Download or read book Effects of Radiation Damage on Scientific Charge Coupled Devices microform written by Timothy D. Hardy and published by National Library of Canada = Bibliothèque nationale du Canada. This book was released on 1997 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Effects of Radiation Damage on Scientific Charge Coupled Devices written by Timothy D. Hardy and published by . This book was released on 1997 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Damage in Scientific Charge coupled Devices written by Niels Bassler and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Damage Effects in Charge Coupled Devices written by Mark Stanford Robbins and published by . This book was released on 1992 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Damage Effect in Charge Coupled Devices written by Mark Stanford Robbins and published by . This book was released on 1992 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Damage in Charge Coupled Devices written by David Ryan Smith and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by CRC Press. This book was released on 2018-09-03 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.

Download or read book Radiation Effects on Charge Coupled Devices and Other MOS Structures written by Joseph R. Srour and published by . This book was released on 1978 with total page 179 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes results of radiation effects studies on charge-coupled devices (CCDs) and other MOS structures. Emphasis is placed on determining the basic mechanisms of the interaction of radiation with such devices with a view toward gaining understanding of benefit to developers of radiation-tolerant devices. A study of neutron damage mechanisms in CCDs was performed with emphasis placed on investigation of dark current increases.

Download or read book Radiation Damage in Optical Charge Coupled Devices written by and published by . This book was released on 1996 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ionising Radiation Induced Surface Effects in Charge Coupled Devices written by Roy Thierry and published by . This book was released on 1993 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and published by World Scientific. This book was released on 2004-07-29 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Download or read book Ionising Radiation Induced Surface Effects in Charged Coupled Devices written by Thiery Jacques Roy and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron and Neutron Radiation Damage Effects on a Two phase CCD written by K. D. Stefanov and published by . This book was released on 1999 with total page 27 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Investigation of the Basic Mechanisms of Radiation Effects on Semiconductor Devices Used in Electro Optical Sensor Applications written by and published by . This book was released on 1979 with total page 147 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes results of an investigation of radiation effects on semiconductor devices used in electro-optical sensor applications. Emphasis is placed on determining the basic mechanisms of the interaction of radiation with such devices with a view toward gaining understanding of benefit to developers of radiation-tolerant devices. A study of ionizing radiation effects on silicon MOS devices was performed at temperatures ranging from 4 to 77 degrees K. Charge buildup in the SiO2 layer was observed to be identical at 4 and 77 degrees K after a steady-state exposure to ionizing radiation, which indicates that electron trapping is not important at 4 degrees K. Results at both temperatures can be accounted for quite well in terms of hole trapping and hole transport. An investigation of the basic mechanisms of radiation effects on extrinsic silicon detector material was initiated. Carrier removal produced by neutron bombardment of such material was studied and it was found that the introduction rate of compensating defects depends strongly on the depth within the forbidden gap of the intentional dopant level. A detailed study of radiation effects on charge-coupled devices was performed, with emphasis placed on examining changes in dark current density produced by bombardment with neutrons and with ionizing radiation. The rate of increase in dark current density was found to be very similar for neutron-irradiated buried-channel CCDs obtained from two sources. Results of short-term annealing measurements on CCDs following pulsed neutron bombardment are also presented. A damage coefficient appropriate for describing the introduction of damage in silicon depletion regions was experimentally determined.

Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by . This book was released on 2018 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories-static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 956 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Radiation Detectors written by Gerhard Lutz and published by Springer. This book was released on 2007-06-15 with total page 351 pages. Available in PDF, EPUB and Kindle. Book excerpt: Starting from basic principles, this book describes the rapidly growing field of modern semiconductor detectors used for energy and position measurement radiation. The author, whose own contributions to these developments have been significant, explains the working principles of semiconductor radiation detectors in an intuitive way. Broad coverage is also given to electronic signal readout and to the subject of radiation damage.