Download or read book Design and Development of Scanning Eddy Current Force Microscopy for Characterization of Electrical Magnetic and Ferroelectric Properties with Nanometer Resolution written by Vijayaraghava Nalladega and published by . This book was released on 2009 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: This dissertation describes the design and development of a new high-resolution electrical conductivity imaging technique combining the basic principles of eddy currents and atomic force microscopy (AFM). An electromagnetic coil is used to generate eddy currents in an electrically conducting material. The eddy currents induced in the sample are detected and measured with a magnetic tip attached to the AFM cantilever. The interaction of eddy currents with the magnetic tip-cantilever is theoretically modeled. The model is then used to estimate the eddy current forces generated in a typical metallic material placed in induced current field. The magnitude of the eddy current force is directly proportional to the electrical conductivity of the sample. The theoretical eddy current forces are used to design a magnetic tip-cantilever system with appropriate magnetic field and spring constant to facilitate the development of a high-resolution, high sensitivity electrical conductivity imaging technique. The technique is used to experimentally measure eddy current forces in metals of different conductivities and compared with theoretical and finite element models. The experimental results show that the technique is capable of measuring pN range eddy current forces. The experimental eddy current forces are used to determine the electrical resistivity of a thin copper wire and the experimental value agrees with the bulk resistivity of copper reported in literature. The imaging capabilities of the new technique are demonstrated by imaging the electrical conductivity variations in a composite sample and a dual-phase titanium alloy in lift mode AFM. The results indicate that this technique can be used to detect very small variations in electrical conductivity. The spatial resolution of the technique is determined to be about 25 nm by imaging carbon nanofibers reinforced in polymer matrix. Since AFM is extensively used to characterize nanomaterials, the newly developed technique is used to characterize metallic nanoparticles. The results showed for the first time that it is possible to image helicons in nanometallic particles at low electromagnetic frequencies using an AFM. The theoretical analysis of the helicons in nanostructured materials is presented using the concept of effective mass of electrons. The primary objective of the research work reported in this dissertation is to develop a high-resolution electrical conductivity imaging system. However, the interaction of induced currents with different materials gives rise to different interaction forces. If an appropriate probe and an imaging mode are used, different material properties can be characterized using the same experimental setup. Therefore, in this study, magneto-acoustic, magnetic and dielectric properties of materials placed in induced current fields are studied. The modifications necessary to image these properties are discussed in detail. The advantages, limitations and applications of the new methodology are discussed.

Download or read book Developing Advanced Atomic Force Microscopy Techniques for Probing Coupled Phenomena in Functional Materials written by Ehsan Nasr Esfahani and published by . This book was released on 2018 with total page 135 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last decades, nanotechnology has built great expectations because of its unique capabilities in engineering materials with tailored properties. Exhibiting enhanced physical and chemical properties at length scale on the order of 1{10 nm, nanostructured materials have contributed more than ever, ranging from energy generation, storage, and conversion with applications in lithium ion battery electrodes, solid oxide fuel cell electrodes, thermoelectric heat recovery, and perovoskite solar cells. Recent ndings suggest that the composition, structure, and properties of multifunctional materials are governed at nanoscale and are substantially dierent than of the bulk properties. While the chemical and phase composition of these materials can be mapped with atomic and sub-atomic resolution, the structural mappings do not provide signicant information on nanoscale physical properties. Indeed, there is still a lack of techniques that can eectively probe local phenomena and link the nanoscale properties to bulk performance and microstructure of material. Atomic Force Microscope (AFM) is a versatile tool for imaging, measurements, and manipulation of matter with nanometer spatial resolution and picometer detection accuracy. Over the last three decades, advanced AFM modes and functionalized probes were developed and employed in magnetic and ferroelectric studies, electrochemical characterizations, viscoelastic measurements, and quantum transport imaging. Despite the tremendous improvements in AFM platforms, functionalized probes, and imaging techniques, AFM measurements are not without challenges. For instance, the signal formation mechanism is complex and consists of several contributions. The resonance-enhanced techniques used for intrinsic characterization of functional materials are prone to topography and feedback crosstalks and often results in unreliable measurements. Obtaining quantitative measurements that can directly link to the probed physical phenomena is a non-trivial job. The rst goal of this dissertation was to develop advanced excitation, detection, and data analysis techniques that can measure nonlinear phenomena, resolve topographic and feedback cross-talks, and extract intrinsic properties. A multi-harmonic dual resonance tracking technique is implemented on a commercial AFM system, nonlinear resonance-enhanced AFM responses are obtained, and the intrinsic properties are determined and visualized. The other developed technique is an open-loop sequential excitation that performs a series of single frequency lock-in measurement. Finally, a method based on acquisition of highly sampled time domain AFM signals was developed and implemented. Multivariate statistical analysis, such as principal component analysis (PCA), is performed on AFM data to enhance signal-to-noise ratio and statistically relevant modes of the data. The rst few modes of the data contain relevant information while the rest of the modes only contain noise. The low-rank reconstructed data further analyzed via wavelet-based time-frequency analysis as well physics-based methods and intrinsic properties are revealed. The second part of the dissertation deals with novel AFM imaging modes on the foundation of excitation and detection schemes explained in the previous part. Currently, the state-of-the-art AFM imaging modes used to characterize ferroelectric and ionic and material systems are known as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). PFM and ESM are identical in implementation and are based on application of an alternating bias to the probe tip in contact with the material and measurement of the induced dynamic strain by AFM cantilever motion. It is virtually impossible to distinguish the ionic, ferroelectric, and electrostatic contributions while scanning a material. Scanning thermo-ionic microscopy (STIM) was proposed and developed by measuring the dynamic de ection induced by simultaneous oscillations of local hydrostatic stress and temperature at the probe tip. The probe tip is not charged and the signal formation originates from ionic diusion and does not consist of piezoelectric and electrostatic eects. The signal formation mechanism was examined on an ionically conductive sample Sm-doped ceria and not ionically conductive PTFE sample. STIM was implemented using two excitation methods: resistive heating and photo-thermal excitations. Having local control on nanoscale heat transfer, a method was introduced to quantitatively measure the thermal conductivity of the sample through a combination of experimental and numerical calibration studies. Thermal conductivity can be measured with good accuracy and high spatial resolution. The method was applied on a three-phase thermoelectric sample and is a powerful tool to optimize the conversion eciency of thermoelectric materials. The measurements in AFM are mostly indirect as the characterization techniques are based on measurements of surface displacements that are often not accurate. Recently developed charge gradient microscopy was also used to directly characterize ferroelectric surface charge kinetics, and domain and domain wall formations. The method is based on fast scanning with high contact forces using while the current between the tip and sample is measured. It is shown that the measured current signals are proportional to AFM speed and, as opposed to conventional PFM measurements, increasing the scan speed enhances the current signals. The origin of the method is further studied by obtaining temperaturedependent currents and performing PCA analysis to enhance the SNR. The measured current was used to calculate the collected charge and estimate the polarization coecient and surface charge density directly. Finally, the dissertation conclusion and future works for the continuation of this work are discussed in the last chapter.

Download or read book Scanning Nonlinear Dielectric Microscopy written by Yasuo Cho and published by Woodhead Publishing. This book was released on 2020-05-20 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. - Presents an in-depth look at the SNDM materials characterization technique by its inventor - Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices - Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Download or read book Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials written by Paula Maria Vilarinho and published by Springer Science & Business Media. This book was released on with total page 530 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scanning Force Microscopy written by and published by . This book was released on 1994 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variet.

Download or read book Scanning Tunneling Microscope and Atomic Force Microscopy written by Suchit Sharma and published by GRIN Verlag. This book was released on 2017-12-05 with total page 21 pages. Available in PDF, EPUB and Kindle. Book excerpt: Literature Review from the year 2015 in the subject Engineering - General, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical "touch" while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist’s lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations. The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide.

Download or read book Sub surface Characterization and Three Dimensional Profiling of Semiconductors by Magnetic Resonance Force Microscopy written by and published by . This book was released on 1996 with total page 10 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the final report of a two-year, Laboratory-Directed Research and Development (LDRD) project at the Los Alamos National Laboratory (LANL). The project successfully developed a magnetic resonance force microscope (MRFM) instrument to mechanically detect magnetic resonance signals. This technique provides an intrinsically subsurface, chemical-species-specific probe of structure, constituent density and other properties of materials. As in conventional magnetic resonance imaging (MRI), an applied magnetic field gradient selects a well defined volume of the sample for study. However mechanical detection allows much greater sensitivity, and this in turn allows the reduction of the size of the minimum resolvable volume. This requires building an instrument designed to achieve nanometer-scale resolution at buried semiconductor interfaces. High-resolution, three-dimensional depth profiling of semiconductors is critical in the development and fabrication of semiconductor devices. Currently, there is no capability for direct, high-resolution observation and characterization of dopant density, and other critical features of semiconductors. The successful development of MRFM in conjunction with modifications to improve resolution will enable for the first time detailed structural and electronic studies in doped semiconductors and multilayered nanoelectronic devices, greatly accelerating the current pace of research and development.

Download or read book Atomic Force Microscopy for Energy Research written by Cai Shen and published by CRC Press. This book was released on 2022-04-26 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM tools Enables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.

Download or read book Scanning Probe Microscopy For Energy Research Materials Devices And Applications written by Dawn Bonnell and published by World Scientific. This book was released on 2013-03-26 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Download or read book Atomic Force Microscopy Based Eddy Current Imaging and Characterization of Composite and Nanocomposite Materials Preprint written by and published by . This book was released on 2007 with total page 12 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic Force Microscope (AFM) based eddy current imaging technique has been used to characterize carbon fiber reinforced composites and carbon nanofibers nanocomposite. The surface topography and eddy current images of the same region of the sample acquired at the same time are presented. While the contrast in AFM images is due to surface topography variations, the contrast in the eddy current images is due to the local variation in the electrical conductivity of the sample. The results show that the combined techniques of AFM and eddy current imaging can be used effectively to investigate the distribution, dispersion of the carbon fibers in the polymer matrix and the fiber matrix interphase. An enhanced contrast at the interface between the fiber and the matrix has been observed in the eddy current images. The implications of the improved contrast in eddy current images and its application to investigation of fiber-matrix interface/interphase in carbon fiber polymer matrix composites is discussed.

Download or read book Thickness Scaling of Ferroelectricity in BiFeO3 By Tomographic Atomic Force Microscopy written by James Steffes and published by . This book was released on 2018 with total page 181 pages. Available in PDF, EPUB and Kindle. Book excerpt: Intrinsic and extrinsic properties of ferroelectric materials are known to have strong dependencies on electrical and mechanical boundary conditions, resulting in finite-size effects at length scales below several hundred nanometers. In ferroelectric thin films, equilibrium domain size is proportional to the square root of film thickness, which precludes the ability for current tomographic microscopies to accurately resolve complex domain morphologies in sub-micron films. Nanometer-scale three-dimensional imaging of spontaneous polarization is critical for understanding equilibrium states in polar materials, as well as for engineering devices based on such phenomena, however such capabilities remain a substantial experimental challenge. Tomographic atomic force microscopy (AFM) is presented as a novel experimental modality for three-dimensional ferroelectric property measurements with 20 nm spatial resolution. This dissertation presents the results of an investigation into the size-dependence of ferroelectricity in the room temperature multiferroic BiFeO3 across two decades of thickness to below 5 nm. Multiferroic BiFeO3 was chosen for this research due its technological relevance in low-power, electrically-switchable magnetic logic. Tomographic AFM provides unprecedented tomographic imaging capabilities of ferroelectric domains in BiFeO3 with a significant improvement in spatial resolution compared to existing tomographic microscopies capable of resolving ferroelectric domains. In addition to volumetric imaging, tomographic AFM is employed for direct, thickness-dependent measurements of the local spontaneous polarization and ferroelectric coercive field in BiFeO3. The thickness-resolved ferroelectric properties of BiFeO3 strongly correlate with cross-sectional TEM, Landau-Ginzburg-Devonshire phenomenological theory, and the semi-empirical Kay-Dunn scaling law for ferroelectric coercive fields. These results provide an unambiguous determination of a stable and switchable polar state in BiFeO3 to thicknesses below 5 nm. Electrically conductive, filamentary defects are found to exist at nonlinearities the ferroelectric domain structure of BiFeO3, and are shown to be localized to such defects throughout the entire thickness of the film, again to below 5 nm. A novel first principles-based model is derived for the electric field applied during tomographic AFM, allowing for direct confirmation of Schottky emission as the relevant mechanism of electrical conduction for filamentary, conductive defects in BiFeO3. Such findings demonstrate the accuracy and utility of tomographic AFM for nanoscale three-dimensional property measurements, thereby providing novel insight into finite-size effects in ferroelectric and multiferroic materials.

Download or read book Design and Development of Integrated Multi Modal Scanning Probe Microscopy for Structure Function Imaging of Ion Channels and Receptors written by Brian Richard Meckes and published by . This book was released on 2015 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understanding cellular behavior and tissue organization requires a deeper understanding of nanoscale structure and activity of proteins and biomacromolecules, including channels and receptors that act as messengers connecting the cell to its surrounding. Channels and receptors respond to a wide variety of electrical, chemical, and mechanical stimuli to facilitate cellular homeostasis, communication, migration, and survival. Ion channels facilitate the passage of ions and metabolites across cellular membranes and are visualized by high-resolution 3D imaging techniques, which include EM and scanning probe microscopies, such as atomic force microscopy (AFM) and scanning ion conductance microscopy (SICM). However, the current imaging techniques are unable to obtain the intertwined direct relationships between structure and electrical activity of ion channels. My work is dedicated to designing and implementing such an integrated system. This dissertation describes the details about different novel AFM-based nanotechnologies designed and developed for simultaneous structure-activity imaging of various electrically active biological systems. First, a novel AFM probe was developed by insulating tungsten micro-wires, which can measure electrical activity at the nanoscale. These probes, coated in gold, were used to image the structure of Escherichia coli that surface express mutants of the redox active enzyme, alcohol dehydrogenase II. Simultaneous structure-function imaging of the bacteria cells revealed improved electron transfer when mediators were placed closer to the NADH binding pocket. Second, a two-chamber system mimicking biological membranes (~5 nm thick) that enables the imaging of ion channel proteins in lipid membrane models was developed. The two chambers were separated by a 5 nm thick insulated graphene sheet deposited over a 1 [mu]m hole. A TEM was used to drill a ~20 nm pore. The substrate supports lipid membranes for measuring electrical activity. Third, AFM was used to image cell-surround communication channels (Connexin26 hemichannels) in purified membrane plaques as well as in reconstituted lipid membranes revealing channel clustering in high-resolution images. The electrical activity of these hemichannel preparations were then recorded when de- posited over the nanopore supports for initial simultaneous electrical recording and imaging. Lastly, the design and development of a parallel SICM-array capable of simultaneous multi-point high-throughput nanoscale imaging was realized.

Download or read book Magnetic Force Microscope Study on High anisotropy UMn2Ge2 and Construction of a Spin Polarized Scanning Tunneling Microscope written by Xinzhou Tan and published by . This book was released on 2017 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first part of this dissertation introduces the theoretical background for the Magnetic Force Microscope (MFM), the Spin Polarized Scanning Tunneling Microscope (SP-STM), and the theoretical basis for magnetic domains.The second part addresses issues on the design and construction of a low temperature magnetic force microscope (LT-MFM) and its operation. The third part focuses on the LT-MFM experimental investigation on ternary UMn2Ge2 crystals. The forth part describes the construction and implementation of a low temperature SP-STM system. Scanning probe microscopy (SPM), beginning with the invention of the STM, was first developed to study the electronic properties of different materials, such as imaging high T[subscript c] superconductors. But soon, as the SPM family expanded, some of them developed into powerful techniques to characterize magnetic features. This category includes MFM and SP-STM. The former was widely used for imaging surface magnetic properties from hundreds of micrometers down to the nanometer scale, ideal for imaging magnetic domains. With our homemade LT-MFM system, we studied UMn2Ge2 single crystals, in which both the Uranium and Manganese atoms are magnetic. Flower-like magnetic domain pattern were found at room temperature, and they persisted all the way down to low temperature. Around 150K, Uranium atom ordering was revealed in the form of magnetic domain wall jumps, by partially saturating the sample and warming it up in zero field. In addition, the underlying mechanism of the flower pattern was explained using the domain branching scheme. On the other hand, a Low temperature SP-STM (LT-SP-STM) was designed and constructed, paving the way for spin mapping at the atomic scale thus characterizing magnetic materials with ultra-resolution.

Download or read book Atomic Force Microscopy Based Electrical Characterization of Materials written by Alba Avila and published by CRC Press. This book was released on 2015-03-08 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: This timely book introduces the fundamental measurement concepts of the rapidly evolving atomic force microscopy (AFM) techniques for electrical characterization (EFM). It describes experimental approaches and setups, as well as challenges to overcome, and it also provides a wide range of real-world examples illustrating the method. This comprehensive guide for EFM techniques and their applications is an excellent reference for those working on microscopy in different fields, making the methods more accessible to a wider audience and enabling readers to explore the numerous possibilities of electrical techniques as research tools.

Download or read book Scanning Probe Microscopy written by Vijay Nalladega and published by IntechOpen. This book was released on 2012-04-27 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.

Download or read book Applications and Development of Acoustic and Microwave Atomic Force Microscopy for High Resolution Tomography Analysis written by Pauline Vitry and published by . This book was released on 2016 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is a powerful tool for the characterization of organic and inorganic materials of interest in physics, biology and metallurgy. However, conventional scanning probe microscopy techniques are limited to the probing surface properties, while the subsurface analysis remains difficult beyond nanoindentation methods. Thus, the present thesis is focused on two novel complementary scanning probe techniques for high-resolution volumetric investigation that were develop to tackle this persisting challenge in nanometrology. The first technique considered, called Mode Synthesizing Atomic Force Microscopy (MSAFM), has been exploited in collaboration with Dr. Laurene Tetard of University of Central Florida to explore the volume of materials with high spatial resolution by means of mechanical actuation of the tip and the sample with acoustic waves of frequencies in the MHz range. A comprehensive study of the impact of the frequency parameters on the performance of subsurface imaging has been conducted through the use of calibrated samples and led to the validation of a numerical model for quantitative interpretation. Furthermore, this non-invasive technique has been utilized to locate lipid vesicles inside bacteria (in collaboration with Pr. A. Dazzi and M.-J. Virolle of Université Paris Sud, Orsay). Furthermore, we have combined this ultrasonic approach with infra-red microscopy, to add chemical speciation aimed at identifying the subsurface features, which represents a great advance for volume and chemical characterization of biological samples. The second technique considered is the Scanning Microwave Microscopy, which was developed in collaboration with Keysight society. Similar to acoustic-based microscopy, this non-invasive technique provided physical and chemical characterizations based on the interaction of micro-waves radiations with the matter (with frequency ranging from 0.2 and 16 GHz). Particularly, for metallic samples we performed volumetric characterization based on the skin effect of the materials. On the other hand, we have used this technique to analyze the diffusion of light chemical elements in metals and measured the effect of changes in mechanical properties of materials on their conductivity.Overall, these results constitute a new line of research involving non-destructive subsurface high resolution analysis by means of the AFM of great potential for several fields of research.