Download or read book Design of Robustly Testable Combinational Logic Circuits written by International Business Machines Corporation. Research Division and published by . This book was released on 1990 with total page 43 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Design of Multi output CMOS Combinational Logic Circuits for Robust Testability written by International Business Machines Corporation. Research Division and published by . This book was released on 1988 with total page 23 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Testing and Reliable Design of CMOS Circuits written by Niraj K. Jha and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 239 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.

Download or read book Design of Testable Logic Circuits written by R. G. Bennetts and published by . This book was released on 1984 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Synthesis and Optimization Procedures for Robustly Delay fault Testable Combinational Logic Circuits written by Srinivas Devadas and published by . This book was released on 1990 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Best of ICCAD written by Andreas Kuehlmann and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 699 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 2002, the International Conference on Computer Aided Design (ICCAD) celebrates its 20th anniversary. This book commemorates contributions made by ICCAD to the broad field of design automation during that time. The foundation of ICCAD in 1982 coincided with the growth of Large Scale Integration. The sharply increased functionality of board-level circuits led to a major demand for more powerful Electronic Design Automation (EDA) tools. At the same time, LSI grew quickly and advanced circuit integration became widely avail able. This, in turn, required new tools, using sophisticated modeling, analysis and optimization algorithms in order to manage the evermore complex design processes. Not surprisingly, during the same period, a number of start-up com panies began to commercialize EDA solutions, complementing various existing in-house efforts. The overall increased interest in Design Automation (DA) re quired a new forum for the emerging community of EDA professionals; one which would be focused on the publication of high-quality research results and provide a structure for the exchange of ideas on a broad scale. Many of the original ICCAD volunteers were also members of CANDE (Computer-Aided Network Design), a workshop of the IEEE Circuits and Sys tem Society. In fact, it was at a CANDE workshop that Bill McCalla suggested the creation of a conference for the EDA professional. (Bill later developed the name).

Download or read book Switching and Finite Automata Theory written by Zvi Kohavi and published by Cambridge University Press. This book was released on 2010 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understand the structure, behavior, and limitations of logic machines with this thoroughly updated third edition. Many new topics are included, such as CMOS gates, logic synthesis, logic design for emerging nanotechnologies, digital system testing, and asynchronous circuit design, to bring students up-to-speed with modern developments. The intuitive examples and minimal formalism of the previous edition are retained, giving students a text that is logical and easy to follow, yet rigorous. Kohavi and Jha begin with the basics, and then cover combinational logic design and testing, before moving on to more advanced topics in finite-state machine design and testing. Theory is made easier to understand with 200 illustrative examples, and students can test their understanding with over 350 end-of-chapter review questions.

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Morgan & Claypool Publishers. This book was released on 2009 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Download or read book On Designing Robust Testable CMOS Combinational Circuits written by Bidyut Gupta and published by . This book was released on 1988 with total page 50 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "The potential of two pattern tests for detecting stuck-open faults in CMOS combinational circuits has been studied from a functional point of view. Two methods of testable realizations avoiding the problem are presented. A new type of two-level testable realization is proposed in which both stuck-open and stuck-short faults can be detected. In both methods, valid test patterns are applied at the inputs and the logic responses are observed at the output. Finally, multilevel realizations of combinational functions have been considered in which all stuck-short faults are three-pattern testable and all stuck-open faults are two-pattern testable."

Download or read book Logic Design Principles written by Edward J. McCluskey and published by Prentice Hall. This book was released on 1986 with total page 586 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Computer Systems and Software Engineering written by Patrick DeWilde and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computer Systems and Software Engineering is a compilation of sixteen state-of-the-art lectures and keynote speeches given at the COMPEURO '92 conference. The contributions are from leading researchers, each of whom gives a new insight into subjects ranging from hardware design through parallelism to computer applications. The pragmatic flavour of the contributions makes the book a valuable asset for both researchers and designers alike. The book covers the following subjects: Hardware Design: memory technology, logic design, algorithms and architecture; Parallel Processing: programming, cellular neural networks and load balancing; Software Engineering: machine learning, logic programming and program correctness; Visualization: the graphical computer interface.

Download or read book FTCS 22 written by and published by . This book was released on 1992 with total page 564 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Download or read book Necessary and Sufficient Conditions for Robust Delay fault Testability of Combinational Logic Circuits written by Srinivas Devadas and published by . This book was released on 1990 with total page 20 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Simulation in the Design of Digital Electronic Systems written by John B. Gosling and published by Cambridge University Press. This book was released on 1993-10-29 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorithms for digital electronic system simulators, together with timing verification as well as structural limitations and problems.

Download or read book Digest of Technical Papers written by and published by . This book was released on 1988 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt: