This book was released on 1972-01-31 with total page 357 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Electronics and Electron Physics

Download or read book Process and Device Modeling for Integrated Circuit Design written by F. van de Wiele and published by Springer. This book was released on 1977-11-30 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Advanced Study Institute on process and device modeling for integrated circuit design was held in Louvain-la-Neuve. Belgium on July 19-29. 1977 under the auspices of the Scientific Affairs Division of NATO. The Institute was organized by a scientific organizing committee consisting of Professor F. Van de Wiele of the Universite Catholique de Louvain. Professor W. L. Engl of the Technische Hochschule Aachen and Professor P. Jespers of the Universite Catholique de Louvain. This book represents the contributions of the lecturers at the Institute and the chapters present a concise treatment of a very timely subject. namely. process and device modeling for integrated circuit design. The organization of the book parallels the program at the Institute with an introd0ction ·comprised of a review of mo deling and basic semiconductor physics. This is followed by the chapters devoted to basic technologies. modeling of bipolar and MoS devices. The last chapter of the book presents the specific topic of process modeling. The subject matter of this book is suitable for a wide range of interests from the advanced student. through the practisihg physicist and engineer. to the research worker. Although a novice may find some difficulty with the mathematical development. he can acquire a perspective into the field of process and device modeling for integrated circuit design with this bDOk. Likewise. portions of this book may be used as a textbook since the chap ters are intructional and self-contained.

Download or read book Gaylor Technical Survey written by and published by . This book was released on 1972 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Screening Effectiveness written by Henry C. Rickers and published by . This book was released on 1978 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt: This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).

Download or read book Reliability Physics 1982 written by and published by . This book was released on 1982 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microelectronic Failure Analysis Desk Reference written by and published by ASM International. This book was released on 2001-01-01 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Download or read book Reliability Training written by Vincent R. Lalli and published by . This book was released on 1992 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: