Download or read book Design Analysis and Test of Logic Circuits Under Uncertainty written by Smita Krishnaswamy and published by Springer Science & Business Media. This book was released on 2012-09-21 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt: Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Download or read book Advanced Techniques in Logic Synthesis Optimizations and Applications written by Kanupriya Gulati and published by Springer Science & Business Media. This book was released on 2010-11-25 with total page 423 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers recent advances in the field of logic synthesis and design, including Boolean Matching, Logic Decomposition, Boolean satisfiability, Advanced Synthesis Techniques and Applications of Logic Design. All of these topics are valuable to CAD engineers working in Logic Design, Logic Optimization, and Verification. Engineers seeking opportunities for optimizing VLSI integrated circuits will find this book as an invaluable reference, since there is no existing book that covers this material in a systematic fashion.
Download or read book Analysis and Design of Resilient VLSI Circuits written by Rajesh Garg and published by Springer Science & Business Media. This book was released on 2009-10-22 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Morgan & Claypool Publishers. This book was released on 2009 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Download or read book Design of Testable Logic Circuits written by R. G. Bennetts and published by . This book was released on 1984 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits written by Sandeep K. Goel and published by CRC Press. This book was released on 2017-12-19 with total page 259 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Download or read book The Engineering Index Annual written by and published by . This book was released on 1988 with total page 2282 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1992 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Self Checking and Fault Tolerant Digital Design written by Parag K. Lala and published by Morgan Kaufmann. This book was released on 2001 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1974 with total page 1064 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Progress in Industrial Mathematics at ECMI 2000 written by Angelo M. Anile and published by Springer Science & Business Media. This book was released on 2002-03-26 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt: Realizing the need of interaction between universities and research groups in industry, the European Consortium for Mathematics in Industry (ECMI) was founded in 1986 by mathematicians from ten European universities. Since then it has been continuously extending and now it involves about all Euro pean countries. The aims of ECMI are • To promote the use of mathematical models in industry. • To educate industrial mathematicians to meet the growing demand for such experts. • To operate on a European Scale. Mathematics, as the language of the sciences, has always played an im portant role in technology, and now is applied also to a variety of problems in commerce and the environment. European industry is increasingly becoming dependent on high technology and the need for mathematical expertise in both research and development can only grow. These new demands on mathematics have stimulated academic interest in Industrial Mathematics and many mathematical groups world-wide are committed to interaction with industry as part of their research activities. ECMI was founded with the intention of offering its collective knowledge and expertise to European Industry. The experience of ECMI members is that similar technical problems are encountered by different companies in different countries. It is also true that the same mathematical expertise may often be used in differing industrial applications.
Download or read book Dissertation Abstracts International written by and published by . This book was released on 2007 with total page 924 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Logic Circuit Analysis and Design written by and published by . This book was released on 1995 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Energy Research Abstracts written by and published by . This book was released on 1979 with total page 1180 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design and Testing of Reversible Logic written by Ashutosh Kumar Singh and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation.
Download or read book ERDA Energy Research Abstracts written by United States. Energy Research and Development Administration and published by . This book was released on 1977 with total page 958 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book ERDA Energy Research Abstracts written by United States. Energy Research and Development Administration. Technical Information Center and published by . This book was released on 1977 with total page 1680 pages. Available in PDF, EPUB and Kindle. Book excerpt:
