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Book Characterization of Microstructures by Analytical Electron Microscopy  AEM

Download or read book Characterization of Microstructures by Analytical Electron Microscopy AEM written by Yonghua Rong and published by Springer. This book was released on 2012-04-28 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

Book Microstructural Characterization of Materials

Download or read book Microstructural Characterization of Materials written by David Brandon and published by John Wiley & Sons. This book was released on 2013-03-21 with total page 517 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.

Book Microstructural Analysis

Download or read book Microstructural Analysis written by J. McCall and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: During recent years, people involved in developing new metals and materials for use in some of the rather extreme conditions of stress, temperature, and environment have relied heavily on the microstructural condition of their materials. In fact, many of the newer materials, such as dispersion-strengthened alloys, have been designed almost entirely by first determining the microstruc ture desired and then finding the right combination of composition, heat treatment, and mechanical working that will result in the de sired microstructure. Furthermore, the extremely high reliability required of materials used today, for example, in aerospace and nuclear energy systems, requires close control on the microstruc tural conditions of materials. This is clearly evident from even a cursory examination of recently written specifications for mate rials where rather precise microstructural parameters are stipu lated. Whereas specifications written several years ago may have included microstructural requirements for details such as ASTM grain size or graphite type, today's specifications are beginning to include such things as volume fraction of phases, mean free path of particles, and grain intercept distances. Rather arbitrary terms such as "medium pearlite" have been replaced by requirements such as "interlamella spacing not to exceed 0. 1 micron. " Finally, materials users have become increasingly aware that when a material does fail, the reason for its failure may be found by examining and "reading" its microstructure. The responsibility for a particular microstructure and a resulting failure is a matter of growing importance in current product liability consider ations.

Book Analytical Electron Microscopy for Materials Science

Download or read book Analytical Electron Microscopy for Materials Science written by DAISUKE Shindo and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Book Scanning Electron Microscopy  X Ray Microanalysis  and Analytical Electron Microscopy

Download or read book Scanning Electron Microscopy X Ray Microanalysis and Analytical Electron Microscopy written by Charles E. Lyman and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

Book Analytical Transmission Electron Microscopy in Steels from Microstructure Characterization to Phase Transformation Mechanisms

Download or read book Analytical Transmission Electron Microscopy in Steels from Microstructure Characterization to Phase Transformation Mechanisms written by Hongcai Wang and published by . This book was released on 2023 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Field Emission Scanning Electron Microscopy

Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Book Practical Analytical Electron Microscopy in Materials Science

Download or read book Practical Analytical Electron Microscopy in Materials Science written by David Bernard Williams and published by Wiley-VCH. This book was released on 1984 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Combined Electron Microscope  Electron Diffraction  and Electron Microprobe Analysis of Identical Microstructures in the Debond Area of a Dissimilar Metal Joint

Download or read book Combined Electron Microscope Electron Diffraction and Electron Microprobe Analysis of Identical Microstructures in the Debond Area of a Dissimilar Metal Joint written by L. G. Bostwick and published by . This book was released on 1971 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Electron Microscopy and Analysis 2001

Download or read book Electron Microscopy and Analysis 2001 written by M. Aindow and published by CRC Press. This book was released on 2001-12-01 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.

Book Ceramic Microstructures

Download or read book Ceramic Microstructures written by Antoni P. Tomsia and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 841 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume, titled Proceedings of the International Materials Symposium on Ce ramic Microstructures: Control at the Atomic Level summarizes the progress that has been achieved during the past decade in understanding and controlling microstructures in ceram ics. A particular emphasis of the symposium, and therefore of this volume, is advances in the characterization, understanding, and control of micro structures at the atomic or near-atomic level. This symposium is the fourth in a series of meetings, held every ten years, devoted to ceramic microstructures. The inaugural meeting took place in 1966, and focussed on the analysis, significance, and production of microstructure; the symposium emphasized the need for, and importance of characterization in achieving a more complete understanding of the physical and chemical characteristics of ceramics. A consensus emerged at that meeting on the critical importance of characterization in achieving a more complete understanding of ceramic properties. That point of view became widely accepted in the ensuing decade. The second meeting took place in 1976 at a time of world-wide energy shortages and thus emphasized energy-related applications of ceramics, and more specifically, microstructure-property relationships of those materials. The third meeting, held in 1986, was devoted to the role that interfaces played both during processing, and in influencing the ultimate properties of single and polyphase ceramics, and ceramic-metal systems.

Book High Resolution Imaging and Spectrometry of Materials

Download or read book High Resolution Imaging and Spectrometry of Materials written by Frank Ernst and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 454 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.

Book Energy Research Abstracts

Download or read book Energy Research Abstracts written by and published by . This book was released on 1993 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Special Issue on Characterization of Advanced Materials by High Resolution Electron Microscopy and Analytical Electron Microscopy

Download or read book Special Issue on Characterization of Advanced Materials by High Resolution Electron Microscopy and Analytical Electron Microscopy written by and published by . This book was released on 1990 with total page 665 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Advanced Techniques for Microstructural Characterization

Download or read book Advanced Techniques for Microstructural Characterization written by R. Krishnan and published by . This book was released on 1988 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: Coverage includes: metallic glasses; X-ray topography; auger spectroscopy; positron annihilation; and field ion microscopy.

Book Electron Microbeam Analysis

    Book Details:
  • Author : Abraham Boekestein
  • Publisher : Springer Science & Business Media
  • Release : 2012-12-06
  • ISBN : 3709166799
  • Pages : 271 pages

Download or read book Electron Microbeam Analysis written by Abraham Boekestein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by members from almost all European countries, in order to stimulate research, applications and development of all forms of microbeam methods. One of the most important activities EMAS is the organisation of biannual workshops for demonstrating the current status and developing trends of microbeam methods. For this meeting, EMAS chose to highlight the following topics: electron-beam microanalysis (EPMA) of thin films and quantitative analysis of ultra-light elements, Auger electron spectroscopy (AES), electron energy loss spec trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of research in Europe were duly represented, but a definite trend is discernible. EPMA with wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS) is the method with by far the widest range of applications, followed by TEM with EELS and then AES. There are also interesting suggestions for the further development of new appa ratus with new fields of application. Applications are heavily biased towards materials science (thin films in microelectronics and semicon ductors), ceramics and metallurgy, followed by analysis of biological and mineral samples.