Download or read book Handbook of Automotive Power Electronics and Motor Drives written by Ali Emadi and published by CRC Press. This book was released on 2017-12-19 with total page 909 pages. Available in PDF, EPUB and Kindle. Book excerpt: Initially, the only electric loads encountered in an automobile were for lighting and the starter motor. Today, demands on performance, safety, emissions, comfort, convenience, entertainment, and communications have seen the working-in of seemingly innumerable advanced electronic devices. Consequently, vehicle electric systems require larger capacities and more complex configurations to deal with these demands. Covering applications in conventional, hybrid-electric, and electric vehicles, the Handbook of Automotive Power Electronics and Motor Drives provides a comprehensive reference for automotive electrical systems. This authoritative handbook features contributions from an outstanding international panel of experts from industry and academia, highlighting existing and emerging technologies. Divided into five parts, the Handbook of Automotive Power Electronics and Motor Drives offers an overview of automotive power systems, discusses semiconductor devices, sensors, and other components, explains different power electronic converters, examines electric machines and associated drives, and details various advanced electrical loads as well as battery technology for automobile applications. As we seek to answer the call for safer, more efficient, and lower-emission vehicles from regulators and consumer insistence on better performance, comfort, and entertainment, the technologies outlined in this book are vital for engineering advanced vehicles that will satisfy these criteria.

Download or read book Electrical Overstress EOS written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2013-08-27 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

Download or read book ESD Testing written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2016-10-07 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

Download or read book ESD written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2015-04-24 with total page 565 pages. Available in PDF, EPUB and Kindle. Book excerpt: ESD: Circuits and Devices 2nd Edition provides a clear picture of layout and design of digital, analog, radio frequency (RF) and power applications for protection from electrostatic discharge (ESD), electrical overstress (EOS), and latchup phenomena from a generalist perspective and design synthesis practices providing optimum solutions in advanced technologies. New features in the 2nd edition: Expanded treatment of ESD and analog design of passive devices of resistors, capacitors, inductors, and active devices of diodes, bipolar junction transistors, MOSFETs, and FINFETs. Increased focus on ESD power clamps for power rails for CMOS, Bipolar, and BiCMOS. Co-synthesizing of semiconductor chip architecture and floor planning with ESD design practices for analog, and mixed signal applications Illustrates the influence of analog design practices on ESD design circuitry, from integration, synthesis and layout, to symmetry, matching, inter-digitation, and common centroid techniques. Increased emphasis on system-level testing conforming to IEC 61000-4-2 and IEC 61000-4-5. Improved coverage of low-capacitance ESD, scaling of devices and oxide scaling challenges. ESD: Circuits and Devices 2nd Edition is an essential reference to ESD, circuit & semiconductor engineers and quality, reliability &analysis engineers. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, microelectronics and IC design.

Download or read book ESD written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2004-10-29 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials. Provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. Analyses the behaviour of semiconductor devices under ESD conditions. Addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. Covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. Discusses the design and development implications of ESD in semiconductor technologies. An invaluable reference for EMC non-specialist engineers and researchers working in the fields of IC and transistor design. Also, suitable for researchers and advanced students in the fields of device/circuit modelling and semiconductor reliability.

Download or read book Motor Operated Commercial Food Preparing Machines UL 763 written by American National Standards Institute and published by . This book was released on 1993-10 with total page 51 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Switched Reluctance Motor Drives written by Babak Fahimi and published by . This book was released on 2017 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book gives readers crucial information to understand magnetic design, dynamic modeling, and high-grade control of switched reluctance motor drives (SRM) in the context of various motoring and generation applications. That includes those required in automotive, consumer products, and energy-harvesting industries. Content covers experimental and application-related design strategies and provides insightful explanations of multi-physics problems within SRM. It opens the door for new opportunities to use SRM drives in other relevant industries, especially those aimed at operation under harsh environmental conditions and very high speeds."--Provided by publisher.

Download or read book 2017 Nesc R Handbook written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2016-08-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Devices Mechanical and Climatic Test Methods Electrostatic Discharge ESD Sensitivity Testing Charged Device Model CDM Device Level written by British Standards Institute Staff and published by . This book was released on 1917-07-10 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrostatics, Electric charge, Electronic equipment and components, Electric discharges, Mechanical testing, Semiconductor devices, Test methods, Environmental testing, Integrated circuits

Download or read book Semiconductor Devices written by and published by . This book was released on 2017 with total page 44 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Devices Mechanical and Climatic Test Methods Electrostatic Discharge ESD Sensitivity Testing Human Body Model HBM written by British Standards Institute Staff and published by . This book was released on 1918-04-30 with total page 56 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor devices, Electronic equipment and components, Degradation, Sensitivity, Climate, Integrated circuits, Electrostatics, Environmental testing, Human body, Test models, Grades (quality), Mechanical testing, Damage, Electrical testing, Classification systems

Download or read book Semiconductor Devices Mechanical and Climatic Test Methods Electrostatic Discharge ESD Sensitivity Testing Machine Model MM written by British Standards Institute Staff and published by . This book was released on 2006-09-29 with total page 16 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Electrostatics, Sensitivity, Classification systems, Grades (quality), Electrical testing, Damage, Degradation, Test models

Download or read book ANSI ESD SP15 1 2011 In Use Resistance Testing of Gloves and Finger Cots written by ESD Association and published by . This book was released on 2011 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: