Download or read book Analog Model Parameter Extraction circuits for Process Monitoring written by Manisha Arora and published by . This book was released on 2019 with total page 34 pages. Available in PDF, EPUB and Kindle. Book excerpt: A method for extracting the three parameters of the well-known level-2 Spice MOSFET-model namely threshold voltage, transconductance parameter, and channel length modulation is presented. Currently circuit design is based on CAD tools using complex model parameters obtained by laborious and expensive methods. While this is essential to design reliable systems on a chip, simpler analog techniques can be used for process monitoring. This work presents simple on-chip analog circuits that can characterize MOSFET just by measuring voltages and currents thus reducing the time and complexity of measurement. For this, on-chip implementation of two parameter extraction circuits are presented. The first circuit is for determining the threshold voltage Vth, and transconductance parameter (k). The second is to determine the channel-length modulation parameter (l). These circuits generate voltages or currents proportional to model parameters Vth, k and l. Simulation results and measured values from these circuits fabricated using TSMC 180nm process are presented. Results are also compared with accurate model parameters currently available in CAD tools to estimate the level of precision attainable using this method

Download or read book Introduction to Analog VLSI Design Automation written by Mohammed Ismail and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 191 pages. Available in PDF, EPUB and Kindle. Book excerpt: Very large scale integration (VLSI) technologies are now maturing with a current emphasis toward submicron structures and sophisticated applications combining digital as well as analog circuits on a single chip. Abundant examples are found on today's advanced systems for telecom munications, robotics, automotive electronics, image processing, intelli gent sensors, etc .. Exciting new applications are being unveiled in the field of neural computing where the massive use of analog/digital VLSI technologies will have a significant impact. To match such a fast technological trend towards single chip ana logi digital VLSI systems, researchers worldwide have long realized the vital need of producing advanced computer aided tools for designing both digital and analog circuits and systems for silicon integration. Ar chitecture and circuit compilation, device sizing and the layout genera tion are but a few familiar tasks on the world of digital integrated circuit design which can be efficiently accomplished by matured computer aided tools. In contrast, the art of tools for designing and producing analog or even analogi digital integrated circuits is quite primitive and still lack ing the industrial penetration and acceptance already achieved by digital counterparts. In fact, analog design is commonly perceived to be one of the most knowledge-intensive design tasks and analog circuits are still designed, largely by hand, by expert intimately familiar with nuances of the target application and integrated circuit fabrication process. The techniques needed to build good analog circuits seem to exist solely as expertise invested in individual designers.

Download or read book Analog Circuit Design for Process Variation Resilient Systems on a Chip written by Marvin Onabajo and published by Springer Science & Business Media. This book was released on 2012-03-08 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters; Includes built-in testing techniques, linked to current industrial trends; Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches; Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

Download or read book Analog Testing Characterization and Low order Model Extraction Using LabVIEW Automation written by Jeremy D. Brantley and published by . This book was released on 2012 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing circuits is a hands-on, time intensive process; it is also one of the most important steps in a design cycle. The most well designed circuit is only an academic exercise if it does not work in real life. The time and cost associated with bench level testing pales in comparison to testing for extreme environments. Testing in extreme heat, cold or radiation introduces a large set of challenges that are rarely encountered in standard bench level testing. The two most pronounced problems are the inaccessibility of the devices under test and time constraints, both short and protracted. Due to the physical properties of devices and circuits there is a short window in which all testing must be conducted for each incremental step during extreme environment tests. This time requirement does not present a significant challenge when testing a single circuit or device, but the cost associated with this testing is enough to encourage a more efficient method. The primary goal of this work is to reduce the time required to perform tests through the use of automation and parallel test schemes. The automation software chosen for this project was LabVIEW. LabVIEW is a graphical based programming language with an extensive library of functions for interfacing with test instrumentation. Due to the graphical nature of this language, display of measurement data is essentially a byproduct of the program. This allowed for confirmation of proper operation and immediate rectification if a problem was discovered. This paper will cover the key parameters of common devices and circuits, methods for extracting these parameters from other prevailing effect, and methods for automating these tests through the use of computer based tools such as LabVIEW.

Download or read book Computer Aided Design and Design Automation written by Wai-Kai Chen and published by CRC Press. This book was released on 2018-03-12 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume of The Circuits and Filters Handbook, Third Edition focuses on computer aided design and design automation. In the first part of the book, international contributors address topics such as the modeling of circuit performances, symbolic analysis methods, numerical analysis methods, design by optimization, statistical design optimization, and physical design automation. In the second half of the text, they turn their attention to RF CAD, high performance simulation, formal verification, RTK behavioral synthesis, system-level design, an Internet-based micro-electronic design automation framework, performance modeling, and embedded computing systems design.

Download or read book Silicon Germanium Heterojunction Bipolar Transistors for Mm wave Systems Technology Modeling and Circuit Applications written by Niccolò Rinaldi and published by CRC Press. This book was released on 2022-09-01 with total page 377 pages. Available in PDF, EPUB and Kindle. Book excerpt: The semiconductor industry is a fundamental building block of the new economy, there is no area of modern life untouched by the progress of nanoelectronics. The electronic chip is becomingan ever-increasing portion of system solutions, starting initially from less than 5% in the 1970 microcomputer era, to more than 60% of the final cost of a mobile telephone, 50% of the price of a personal computer (representing nearly 100% of the functionalities) and 30% of the price of a monitor in the early 2000’s.Interest in utilizing the (sub-)mm-wave frequency spectrum for commercial and research applications has also been steadily increasing. Such applications, which constitute a diverse but sizeable future market, span a large variety of areas such as health, material science, mass transit, industrial automation, communications, and space exploration.Silicon-Germanium Heterojunction Bipolar Transistors for mm-Wave Systems Technology, Modeling and Circuit Applications provides an overview of results of the DOTSEVEN EU research project, and as such focusses on key material developments for mm-Wave Device Technology. It starts with the motivation at the beginning of the project and a summary of its major achievements. The subsequent chapters provide a detailed description of the obtained research results in the various areas of process development, device simulation, compact device modeling, experimental characterization, reliability, (sub-)mm-wave circuit design and systems.

Download or read book Compact Models for Integrated Circuit Design written by Samar K. Saha and published by CRC Press. This book was released on 2018-09-03 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond provides a modern treatise on compact models for circuit computer-aided design (CAD). Written by an author with more than 25 years of industry experience in semiconductor processes, devices, and circuit CAD, and more than 10 years of academic experience in teaching compact modeling courses, this first-of-its-kind book on compact SPICE models for very-large-scale-integrated (VLSI) chip design offers a balanced presentation of compact modeling crucial for addressing current modeling challenges and understanding new models for emerging devices. Starting from basic semiconductor physics and covering state-of-the-art device regimes from conventional micron to nanometer, this text: Presents industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor (MOS) field-effect-transistors (FETs), FinFETs, and tunnel field-effect transistors (TFETs), along with statistical MOS models Discusses the major issue of process variability, which severely impacts device and circuit performance in advanced technologies and requires statistical compact models Promotes further research of the evolution and development of compact models for VLSI circuit design and analysis Supplies fundamental and practical knowledge necessary for efficient integrated circuit (IC) design using nanoscale devices Includes exercise problems at the end of each chapter and extensive references at the end of the book Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond is intended for senior undergraduate and graduate courses in electrical and electronics engineering as well as for researchers and practitioners working in the area of electron devices. However, even those unfamiliar with semiconductor physics gain a solid grasp of compact modeling concepts from this book.

Download or read book BSIM4 and MOSFET Modeling for IC Simulation written by Weidong Liu and published by World Scientific. This book was released on 2011 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the art of advanced MOSFET modeling for integrated circuit simulation and design. It provides the essential mathematical and physical analyses of all the electrical, mechanical and thermal effects in MOS transistors relevant to the operation of integrated circuits. Particular emphasis is placed on how the BSIM model evolved into the first ever industry standard SPICE MOSFET model for circuit simulation and CMOS technology development. The discussion covers the theory and methodology of how a MOSFET model, or semiconductor device models in general, can be implemented to be robust and efficient, turning device physics theory into a production-worthy SPICE simulation model. Special attention is paid to MOSFET characterization and model parameter extraction methodologies, making the book particularly useful for those interested or already engaged in work in the areas of semiconductor devices, compact modeling for SPICE simulation, and integrated circuit design.

Download or read book VLSI Systems Design written by and published by . This book was released on 1988 with total page 898 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Simulation and Analysis of Analog Circuit and PCM Process Control Monitor Test Structures in Circuit Design written by Udo Sobe and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Low Power High Resolution Analog to Digital Converters written by Amir Zjajo and published by Springer Science & Business Media. This book was released on 2010-10-29 with total page 311 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.

Download or read book Automated Layout inclusive Synthesis of Analog Circuits Using Symbolic Performance Models written by and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A key task in the automated design of analog/RF circuits is circuit sizing, a process that involves assigning numerical values to unknown circuit parameters of a fixed topology, while being subjected to a set of performance constraints. Over the years, the terms sizing and synthesis have been used interchangeably, and have become synonymous in the analog domain. Mature tools for the synthesis of digital circuits are abundant, but the market for analog synthesis tools is still growing and very few commercial products exist. Several techniques have been developed in the past for analog synthesis, ranging from knowledge-based methods to techniques using numerical simulation. A frequently used technique involves an iterative stochastic search, which uses numerical simulations at every probable design point, in order to obtain the performance metrics. Expensive computations and parasitics unawareness of this traditional method necessitates a scheme which can produce fast layout aware designs. In this dissertation a new synthesis methodology, which uses parameterized layout generators and symbolic performance models (SPMs) inside the synthesis loop, has been developed to overcome the deficiencies of the previous circuit sizing method. This layout-inclusive (layout-in-loop) approach uses efficient parameterized procedural layout generators, obtained using the module specification language (MSL) system, for speedy layout instantiation. Fast performance estimation is achieved by using pre-compiled SPMs, which are symbolic representation of circuit performances, obtained using symbolic analysis. The transfer functions of SPMs are stored as efficient symbolic graphs called element-coefficient diagrams (ECDs). Techniques to include layout geometry effects in the SPMs have also been developed. This method is used for the synthesis of op-amps and filters. The method proposed above for analog circuits is then applied to the synthesis of an RF low-noise amplifier (LNA). This method also uses symbolic performance models (SPMs), and parameterized layout generator along with high-frequency extraction techniques in the synthesis loop. SPMs for noise figure and distortion parameters are developed using repetitive and weakly nonlinear symbolic analysis and are stored as pre-compiled ECDs. Full parasitic extraction is done by using multiple extractors. Quasi-static extraction is used to obtain the critical parasitic effects of interconnects and on-chip inductors. Further in the dissertation, efforts are made to overcome the shortcomings of the proposed method. The first limitation is the size of circuits that can be synthesized. It arises because of the limit on the size of ECD-code that can be compiled by a standard GNU C++ compiler. To overcome this bottleneck, a new comprehensive method and framework for exact symbolic analysis of large analog circuits is developed. The method is based on the concepts of hierarchical circuit decomposition, subcircuit symbolic analysis and transfer function synthesis. Node tearing methods have been used for decomposition and element-coefficient diagrams (ECD) based method is used for symbolic analysis of subcircuits. One of the key contributions of this work is a generalized methodology for transfer function synthesis, encompassing all interconnection templates for any two subcircuits. The method leads to the development of an easily automatable and efficient algorithm for generation of symbolic transfer function of large circuits. The hierarchical technique, developed in this work, is then used for layout-inclusive synthesis of large analog circuits. Techniques have been developed to generate the list and interconnection of subcircuits which undergo hierarchical symbolic analysis. A circuit is decomposed into common building blocks of analog circuits, for which netlists are obtained by an extraction of corresponding layout modules. The interconnection parasitics may or may not exist in the module netlists and therefore they may form subcircuits of their own. The other shortcoming of this work is that of time during performance estimation is spent on operating point analysis using SPICE, a numerical simulator. To remove this dependence on numerical simulation and further speedup synthesis, we have developed a modified gm/ID method and used it for synthesis of analog circuits. EKV MOSFET model equations for all small-signal parameters have been extracted, and the conditions for a transistor to be in saturation, have been derived.

Download or read book Performance Optimization Techniques in Analog Mixed Signal and Radio Frequency Circuit Design written by Fakhfakh, Mourad and published by IGI Global. This book was released on 2014-10-31 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt: Improving the performance of existing technologies has always been a focal practice in the development of computational systems. However, as circuitry is becoming more complex, conventional techniques are becoming outdated and new research methodologies are being implemented by designers. Performance Optimization Techniques in Analog, Mix-Signal, and Radio-Frequency Circuit Design features recent advances in the engineering of integrated systems with prominence placed on methods for maximizing the functionality of these systems. This book emphasizes prospective trends in the field and is an essential reference source for researchers, practitioners, engineers, and technology designers interested in emerging research and techniques in the performance optimization of different circuit designs.

Download or read book Analog IC Reliability in Nanometer CMOS written by Elie Maricau and published by Springer Science & Business Media. This book was released on 2013-01-11 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

Download or read book Dependable Embedded Systems written by Jörg Henkel and published by Springer Nature. This book was released on 2020-12-09 with total page 606 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

Download or read book A Methodology for Modeling the Manufacturability of Integrated Circuits written by Eric David Boskin and published by . This book was released on 1995 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Machine Learning Support for Fault Diagnosis of System on Chip written by Patrick Girard and published by Springer Nature. This book was released on 2023-03-13 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.