Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by Routledge. This book was released on 2017-11-22 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by CRC Press. This book was released on 1998-01-01 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Donecker and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide."--Provided by publisher.

Download or read book Defect Recognition and Image Processing in Semiconductors and Devices Proceedings of the 5th INT Conference 6 10 September 1993 Santander Spain written by Juan Jiménez and published by CRC Press. This book was released on 1994-05-26 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fifth in this series of conferences was held in Santander, Spain from 6 to 10 September 1993, and was attended by workers from industry and research institutes worldwide. Device yield is a crucial factor for determining the choice of semiconducting material made by manufacturers, and that choice is based upon a knowledge of how defects might affect a particular substrate, epilayer or base material. The DRIP conference series was instigated to address the mapping of these technologically important defects. Topics covered at the meeting included silicon, and compound semiconductor substrates and epilayers. Methods for defect recognition included tunelling microscopy, inelastic light scattering (Raman), elastic light scattering, photoluminescence mapping, defect characterization, optical probe beams, and effects of defects on devices. The meeting focused in particular on the microscopic nature of as-grown defects: their distribution as a function of growth conditions, and their redistribution under subsequent heat treatments. The conference dealt with the increasing number and sophistication of visualization techniques which map physical properties of defects, and which may in future permit better control of defect engineering. Researchers in solid state or device physics, or electrical engineering will find this volume an invaluable, up to date reference on the latest techniques for the identification of defects, developments in their control, implications for device fabrication, and future directions for the analysis and mapping of semiconductors.

Download or read book Defect Recognition and Image Processing in Semiconductors 1995 written by A.R Mickelson and published by CRC Press. This book was released on 1996-05-30 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings provide an overview of research into defect inhomogeneities semiconductor materials and (as grown) devices. Defect inhomogeneities affect the performance of both as grown and processed semiconductors. A valuable overview of mapping and microscopy techniques for the study of such defects and an insight into the effect of such defects on device performance.

Download or read book Metal Halide Perovskites for Generation Manipulation and Detection of Light written by Juan P. Martínez-Pastor and published by Elsevier. This book was released on 2023-07-20 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metal Halide Perovskites for Generation, Manipulation and Detection of Light covers the current state and future prospects of lead halide perovskite photonics and photon sources, both from an academic and industrial point-of-view. Advances in metal halide perovskite photon sources (lasers) based on thin films, microcrystals and nanocrystals are comprehensively reviewed, with leading experts contributing current advances in theory, fundamental concepts, fabrication techniques, experiments and other important research innovations. This book is suitable for graduate students, researchers, scientists and engineers in academia and R&D in industry working in the disciplines of materials science and engineering. Includes comprehensive reviews from academic and industrial perspectives of current trends in the field of metal halide perovskite for photonics Provides an up-to-date look at the most recent and upcoming applications in metal halide perovskite photonics, such as; photodetectors, lighting, lasing, nonlinear photonics and quantum technologies Discusses future prospective trends and envisioned applications of metal halide perovskites, from near-UV to near-IR photonics

Download or read book Defect Recognition and Image Processing in III V Compounds written by J. P. Fillard and published by Elsevier Publishing Company. This book was released on 1985 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in III V Compounds II written by Eicke R. Weber and published by Elsevier Publishing Company. This book was released on 1987 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in III V Compounds written by International Symposium on Defect Recognition and Image Processing in III-V Compounds and published by . This book was released on 1985 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book American Book Publishing Record Cumulative 1998 written by R R Bowker Publishing and published by . This book was released on 1999-03 with total page 1312 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 2003 with total page 870 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The British National Bibliography written by Arthur James Wells and published by . This book was released on 1999 with total page 1778 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Zeitschrift F r Kristallographie written by and published by . This book was released on 1998 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Silicon Materials Science and Technology written by Howard R. Huff and published by . This book was released on 1998 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Diffusion and Defect Data written by and published by . This book was released on 2001 with total page 1444 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Special Defects in Semiconducting Materials written by Rajendra P. Agarwala and published by . This book was released on 2000 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the continuing evolution of fabrication techniques and new structures for semiconducting materials, the list of new defect phenomena has also increased apace. The present book discusses point defects, defect-assisted diffusion, metal impurity additions, metastable defects, magnetic hyperfine interaction of deep donors in compound semiconductors, and oxygen and hydrogen impurity defects.

Download or read book Surface Science Reports written by and published by . This book was released on 1999 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: