Download or read book Automated Dual tip Scanning Near field Optical Microscope for Investigation of Nanophotonic Systems written by Najmeh Abbasirad and published by . This book was released on 2022* with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main goal of this dissertation was to realize a fully automated and robust dual-tip scanning near-field optical microscope (SNOM) and demonstrate its capabilities to characterize nanophotonic systems. The dual-tip SNOM accesses optical information not simply attained with other super-resolution microscopy techniques. This work thoroughly explained the implementation of a collision prevention scheme and the realization of the fully automated dual-tip SNOM, in which the detection tip automatically scans the entire area surrounding the excitation tip without collision. After successfully implementing the automated dual-tip SNOM, the setup was utilized to measure the near-field of different photonic materials. First, the dual-tip SNOM was used to explore the polarization characteristic of the emission from the bent fiber aperture tip through exciting surface plasmon polaritons (SPPs) on an air-gold interface. Another unique application of the dual-tip SNOM is to excite the edge or corner of a photonic system locally. The automated detection tip was used to map a complex near-field pattern due to the excited SPPs and reflected SPPs from the edges of the truncated triangular gold platelet. The most distinguished capability of the automated dual-tip SNOM shown in this thesis is spectral- and spatial-dependent near-field measurements of a nanodisk metasurface as a nanostructured sample. In spectral-dependent near-field measurements, the excitation tip illuminated the silicon metasurface at different wavelengths. In spatial-dependence near-field measurements, the fixed excitation wavelength was used to measure the position-dependent near-field intensities when the metasurface was displaced relative to the excitation tip. It was demonstrated that the integrated measured near-field intensities by the detection tip could be related to the metasurface's partial local density of optical states at the excitation tip's position.
Download or read book Scanning Near Field Optical Microscopy written by and published by . This book was released on 2015 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Building Practical Apertureless Scanning Near field Microscopy written by Muhammed Zeki Gungordu and published by . This book was released on 2010 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fundamental objective of this study is to establish a functional, practical apertureless type scanning near-field optical microscope, and to figure out the working mechanism behind it. Whereas a far-field microscope can measure the propagating field's components, this gives us little information about the features of the sample. The resolution is limited to about half of the wavelength of the illuminating light. On the other hand, the a-SNOM system enables achieving non-propagating components of the field, which provides more details about the sample's features. It is really difficult to measure because the amplitude of this field decays exponentially when the tip is moved away from the sample. The sharpness of the tip is the only limitation for resolution of the a-SNOM system. Consequently, the sharp tips are achieved by using electrochemical etching, and these tips are used to detect near-field signal. Separating the weak a-SNOM system signals from the undesired background signal, the higher demodulation background suppression is utilized by lock-in detection.
Download or read book Near field Optical Microscope Investigations of Inmmiscibility Effects and Photoreflectance Contrast in III V Semiconductor Materials written by Charles A. Paulson and published by . This book was released on 2002 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Atomic Force Microscopy Scanning Nearfield Optical Microscopy and Nanoscratching written by Gerd Kaupp and published by Springer Science & Business Media. This book was released on 2006-10-24 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
Download or read book Near field Scanning Optical Microscopy Studies of Photonic Structures and Materials written by Anthony Louis Campillo and published by . This book was released on 2002 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Development of a Near field Scanning Optical Microscope and Its Application in Studying the Optical Mode Localization of Self affine Ag Colloidal Films written by Peng Zhang and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Investigation of a Near infrared Near field Scanning Optical Microscope for Both Biological and Conducting Samples written by W. Charles Symons and published by . This book was released on 1999 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Phase shifting Interferometry for Near field Optical Microscopy and Nanoparticle Detection written by Bradley M. Deutsch and published by . This book was released on 2011 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Two systems capable of investigating linear scattering from nanoscopic systems are developed. The first is a Scanning Near-field Optical Microscope (SNOM), which is used to image near fields of optical antennas in the near-infrared (NIR) and visible regimes. The second is a scalable apparatus for detection and characterization of nanoparticles in solution, for which sensitivity to 30 nanometer particles with a bandwidth of> 1 kilohertz is demonstrated. In SNOM, a sharp probe is scanned in the near field of an illuminated sample to create an image with resolution far exceeding the diffraction limit. Optical antennas are of interest as a SNOM sample because of their potential applications in energy harvesting, microscopy and light emission. The physics of optical antennas is not well understood, and near-field imaging is an important step in their design and development. The home-built SNOM presented in this thesis is one of the first to operate in the visible spectrum, where optical antennas are applicable. It uses phase-shifting interferometry to decouple amplitude and phase of scattered fields. The instrument is used to investigate near-field coupling of nanoparticles, and to image simple optical antennas fabricated with focused ion-beam lithography. It has also been demonstrated that interferometric detection with elastic light scattering is a viable method for detection and characterization of nanoparticles in solution, which has applications in manufacturing, environmental monitoring, biodefense and medical research. Such methods have shortcomings, including small throughput and difficulty of scaling the apparatus to small sizes. The latter makes it impractical to use the device in the field or clinic. Therefore, a homebuilt dual-phase particle detection apparatus is presented, which makes two orthogonal interferometric measurements to decouple amplitude and phase of fields scattered from nanoparticles, and uses no active optical elements or lock-in detection. Benchmark sensitivity to 30nm particles with detection bandwidth> 1kHz is shown"--Leaves vii-viii.
Download or read book Theoretical Investigations Into Apertureless Scanning Near Field Optical Microscopy Systems written by Anna Linda Demming and published by . This book was released on 2006 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Dual wavelength Scanning Near field Optical Microscopy written by Philip R. LeBlanc and published by . This book was released on 2002 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: "A dual-wavelength Scanning Near-Field Optical Microscope was developed in order to investigate near-field contrast mechanisms as well as biological samples in air. Using a helium-cadmium laser, light of wavelengths 442 and 325 nanometers is coupled into a single mode optical fiber. The end of the probe is tapered to a sub-wavelength aperture, typically 50 nanometers, and positioned in the near-field of the sample. Light from the aperture is transmitted through the sample and detected in a confocal arrangement by two photomultiplier tubes. The microscope has a lateral topographic resolution of 10 nanometers, a vertical resolution of 0.1 nanometer and an optical resolution of 30 nanometers. Two alternate methods of producing the fiber probes, heating and pulling, or acid etching, are compared and the metal coating layer defining the aperture is discussed. So-called "shear-force" interactions between the tip and sample are used as the feedback mechanism during raster scanning of the sample. An optical and topographic sample standard was developed to calibrate the microscope and extract the ultimate resolution of the instrument. The novel use of two wavelengths enables the authentication of true near-field images, as predicted by various models, as well as the identification of scanning artifacts and the deconvolution of often highly complicated relationships between the topographical and optical images. Most importantly, the use of two wavelengths provides information on the chemical composition of the sample. Areas of a polystyrene film are detected by a significant change in the relative transmission of the two wavelengths with a resolution of 30 nanometers. As a biological application, a preliminary investigation of the composition of Black Spruce wood cell fibers was performed. Comparisons of the two optical channels reveal the expected lignin distributions in the cell wall." --
Download or read book Laborers in the Vineyard Bible Study written by and published by . This book was released on 2008 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Development and Application of a Near field Scanning Optical Microscope in the Studies of Compound Semiconductor Materials written by Jutong Liu and published by . This book was released on 1996 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Investigation of Tapping mode Scanning Near field Optical Microscope written by Yi-ting Huang and published by . This book was released on 2001 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt: "A crucial part of the Scanning Near-Field Microscope (SNOM) is the distance regulation that keeps the separation of a fiber probe tip and the sample surface constant. Previously, shear-force detection was implemented. Shear-force interactions have the disadvantage of being destructive on soft sample. The implementation of an alternative tapping-mode is investigated in this thesis. In tapping-mode, the fiber tip oscillates perpendicularly to the sample surface, thus avoiding the destructive lateral shear-force." --
Download or read book Silver Nanowire based Near field Scanning Optical Microscope for Photocurrent Mapping written by Qiushi Liu and published by . This book was released on 2018 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silver-based Near-field Scanning Optical Microscopy provides access to high spatial resolution photocurrent image mapping of the surface of a variety of two-dimensional material and nanostructures. By observing the photocurrent from the interaction between nano-photons and nano-materials, nano-scale bandstructure information can be studied. For one of its application, strain-induced graphene wrinkle FET's photocurrent has been investigated. Under different channel and gate bias voltages, the photocurrent responses have been mapped point by point, and bias-voltage-related bandstructure information has been obtained. 15 nm photocurrent imaging resolution has been achieved for the first time. Conventional scattering Near-field Scanning Optical Microscopy is not able to provide near-field electric field distribution within the gap between tip and sample. Here we provide an accurate method to reconstruct the near-field electric field on a wide range of two-dimensional material and nanostructures.
Download or read book Near Field Scanning Optical Microscope for Organic Photonic Materials written by and published by . This book was released on 2000 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this project, we requested funds from the Air Force of Scientific Research (AFOSR) under DOD's Defense University Research Instrumentation Program (DURIP) to acquire a near-field scanning optical microscope (NSOM). Near-field scanning optical microscope (NSOM) is a unique research tool commercialized in the past two years, which provides unprecedented optical resolution defying the diffraction limit, as small as 1/20 laterally and 1/100 vertically. The funds from AFOSR has enabled us to purchase and install a state-of-the-art NSOM from TopoMetric. We have successfully installed and tested the instrument. A number of experiments have been performed using the instrument. The NSOM has proved to be a powerful instrument which allows innovative new approaches to address fundamental issues and enhance the existing and future DOD sponsored research projects in the University of Rochester. The preliminary application of the NSOM has already demonstrated the great potential of NSOM, its value to DOD sponsored research, and its usefulness for training future scientists and engineers for the DOD interests.
Download or read book Spatial Temporal Resolution in Near Field Optical Microscopy written by Hans Hallen and published by . This book was released on 1998 with total page 13 pages. Available in PDF, EPUB and Kindle. Book excerpt: This project elucidated and examined the unique science behind the spectral and temporal contrast of near field scanning optical microscopy, illuminated the technology this enabled, and considered the limits of simultaneous position, time and spectral resolution. Specifically, (1) High-resolution, quantitative measurements of excess carrier lifetime in silicon were acquired in a novel, all-optical technique. The contrast in the images was modeled and is of interest since the resolution is significantly shorter than the carrier diffusion length. (2) a Ti-sapphire laser has been constructed and modified to decrease pump power requirements so that measurements can be made before the carriers diffuse from under the probe. Novel electron-hole droplet effects are expected. (3) Spectroscopic nano-Raman images were acquired for the first time. The Raman data illustrated interesting manifestations of a near-field in comparisons with far-field spectroscopy. (4) The first and most thorough studies of the optical and thermal properties of near-field scanning optical microscope probes gave insights which led to the development of a new generation of high throughput probes. Other results reflect instrumentation advances: (5) A new constant linear motion system useful for NSOM or other probe microscope coarse approach. (6) A new, low cost force feedback system. (7) A nanometer-resolution, kHz bandwidth, millimeter range position sensor.
