Download or read book Atom Probe Based Correlative Multi Microscopy for the Study of Low Dimensional Semiconductors written by Lorenzo Mancini and published by . This book was released on 2016 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis reports on the correlation of optical and structural properties of selected low dimensional semiconductor systems, obtained through the application of an original correlative multi-microscopy approach based on Atom Probe Tomography (APT), Scanning Transmission Electron Microscopy (STEM)/electron tomography and (time-resolved) micro-photoluminescence ((TR)PL).The analysis of nanoscale tip specimens with the three techniques aims to correlate the structural properties of single nanostructures imaged by STEM and/or APT, with their optical properties observed by optical spectroscopy. This correlation is performed within the framework of the effective mass approximation, using the APT (or STEM) 3-dimensional chemical mapping as input data for calculations, obtaining insight into the electron and hole spatial probability distributions in addition to the transition energies. In order to ensure the reliability of APT composition measurements required for performing effective mass simulations, a study of the biases affecting the measured compositions of four binary compounds (GaN, AlN, ZnO and MgO), two ternary alloys (InGaN and AlGaN) and one doped binary oxide (Tb:ZnO) was performed. A systematic analysis of the atomic fraction dependence of different atomic species on the experimental parameters allowed concluding that measured compositions of the studied binary compounds mostly depends on the surface field at which the evaporation process takes place, with an overestimation of the metallic element fraction at low field. This behavior can be explained in terms of preferential evaporationof metallic elements at high field and loss of neutral molecules at low field (evaporating as neutrals or formed by dissociation of molecular ions). The ternary compounds and doped ZnO reflect the behavior observed in binary compounds, but while for InGaN and AlGaN a good assessment of the site fractions of metallic elements is possible under suitable conditions of analysis, an unambiguous quantification of Tb content in ZnO could not be attained. A statistically correlative approach, for which APT, STEM and PL analyses are not performed on the same object, was applied for the analysis of GaAs/AlGaAs quantum dot (QD)-like structures self-assembled within coreshell nanowires and of a GaN/AlGaN multi-quantum well (QW) structure. Notwithstanding the statistical nature of the correlative study, this approach was able to prove in the former system the formation of quantum confining heterostructures from composition fluctuations within the AlGaAs barriers. For the latter, the structure of the layered system was correlated with both the temperature dependence of the PL signal intensity and the excitonic decay times issued by TRPL.. The application of the correlative multi-microscopy on optically active field emission tips prepared out of non-polar InGaN/GaN QWs extracted from the side facets of core-shell microwires and of a GaN/AlN Stranski-Krastanov QD system allowed respectively for the study of the effect of stacking faults on the optical properties of single QWs and for the assessment of the influence of QDs thickness fluctuations on transition energies, charge carriers localization, and biexciton-exciton cascade processes. The ensemble of these results not only provides a deep insight into the relationship between structural and functional properties of semiconductor heterostructures, but also constitutes the first step towards the development of an instrument that will allow performing simultaneously APT and PL analyses on optically active field emission tips. A prototype of this instrument has been developed and first optical spectroscopy results were obtained.
Download or read book Atom Probe Microscopy written by Baptiste Gault and published by Springer Science & Business Media. This book was released on 2012-08-27 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Download or read book Atom Probe Tomography written by Williams Lefebvre and published by Academic Press. This book was released on 2016-05-30 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials Written for both experienced researchers and new users Includes exercises, along with corrections, for users to practice the techniques discussed Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Download or read book Atom Probe Tomography written by Michael K. Miller and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Download or read book Computational Materials Design written by Tetsuya Saito and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book consists of ten chapters which outline a wide range of technologies from first-principle calculations to continuum mechanics, with applications to materials design and development. Written with a clear exposition, this book will be invaluable for engineers who want to learn about the modern technologies and techniques utilized in materials design.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1988 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1984 with total page 450 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Annual Review written by 分子科学研究所 and published by . This book was released on 2003 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Atomic Layer Deposition for Semiconductors written by Cheol Seong Hwang and published by Springer Science & Business Media. This book was released on 2013-10-18 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offering thorough coverage of atomic layer deposition (ALD), this book moves from basic chemistry of ALD and modeling of processes to examine ALD in memory, logic devices and machines. Reviews history, operating principles and ALD processes for each device.
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1991 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Japanese Journal of Applied Physics written by and published by . This book was released on 2004 with total page 1098 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Download or read book Defects in Self Catalysed III V Nanowires written by James A. Gott and published by Springer Nature. This book was released on 2022-01-28 with total page 158 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis presents an in-depth exploration of imperfections that can be found in self-catalysed III-V semiconductor nanowires. By utilising advanced electron microscopy techniques, the interface sharpness and defects at the atomic and macroscopic scale are analysed. It is found that a surprising variety and quantity of defect structures can exist in nanowire systems, and that they can in fact host some never-before-seen defect configurations. To probe how these defects are formed, conditions during nanowire growth can be emulated inside the microscope using the latest generation of in-situ heating holder. This allowed the examination of defect formation, dynamics, and removal, revealing that many of the defects can in fact be eliminated. This information is critical for attaining perfect nanowire growth. The author presents annealing strategies to improve crystal quality, and therefore device performance.
Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Download or read book Japanese Science and Technology written by and published by . This book was released on 1986 with total page 724 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Modern Techniques of Surface Science written by D. P. Woodruff and published by Cambridge University Press. This book was released on 1994-03-03 with total page 612 pages. Available in PDF, EPUB and Kindle. Book excerpt: Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.
