Download or read book Atomic Force Microscopy Methods for the Analysis of High let Tracks in CR 39 Plastic Nuclear Track Detector written by Carl E. Jr Johnson and published by . This book was released on 2009 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Energy Research Abstracts written by and published by . This book was released on 1995 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Measurement Instrumentation and Sensors Handbook written by John G. Webster and published by CRC Press. This book was released on 2017-12-19 with total page 1921 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Second Edition of the bestselling Measurement, Instrumentation, and Sensors Handbook brings together all aspects of the design and implementation of measurement, instrumentation, and sensors. Reflecting the current state of the art, it describes the use of instruments and techniques for performing practical measurements in engineering, physics, chemistry, and the life sciences and discusses processing systems, automatic data acquisition, reduction and analysis, operation characteristics, accuracy, errors, calibrations, and the incorporation of standards for control purposes. Organized according to measurement problem, the Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement volume of the Second Edition: Contains contributions from field experts, new chapters, and updates to all 98 existing chapters Covers sensors and sensor technology, time and frequency, signal processing, displays and recorders, and optical, medical, biomedical, health, environmental, electrical, electromagnetic, and chemical variables A concise and useful reference for engineers, scientists, academic faculty, students, designers, managers, and industry professionals involved in instrumentation and measurement research and development, Measurement, Instrumentation, and Sensors Handbook, Second Edition: Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement provides readers with a greater understanding of advanced applications.
Download or read book Measurement Instrumentation and Sensors Handbook Second Edition written by John G. Webster and published by CRC Press. This book was released on 2014-02-03 with total page 1925 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Second Edition of the bestselling Measurement, Instrumentation, and Sensors Handbook brings together all aspects of the design and implementation of measurement, instrumentation, and sensors. Reflecting the current state of the art, it describes the use of instruments and techniques for performing practical measurements in engineering, physics, chemistry, and the life sciences and discusses processing systems, automatic data acquisition, reduction and analysis, operation characteristics, accuracy, errors, calibrations, and the incorporation of standards for control purposes. Organized according to measurement problem, the Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement volume of the Second Edition: Contains contributions from field experts, new chapters, and updates to all 98 existing chapters Covers sensors and sensor technology, time and frequency, signal processing, displays and recorders, and optical, medical, biomedical, health, environmental, electrical, electromagnetic, and chemical variables A concise and useful reference for engineers, scientists, academic faculty, students, designers, managers, and industry professionals involved in instrumentation and measurement research and development, Measurement, Instrumentation, and Sensors Handbook, Second Edition: Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement provides readers with a greater understanding of advanced applications.
Download or read book A Table of Parameters for Heavy Ion Tracks in CR 39 Nuclear Track Detector written by E. Holeman and published by . This book was released on 1980 with total page 41 pages. Available in PDF, EPUB and Kindle. Book excerpt: A number of parameters that are generally used for the analysis of the heavy ion tracks in CR-39 Nuclear Track Detector have been computed. The parameters are: Residual Range(R), Velocity (beta=V/c), Kinetic Energy per Nucleon (e/nucleon), Effective Charge (z sub eff) and Energy Loss of heavy ions (dE/dx). The computation has been performed for isotopes of interest in cosmic ray work, with charges in the region 2
Download or read book Detection of Tracks and Stars in Nuclear Track Plates written by E. H. Land and published by . This book was released on 1950 with total page 8 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Atomic force Microscopy and Its Applications written by Tomasz Tański and published by BoD – Books on Demand. This book was released on 2019-01-30 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
Download or read book Atomic Force Microscopy Scanning Tunneling Microscopy 3 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.
Download or read book Atomic Force Microscopy Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.
Download or read book Impact of X ray Dose on the Response of CR 39 Nuclear Track Detector to 1 5 5 MeV Alphas and 0 5 9 1 MeV Protons for Spectroscopy at the OMEGA Laser Facility and the National Ignition Facility written by Rojas Herrera Rojas and published by . This book was released on 2016 with total page 47 pages. Available in PDF, EPUB and Kindle. Book excerpt: The CR-39 nuclear track detector is used in many nuclear diagnostics fielded at inertial confinement fusion (ICF) facilities. Large x-ray fluences generated by ICF experiments may impact the CR-39 response to incident charged particles. To determine the impact of x-ray exposure on the CR-39 response to protons and alpha particles, a thick-target bremsstrahlung x-ray generator was used to expose CR-39 to various doses of 30 and 8keV Cu-K[alpha] and K[beta] x-rays. The CR-39 detectors were then exposed to 1-5.5 MeV alphas or 0.5- 9.1 MeV protons. The regions of the CR-39 exposed to x-rays showed a smaller track diameter than those not exposed to x-rays: for example, a dose of 3.0±0.1 Gy causes a decrease of (19±2)% in the track diameter of a 5.5 MeV alpha, while a dose of 6.0±0.1 Gy results in a decrease of (29±1)% in the track diameter of a 3.0 MeV proton. The reduced track diameters were found to be predominantly caused by a comparable reduction in the bulk etch rate of the CR-39 with x-ray dose. A residual effect, due to changes in track etch rate and dependent on incident particle energy, was characterized by an empirical formula.
Download or read book Advances in Nuclear Particle Dosimetry for Radiation Protection and Medicine written by J. Zoetelief and published by . This book was released on 2004 with total page 952 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2015-02-24 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Download or read book Applied Scanning Probe Methods II written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2006-06-22 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Download or read book Fundamentals Of Atomic Force Microscopy Part I Foundations written by Ronald G Reifenberger and published by World Scientific. This book was released on 2015-09-29 with total page 341 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Download or read book Atomic Force Microscopy Scanning Nearfield Optical Microscopy and Nanoscratching written by Gerd Kaupp and published by Springer Science & Business Media. This book was released on 2006-10-24 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
Download or read book Atomic Force Microscopy written by Bessie Moss and published by . This book was released on 2018 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic Force Microscopy: Principles, Developments and Applications presents Atomic Force Microscopy (AFM) as one of the most powerful tools for the analysis of morphologies because it creates three-dimensional images at the angstrom and nano scale. This technique has been exhaustively used in the analyses of the dispersion of nanometric components in nanocomposites and in polymeric blends because of the easiness of the sample preparation and lower equipment maintenance costs compared to the electron microscopy. Contributions to different application areas using the AFM are described, emphasizing the analysis of the morphology of composites/nanocomposites and polymeric blends based on elastomeric materials. Following this, the authors examine the basic concept of DEP and its integration with AFM to generate DEP, as well as review DEP-based AFM methods of imaging local electric polarizability with nanoscale spatial resolution. The direct measurement of DEP strength and polarity using a multi-pass AFM technique is described, contributing to the optimization and calibration of DEP integrated nano-devices for the effective control and manipulation of target biomolecules. The combination of in situ AFM-study of model crystals and ex situ-scanning of natural crystals makes it possible to carry out a partial reconstruction of natural crystallogenetics processes. With the use of these methods and microtomography, the authors estimate the concentration of silica in the mother solution at the time of capture of inclusions was estimated for the first time. Next, a study is presented with the goal of evaluating the morphology of surface asphalt films obtained through spin coating and characterized by AFM. The samples were pure asphalt and modified with two types of asphaltenes called continental type and archipelago type. The asphaltene fractions in the micellar system define the morphological stability of the asphalt resulting from a contribution of all the existing forces between the supramolecules of the system. The closing study presents in situ AFM investigations of crystal dissolution. The statistical data shows considerable differences in tangential dissolution rate on the two spirals consisting of nine and four screw dislocations.
Download or read book Applied Scanning Probe Methods III written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2006-02-22 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
