Download or read book Expanded Beam Spectroscopic Ellipsometer for High Speed Mapping of Photovoltaic Materials written by Ambalanath Shan and published by . This book was released on 2017 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: As a result of recent advances in photovoltaics technology, renewable energy generated by the sun has become a viable alternative to traditional sources of energy. Photovoltaic modules composed of thin film solar cell devices offer several advantages over standard wafer based silicon modules, including high throughput automated production and reduced materials usage and cost. Spectroscopic ellipsometry (SE) is an important measurement tool capable of aiding high throughput manufacturing processes for thin films. SE is a non-destructive measurement technique well suited to measure and track parameters critical to photovoltaic device performance such as layer thicknesses, as well as optical and electrical properties of the layer components. This dissertation seeks to extend the application of SE via an expanded-beam method to large area photovoltaic modules while retaining the high measurement speeds of single spot measurements with collimated beams. The transition of ellipsometers as laboratory instruments to ones suitable for high throughput manufacturing lines poses unique challenges. The construction of a rotating compensator ellipsometer suitable for industrial applications is addressed with an emphasis on measurement speed. Schemes are evaluated to correct SE data for the inherent misalignments present in large area measurements of full-scale panels. In particular, consideration is given to the problems of oscillations due to compensator misalignment, effects of glass stress and overlap of reflected beams in through-the-glass measurements, and off-plane corrections due to large area substrate curvature. Expanded-beam SE was developed and applied for in situ, high-speed imaging/mapping analysis of spatial uniformity over large area multilayer coated substrates used in roll-to-roll thin film photovoltaics (PV). Slower speed instrumentation available for such analysis applies a 1D detector array for spectroscopic mapping and involves width-wise translation of SE optics over a conveyed substrate surface, measuring point-by-point in a time-consuming process. The expanded-beam instrument instead employs a 2D detector array with no moving optics, exploiting one array index for spectroscopy and the second array index for imaging across a line on a large area sample. Thus, the instrument enables imaging width-wise and mapping length-wise for evaluation of uniformity at the high linear substrate speeds required for real-time, in-situ, and inline analysis for roll-to-roll thin film PV. In this dissertation, the expanded beam technique is employed to study the components of a hydrogenated amorphous silicon (aSi:H) thin film photovoltaic device structure in the Ag/ZnO/n-i-p substrate configuration. The layers were deposited on a flexible substrate mounted on a roll-to-roll cassette. Ellipsometric measurements were performed using an expanded beam spectroscopic ellipsometer capable of simultaneously measuring 41 locations across the width of the substrate to form a line image. Layer thicknesses and optical property maps were constructed from sets of line images generated using ellipsometric analysis techniques. These techniques apply a best fit structural model for the film stack and pertinent optical models for the constituent layers of the device structure.
Download or read book Spectroscopic Ellipsometry for Photovoltaics written by Hiroyuki Fujiwara and published by Springer. This book was released on 2019-01-10 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
Download or read book Compendium of Surface and Interface Analysis written by The Surface Science Society of Japan and published by Springer. This book was released on 2018-02-19 with total page 807 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.
Download or read book Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and published by John Wiley & Sons. This book was released on 2007-09-27 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1984-02 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Download or read book Spectroscopic Ellipsometry for Photovoltaics written by Hiroyuki Fujiwara and published by Springer. This book was released on 2019-01-10 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Download or read book Infrared Spectroscopic Ellipsometry written by Arnulf Röseler and published by VCH. This book was released on 1990 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Characterization of Biomaterials written by Susmita Bose and published by Elsevier Inc. Chapters. This book was released on 2013-03-12 with total page 16 pages. Available in PDF, EPUB and Kindle. Book excerpt: This brief introductory chapter provides a broad overview of materials, biomaterials and the need to understand different techniques to characterize biomaterials. From this chapter, the reader can gain a perspective on how the rest of the topics in different chapters are divided to fully comprehend this inherently multidisciplinary field. Application of appropriate characterization tools can not only save time to fully evaluate different biomaterials, it can also make commercial biomedical devices safer. In the long run, safer biomedical devices can only reduce the pain and suffering of mankind, a dream that resonates with every biomedical researcher.
Download or read book Ellipsometry at the Nanoscale written by Maria Losurdo and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Download or read book Hyperbolic Metamaterials written by Igor I Smolyaninov and published by Morgan & Claypool Publishers. This book was released on 2018-03-23 with total page 119 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hyperbolic metamaterials were originally introduced to overcome the diffraction limit of optical imaging. Soon thereafter it was realized that hyperbolic metamaterials demonstrate a number of novel phenomena resulting from the broadband singular behavior of their density of photonic states. These novel phenomena and applications include super resolution imaging, new stealth technologies, enhanced quantum-electrodynamic effects, thermal hyperconductivity, superconductivity, and interesting gravitation theory analogs. Here I review typical material systems, which exhibit hyperbolic behavior and outline important new applications of hyperbolic metamaterials, such as imaging experiments with plasmonic hyperbolic metamaterials and novel VCSEL geometries, in which the Bragg mirrors may be engineered in such a way that they exhibit hyperbolic properties in the long wavelength infrared range, so that they may be used to efficiently remove excess heat from the laser cavity. I will also discuss potential applications of self-assembled photonic hypercrystals. This system bypasses 3D nanofabrication issues, which typically limit hyperbolic metamaterial applications. Photonic hypercrystals combine the most interesting features of hyperbolic metamaterials and photonic crystals.
Download or read book Silicon Heterojunction Solar Cells written by W.R. Fahrner and published by Trans Tech Publications Ltd. This book was released on 2006-08-15 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: The world of today must face up to two contradictory energy problems: on the one hand, there is the sharply growing consumer demand in countries such as China and India. On the other hand, natural resources are dwindling. Moreover, many of those countries which still possess substantial gas and oil supplies are politically unstable. As a result, renewable natural energy sources have received great attention. Among these, solar-cell technology is one of the most promising candidates. However, there still remains the problem of the manufacturing costs of such cells. Many attempts have been made to reduce the production costs of conventional solar cells (manufactured from monocrystalline silicon using diffusion methods) by instead using cheaper grades of silicon, and simpler pn-junction fabrication. That is the hero of this book; the heterojunction solar cell.
Download or read book Ellipsometry of Functional Organic Surfaces and Films written by Karsten Hinrichs and published by Springer Science & Business Media. This book was released on 2013-10-24 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Download or read book Electronic Properties of Materials written by Rolf E. Hummel and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 323 pages. Available in PDF, EPUB and Kindle. Book excerpt: The present book on electrical, optical, magnetic and thermal properties of materials is in many aspects different from other introductory texts in solid state physics. First of all, this book is written for engineers, particularly materials and electrical engineers who want to gain a fundamental under standing of semiconductor devices, magnetic materials, lasers, alloys, etc. Second, it stresses concepts rather than mathematical formalism, which should make the presentation relatively easy to understand. Thus, this book provides a thorough preparation for advanced texts, monographs, or special ized journal articles. Third, this book is not an encyclopedia. The selection oftopics is restricted to material which is considered to be essential and which can be covered in a 15-week semester course. For those professors who want to teach a two-semester course, supplemental topics can be found which deepen the understanding. (These sections are marked by an asterisk [*]. ) Fourth, the present text leaves the teaching of crystallography, X-ray diffrac tion, diffusion, lattice defects, etc. , to those courses which specialize in these subjects. As a rule, engineering students learn this material at the beginning of their upper division curriculum. The reader is, however, reminded of some of these topics whenever the need arises. Fifth, this book is distinctly divided into five self-contained parts which may be read independently.
Download or read book The Physics of Semiconductor Devices written by R. K. Sharma and published by Springer. This book was released on 2019-01-31 with total page 1299 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book disseminates the current knowledge of semiconductor physics and its applications across the scientific community. It is based on a biennial workshop that provides the participating research groups with a stimulating platform for interaction and collaboration with colleagues from the same scientific community. The book discusses the latest developments in the field of III-nitrides; materials & devices, compound semiconductors, VLSI technology, optoelectronics, sensors, photovoltaics, crystal growth, epitaxy and characterization, graphene and other 2D materials and organic semiconductors.
Download or read book Oxide Based Materials and Structures written by Rada Savkina and published by CRC Press. This book was released on 2020-05-07 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: Oxide-based materials and structures are becoming increasingly important in a wide range of practical fields including microelectronics, photonics, spintronics, power harvesting, and energy storage in addition to having environmental applications. This book provides readers with a review of the latest research and an overview of cutting-edge patents received in the field. It covers a wide range of materials, techniques, and approaches that will be of interest to both established and early-career scientists in nanoscience and nanotechnology, surface and material science, and bioscience and bioengineering in addition to graduate students in these areas. Features: Contains the latest research and developments in this exciting and emerging field Explores both the fundamentals and applications of the research Covers a wide range of materials, techniques, and approaches
Download or read book Lab on Fiber Technology written by Andrea Cusano and published by Springer. This book was released on 2014-07-29 with total page 377 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on a research field that is rapidly emerging as one of the most promising ones for the global optics and photonics community: the “lab-on-fiber” technology. Inspired by the well-established "lab on-a-chip" concept, this new technology essentially envisages novel and highly functionalized devices completely integrated into a single optical fiber for both communication and sensing applications. Based on the R&D experience of some of the world's leading authorities in the fields of optics, photonics, nanotechnology, and material science, this book provides a broad and accurate description of the main developments and achievements in the lab-on-fiber technology roadmap, also highlighting the new perspectives and challenges to be faced. This book is essential for scientists interested in the cutting-edge fiber optic technology, but also for graduate students.
