Download or read book Automatic Test Pattern Generation for Synchronous Sequential Circuits written by Marinus Hendrik Konijnenburg and published by . This book was released on 1998 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Approach to Test Pattern Generation for Synchronous Sequential Circuits written by Robert Stewart Lewis and published by . This book was released on 1967 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Sequential Circuit Test Pattern Generation Using Empirical Partial Scan and Distributed Computation written by Kee Sup Kim and published by . This book was released on 1992 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Automatic Test Pattern Generation Technique for Sequential Circuits Using Scan Applications written by Venkat N. Koripalli and published by . This book was released on 2006 with total page 74 pages. Available in PDF, EPUB and Kindle. Book excerpt: The increase in speed and the shrinking of technology has led to modern day ICs becoming more sensitive to timing related defects. These defects must be rectified to prevent hazards in the circuit. The timing related defects can be identified with At-Speed Testing using the path delay fault model. A subset of the total number of paths known as critical paths cannot be sequentially activated i.e. we cannot find two successive vectors that activate a fault along the path. The elimination of untestable paths helps us to save a lot of time. In this report a new method, called the Launch-on-Shift is used to determine the testability of critical paths. The method uses a vector pair in which the first vector is the scan in steady state vector and the second vector is the function of the first vector.

Download or read book Test Generation and Test Application Time Reduction for Sequential Circuits written by Soo Y. Lee and published by . This book was released on 1994 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Automatic test pattern generation for hierarchical sequential circuits written by Heinrich Theodor Vierhaus and published by . This book was released on 1993 with total page 19 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Performance of a Parallel Automatic Test Pattern Generation System for Sequential Circuits written by Jessica L. Handy and published by . This book was released on 1997 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Modeling the Difficulty of Automatic Test Pattern Generation for Sequential Circuits written by Thomas E. Marchok and published by . This book was released on 1995 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "Several manufacturing challenges have accompanied the explosive growth in the scale of integration for VLSI circuits. One of these is the increased difficulty of generating manufacturing test sets, which has resulted from the vast increase in the ratio of the number of transistors to the number of I/O pins. The difficulty of test generation is crucial since it impacts both the resultant product quality and time to market, both of which continue to gain importance in the present day semiconductor industry. Design for testability (DFT) techniques can be used to offset this difficulty. The mechanics of such techniques are well understood. DFT techniques are also known to increase other manufacturing costs and to decrease performance. Thus the relevant issue facing designers is not how to use DFT, but rather if such techniques should be applied. The correct decision is a matter of economics. Integrated circuit (IC) designers must balance manufacturing costs, performance, time to market, and product quality concerns. Achieving the desired balance requires the ability to quantify trade-offs in the different manufacturing costs which various DFT techniques would affect. Unfortunately, test generation cost is among the least predictable of these affected costs, even though the principal reason that DFT techniques are often applied is to reduce the difficulty of test generation. Furthermore, there does not exist a complete understanding of which circuit attributes influence the difficulty of test generation. In this thesis, a model is developed which predicts the difficulty of automatic test generation for non-scan sequential circuits. This model is based on a newly recognized circuit attribute, termed density of encoding, which differs from those notions which have been used to describe this difficulty in the past. This thesis also discusses how the concept of the density of encoding can be applied to devise more powerful sequential automatic test pattern generation algorithms, more efficient DFT techniques, and more effective synthesis for testability schemes."

Download or read book The Implementation of a Parallel Automatic Test Pattern Generation System for Sequential Circuits written by Donald E. Edenfeld and published by . This book was released on 1996 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Combinational Test Generation for Sequential Circuits written by Yong Chang Kim and published by . This book was released on 2002 with total page 172 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Automatic Test Pattern Generator for Full Scan Sequential Circuits Using Limited Scan Operations written by Vinod Pagalone and published by . This book was released on 2006 with total page 83 pages. Available in PDF, EPUB and Kindle. Book excerpt: In testing sequential circuits with scan chains, the test application time is the main factor that determines the overall cost of testing the circuit. For these circuits, the test application time principally depends on the number flip-flops as well as the number of vectors in the test set. Though test set compaction is one way of reducing test application time, for a significant reduction in testing costs the duration of scan operation has to be reduced. The proposed method achieves this by using limited scan operations where the number of shifts is smaller that the actual length of the scan chain. Thus the compacted test set consists of limited scan operations in places where the scan operation cannot be dropped completely. The method uses an iterative procedure that identifies the vectors that have high fault coverage with minimal shifts in the scan chain.

Download or read book Time Efficient Automatic Test Pattern Generation Systems written by Byungse So and published by . This book was released on 1994 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Study of Automatic Test Pattern Generation Systems written by Kyuchull Kim and published by . This book was released on 1992 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Hierarchical Test Pattern Generation and Untestability Identification Techniques for Synchronous Sequential Circuits written by Anna Rannaste and published by . This book was released on 2010 with total page 127 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Download or read book Modeling the Difficulty of Sequential Automatic Test Pattern Generation written by Thomas E. Marchok and published by . This book was released on 1995 with total page 22 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "This paper introduces a model which describes the cost of automatic test pattern generation for (non-scan) sequential logic in terms of attributes of the circuit under test. This model addresses the core issue involved in IC design and test trade-offs, and can be used to evaluate the cost effectiveness of potential design-for-testability (DFT) techniques."

Download or read book Incremental Test Pattern Generation for Sequential Circuits written by Bogdan Madzar and published by . This book was released on 1994 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: