Download or read book Electron Microscopy and Microanalysis of Metals written by J. A. Belk and published by . This book was released on 1968 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron microscopy and microanalysis of metals ed written by J. A. Belk and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scanning Electron Microscopy and X Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Download or read book Microstructural Characterisation of Metals and Alloys written by P. E. J. Flewitt and published by Ashgate Publishing. This book was released on 1986 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Microscopy and Microanalysis of Metals written by J. A. Belk and published by . This book was released on 1968 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scanning Electron Microscopy X Ray Microanalysis and Analytical Electron Microscopy written by Charles E. Lyman and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.
Download or read book Quantitative Microanalysis with High Spatial Resolution written by G. W. Lorimer and published by Ashgate Publishing. This book was released on 1981 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Transmission Electron Microscopy of Metals written by Gareth Thomas and published by . This book was released on 1962 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Microscopy and Microanalysis of Crystalline Materials written by J. A. Belk and published by . This book was released on 1979 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advanced Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
Download or read book Electron and Ion Microscopy and Microanalysis written by Lawrence E Murr and published by CRC Press. This book was released on 2018-10-08 with total page 856 pages. Available in PDF, EPUB and Kindle. Book excerpt: The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Download or read book Electron Microscopy and Analysis written by Peter J. Goodhew and published by . This book was released on 1975 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Microscopy in Mineralogy written by P.E. Champness and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Download or read book Electron and Ion Microscopy and Microanalysis written by Lawrence Eugene Murr and published by . This book was released on 1982 with total page 820 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book An Atlas of Metal Damage written by Lothar Engel and published by Prentice Hall. This book was released on 1981 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Combined Electron Microscope Electron Diffraction and Electron Microprobe Analysis of Identical Microstructures in the Debond Area of a Dissimilar Metal Joint written by L. G. Bostwick and published by . This book was released on 1971 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt:
