Download or read book ETUDE PAR DIFFRACTION DES RAYONS X SPECTOMETRIE RAMAN ELLIPSOMETRIE DIFFRACTION D ELECTRONS SOUS INCIDENCE RASANTE MICROSCOPIE ELECTRONIQUE A BALAYAGE DU SILICIUM DOPE AU PHOSPHORE PAR IMPLANTATION IONIQUE written by René BISARO and published by . This book was released on 1974 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: MODELE DE REPARTITION DU DESORDRE A TEMPERATURE AMBIANTE EN FONCTION DE L'ENERGIE D'IMPLANTATION. INFLUENCE DE L'HOMOGENEITE DE LA DOSE SUR LA DISTRIBUTION DU DESORDRE AU SEIN DU SILICIUM. EFFET DE PENOMBRE. DETERMINATION DES DOSES AMORPHISANTES. INFLUENCE DE LA DOSE, DE L'ENERGIE ET DU FLUX D'IONS IMPLANTES SUR LE DESORDRE. ETUDE DU RECUIT DES ZONES IMPLANTEES

Download or read book M thodes physiques d tude des min raux et des mat riaux solides written by Jean-Pierre Eberhart and published by . This book was released on 1976 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Analyse structurale et chimique des mat riaux written by Jean-Pierre Eberhart and published by Bordas Editions. This book was released on 1989 with total page 614 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 763 pages. Available in PDF, EPUB and Kindle. Book excerpt: This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.

Download or read book Electron Diffraction and Optical Diffraction Techniques written by B. E. P. Beeston and published by . This book was released on 1972 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book X ray and Electron Diffraction Studies in Materials Science written by David John Dyson and published by Routledge. This book was released on 2004 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is to addresses the requirements of the analyst working in a materials laboratory from a practical angle providing reference where necessary to more detailed work. It also shows the link between XRD and other analytical techniques with integral diffraction facilities. Some applications are briefly discussed to show what can be achieved; others to show what to look for and what to check. The provision of computing facilities, while having many benefits, can also lead to a false reliance in the output that they generate. The importance of the errors that can occur, how to handle them and the need to provide some measure of uncertainty to the customer are considered. It does not purport to be universal in its coverage.

Download or read book High Energy Electron Diffraction and Microscopy written by L.M. Peng and published by OUP Oxford. This book was released on 2011-04-07 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.

Download or read book Time resolved Electron and X ray Diffraction written by Peter M. Rentzepis and published by . This book was released on 1995 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Diffraction Techniques written by John Maxwell Cowley and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Etude par microscopie lectronique et diffraction des rayons X des configurations et densit s de dislocations des probabilit s et nergies de d fauts d empilement d alliages base de cuivre written by Daniel Rondot and published by . This book was released on 1970 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Diffraction written by Derek Louis Misell and published by . This book was released on 1987 with total page 287 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Three Dimensional X Ray Diffraction Microscopy written by Henning Friis Poulsen and published by Springer. This book was released on 2014-01-15 with total page 172 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Diffraction written by D. L. Misell and published by . This book was released on 1987 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

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Download or read book Diffraction X ray Optics written by A.I. Erko and published by CRC Press. This book was released on 1996 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction X-ray Optics provides a systematic description of the performance and mathematical properties of diffraction x-ray optical elements based upon artificially made microstructures. This description is presented both theoretically (using kinematic diffraction theory and classical optics) and experimentally (including details of the experimental verification of theoretical data). The microstructures which are considered include: plane zone plates, two and three dimensional gratings, multilayer mirrors and three dimensional Fresnel structures. The book also includes a detailed description of the main principles, technology and applications of both Bragg-Fresnel multilayer optics and x-ray Fourier optics. Special attention is paid to coherent phenomena in the x-ray region, x-ray holography and Bragg-Fresnel optics and with chapters covering absorption and refraction, planar diffraction, volume holography, fabrication techniques and microscopy this book will prove a useful sourcebook to both researchers and development engineers in the field.

Download or read book X ray Diffraction at Elevated Temperatures written by Deborah D. L. Chung and published by Wiley-VCH. This book was released on 1993 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: A textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR

Download or read book ETUDE DE SURFACES RECONSTRUITES ET D HETEROEPITAXIES PAR DIFFRACTION DES RAYONS X EN ULTRA VIDE SOUS INCIDENCE RASANTE GAAS 001 DE SI 001 JUSQU A L HETEROEPITAXIE GAAS SI written by NATHALIE.. JEDRECY and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: LA COMPREHENSION DES TRANSFORMATIONS POUVANT S'OPERER AUX SURFACES OU INTERFACES EST PARTICULIEREMENT IMPORTANTE POUR L'ELABORATION DES COMPOSANTS MICROELECTRONIQUES A PARTIR DE MATERIAUX SEMICONDUCTEURS. LE REARRANGEMENT DES ATOMES DES COUCHES SUPERFICIELLES SELON UNE STRUCTURE ORDONNEE, LE PLUS SOUVENT DIFFERENTE DE CELLE DU MATERIAU EN VOLUME, PEUT ETRE ETUDIE GRACE A LA DIFFRACTION DES RAYONS X SOUS INCIDENCE RASANTE, SUR LES BASES DE LA THEORIE CINEMATIQUE. LA MESURE DES INTENSITES DIFFRACTEES PAR UNE SURFACE N'EST CEPENDANT DEVENUE POSSIBLE QU'AVEC L'AVENEMENT DU RAYONNEMENT SYNCHROTRON. PAR AILLEURS, L'ENVIRONNEMENT ULTRA-VIDE IMPLIQUE DANS L'ETUDE DE LA PLUPART DES SURFACES A NECESSITE LA REALISATION DE DISPOSITIFS EXPERIMENTAUX, ASSOCIANT LES TECHNIQUES DE DIFFRACTION X A CELLES DE PREPARATION ET DE CARACTERISATION SOUS ULTRA-VIDE. LE COUPLAGE D'UN DIFFRACTOMETRE 4-CERCLES A UNE CHAMBRE DE PREPARATION PAR EPITAXIE DE JETS MOLECULAIRES A ETE REALISE A LURE (ORSAY). L'ANALYSE DE LA RECONSTRUCTION C(44) SUR GAAS(001) A CONFIRME LA CHIMISORPTION DE DIMERES D'ARSENIC SUR UNE TERMINAISON (001) AS, ET REVELE LA COEXISTENCE DE DOMAINES ORDONNES AVEC UNE MEME SYMETRIE MAIS DES ARRANGEMENTS ATOMIQUES DIFFERENTS, EXPLIQUANT LA STCHIOMETRIE VARIABLE SUR CETTE SURFACE. LA CONFORMATION ASYMETRIQUE DES DIMERES SUR LA SURFACE PROPRE (001) RECONSTRUITE 21 DU SILICIUM A PU ETRE ETABLIE, LE CARACTERE SYMETRIQUE DES DIMERES D'ARSENIC SUR AS/SI(001) 21 AYANT ETE VERIFIE. LA METHODE A AUSSI ETE UTILISEE POUR L'ETUDE IN-SITU DES STADES INITIAUX DE L'HETEROEPITAXIE DE GAAS SUR SI, PARTICULIEREMENT EN CE QUI CONCERNE L'EVOLUTION DE LA RELAXATION PLASTIQUE. UNE ACCOMMODATION NON ELASTIQUE DES ILOTS AU STADE DE LA NUCLEATION A ETE MISE EN EVIDENCE, AINSI QUE L'EXISTENCE D'UN GRADIENT DE PARAMETRE. LA CROISSANCE A PARTIR D'UN DEPOT INITIAL AMORPHE A AUSSI ETE ETUDIEE