Download or read book Design methodology for cost effective internal error detection written by Sanjay Ramnath and published by . This book was released on 2000 with total page 54 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Cost effective Approach for Concurrent Error Detection Based on the Parity of Outputs and Internal Nodes written by Sung-Eun Byun and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Technical Report written by and published by . This book was released on 1979 with total page 862 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Cost Effective Error Detection for SoC Validation and Online Testing written by Ming Gao and published by . This book was released on 2012 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: Error detection is the vital component of the quality assurance tasks during the life time of an integrated circuit to avoid costly in-field failures and massive product recall. Nevertheless, sufficiently thorough error checking requires the development of high quality tests and on-chip checkers that can themselves be very expensive. How to detect all the errors while minimizing the cost remains one of the most challenging and critical questions for the semiconductor research community. This dissertation attempts to address this issue by proposing several cost effective error detection techniques targeting the stages of post-silicon validation and online testing. First, a time-multiplexed checking scheme is proposed to accommodate on-chip hardware checkers with low overhead. The same hardware resource for checker implementation can be used as a design-for-debug (DfD) structure for post-silicon debugging and later reused as a design-for-testability (DfT) resource during online testing. Case studies and mathematical analyses demonstrates the schemes provide high error coverage and a significant reduction in chip area and power overhead for on-chip checkers at the cost of increased fault detection latency. Second, a series of test evaluation metrics are proposed based on error models of electrical bugs and data mining based fault-model-free approach. Experimental results demonstrate that the intelligent navigation of validation test plan based on relevant bug model or knowledge mined from post-silicon test data can prioritize those tests capable of uncovering more silicon timing errors, resulting in significant reduction of validation time and effort.
Download or read book Computer Arithmetic written by Earl E Swartzlander and published by World Scientific. This book was released on 2015-03-17 with total page 486 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the new edition of the classic book Computer Arithmetic in three volumes published originally in 1990 by IEEE Computer Society Press. As in the original, the book contains many classic papers treating advanced concepts in computer arithmetic, which is very suitable as stand-alone textbooks or complementary materials to textbooks on computer arithmetic for graduate students and research professionals interested in the field. Told in the words of the initial developers, this book conveys the excitement of the creators, and the implementations provide insight into the details necessary to realize real chips. This second volume presents topics on error tolerant arithmetic, digit on-line arithmetic, number systems, and now in this new edition, a topic on implementations of arithmetic operations, all wrapped with an updated overview and a new introduction for each chapter. This volume is part of a 3 volume set: Computer Arithmetic Volume I Computer Arithmetic Volume II Computer Arithmetic Volume III The full set is available for sale in a print-only version. Contents:Error Tolerant ArithmeticOn-Line ArithmeticVLSI Adder ImplementationsVLSI Multiplier ImplementationsFloating-Point VLSI ChipsNumber RepresentationImplementations Readership: Graduate students and research professionals interested in computer arithmetic. Key Features:It reprints the classic papersIt covers advanced arithmetic operationsIt does this in the words of the original creatorsKeywords:Computer Arithmetic;Fault Tolerant;Arithmetic;On-Line Arithmetic;Adder Implementations;Multiplier Implementations;Floating Point Chips;Number Representation;Implementations
Download or read book Introduction to Precision Machine Design and Error Assessment written by Samir Mekid and published by CRC Press. This book was released on 2008-12-23 with total page 373 pages. Available in PDF, EPUB and Kindle. Book excerpt: While ultra-precision machines are now achieving sub-nanometer accuracy, unique challenges continue to arise due to their tight specifications. Written to meet the growing needs of mechanical engineers and other professionals to understand these specialized design process issues, Introduction to Precision Machine Design and Error Assessment places
Download or read book Individual Latent Error Detection I LED written by Justin R.E. Saward and published by CRC Press. This book was released on 2018-12-07 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt: Undetected human error in aircraft maintenance creates a latent error condition that can contribute to undesirable outcomes. Individual Latent Error Detection (I-LED) acts as an additional system safety control that helps an engineer recall past errors through environmental cues. This book addresses a gap in the human factors research and current safety strategies by exploring the nature and extent of I-LED and its benefit to safety resilience. The book will describe the I-LED concept using a systems perspective and propose practical interventions to be integrated within existing safety systems as an additional control to enhance resilience against human performance variability. Provides a new view of total safety based on enhanced resilience provided through the integration of I-LED interventions within existing safety systems Offers an in-depth exploration of the phenomenon of spontaneous recall of past event, leading to error detection and recovery of latent error conditions Discusses the application of Human Factors methods to conduct real-world observations in maintenance environments Describes the application of the systems view of human error to applied research Presents cost versus benefit analysis of safety interventions targeting latent error conditions
Download or read book Advanced Simulation and Test Methodologies for VLSI Design written by G. Russell and published by Springer Science & Business Media. This book was released on 1989-02-28 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Dependable Computing EDCC 2005 written by Mario Dal Cin and published by Springer Science & Business Media. This book was released on 2005-04-13 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 5th European Dependable Computing Conference, EDCC 2005, held in Budapest, Hungary in April 2005. The 21 revised full papers, 5 revised practical experience reports, and 4 prototype description papers presented together with the abstract of a keynote and 2 fast-track papers were carefully reviewed and selected from 90 submissions. The papers are organized in topical sections on distributed algorithms, fault-tolerant design and procotols, practical experience reports and tools, assessment and analysis, measurement, hardware verification, dependable networking, and reliability engineering and testing.
Download or read book Research Report written by and published by . This book was released on 1980 with total page 862 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design for Trustworthy Software written by Bijay K. Jayaswal and published by Pearson Education. This book was released on 2006-08-31 with total page 851 pages. Available in PDF, EPUB and Kindle. Book excerpt: ASQ 2007 CROSBY MEDAL WINNER! An Integrated Technology for Delivering Better Software—Cheaper and Faster! This book presents an integrated technology, Design for Trustworthy Software (DFTS), to address software quality issues upstream such that the goal of software quality becomes that of preventing bugs in implementation rather than finding and eliminating them during and after implementation. The thrust of the technology is that major quality deployments take place before a single line of code is written! This customer-oriented integrated technology can help deliver breakthrough results in cost, quality, and delivery schedule thus meeting and exceeding customer expectations. The authors describe the principles behind the technology as well as their applications to actual software design problems. They present illustrative case studies covering various aspects of DFTS technology including CoSQ, AHP, TRIZ, FMEA, QFD, and Taguchi Methods and provide ample questions and exercises to test the readers understanding of the material in addition to detailed examples of the applications of the technology. The book can be used to impart organization-wide learning including training for DFTS Black Belts and Master Black Belts. It helps you gain rapid mastery, so you can deploy DFTS Technology quickly and successfully. Learn how to • Plan, build, maintain, and improve your trustworthy software development system • Adapt best practices of quality, leadership, learning, and management for the unique software development milieu • Listen to the customer’s voice, then guide user expectations to realizable, reliable software products • Refocus on customer-centered issues such as reliability, dependability, availability, and upgradeability • Encourage greater design creativity and innovation • Validate, verify, test, evaluate, integrate, and maintain software for trustworthiness • Analyze the financial impact of software quality • Prepare your leadership and infrastructure for DFTS Design for Trustworthy Software will help you improve quality whether you develop in-house, outsource, consult, or provide support. It offers breakthrough solutions for the entire spectrum of software and quality professionals—from developers to project leaders, chief software architects to customers. The American Society for Quality (ASQ) is the world's leading authority on quality which provides a community that advances learning, quality improvement, and knowledge exchange to improve business results, and to create better workplaces and communities worldwide. The Crosby Medal is presented to the individual who has authored a distinguished book contributing significantly to the extension of the philosophy and application of the principles, methods, or techniques of quality management. Bijay K. Jayaswal, CEO of Agilenty Consulting Group, has held senior executive positions and consulted on quality and strategy for 25 years. His expertise includes value engineering, process improvement, and product development. He has directed MBA and Advanced Management programs, and helped to introduce enterprise-wide reengineering and Six Sigma initiatives. Dr. Peter C. Patton, Chairman of Agilenty Consulting Group, is Professor of Quantitative Methods and Computer Science at the University of St. Thomas. He served as CIO of the University of Pennsylvania and CTO at Lawson Software, and has been involved with software development since 1955.
Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1988 with total page 1092 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Journal of Research of the National Institute of Standards and Technology written by and published by . This book was released on 1988 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE Proceedings of the Southeastcon written by and published by . This book was released on 1986 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Improving Testing written by Rohit Ramaswamy and published by Routledge. This book was released on 2017-09-25 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: The primary purpose of this book is to demonstrate how proven quality assurance tools and methods that have been applied successfully in the manufacturing and service industries for the past 20 years can be applied in the testing industry. It defines what is meant by the term "quality" in testing and reviews how three business process concepts – standards, process planning and design, and continuous improvement – can be used to improve the way in which tests are designed, administered, scored and reported so that errors can be eliminated.
Download or read book Software Error Analysis written by Wendy W. Peng and published by Silicon Press. This book was released on 1994-10 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
