Download or read book A Study of Electromigration in Thin Gold Films written by William Lee Harrod and published by . This book was released on 1975 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Study of Electromigration in Thin Gold Films written by Choong-hyun Yoo and published by . This book was released on 1989 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Study of the Early Stage of Electromigration in Gold Thin Films written by Shanyan Bai and published by . This book was released on 1998 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Tracer Study of Electromigration in Thin Au Films written by K. L. Tai and published by . This book was released on 1976 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Tracer Study of Electromigration in Thin Au Film written by King Lien Tai and published by . This book was released on 1976 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Electromigration and Temperature induced Structural Behavior of Gold Thin Films Based Upon Alkali Additions written by Susan Matts Goho and published by . This book was released on 1983 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electromigration in Thin Films written by Hans Martin Breitling and published by . This book was released on 1971 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electromigration in Aluminum Gold and Silver Thin Films written by Hans Joachim Geier and published by . This book was released on 1974 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Investigation of Electromigration Mechanisms in Silver Thin Films written by Christopher Joseph Waskiewicz and published by . This book was released on 1992 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electromigration in Thin Films and Electronic Devices written by Choong-Un Kim and published by . This book was released on 2011 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electromigration in Metallic Thin Films written by Tian Xie and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 892 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Theory of Electromigration induced Failure of Metal Thin Films written by Mohan Mahadevan and published by . This book was released on 1998 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electromigration in thin films of aluminium written by S. Roberts and published by . This book was released on 1982 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electromigration in ULSI Interconnections written by Cher Ming Tan and published by World Scientific. This book was released on 2010 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electromigration in ULSI Interconnections provides a comprehensive description of the electro migration in integrated circuits. It is intended for both beginner and advanced readers on electro migration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on electro migration, and examines the various interconnected systems and their evolution employed in integrated circuit technology. The subsequent chapters provide a detailed description of the physics of electro migration in both Al- and Cu-based Interconnections, in the form of theoretical, experimental and numerical modeling studies. The differences in the electro migration of Al- and Cu-based interconnections and the corresponding underlying physical mechanisms for these differences are explained. The test structures, testing methodology, failure analysis methodology and statistical analysis of the test data for the experimental studies on electro migration are presented in a concise and rigorous manner.Methods of numerical modeling for the interconnect electro migration and their applications to the understanding of electro migration physics are described in detail with the aspects of material properties, interconnection design, and interconnect process parameters on the electro migration performances of interconnects in ULSI further elaborated upon. Finally, the extension of the studies to narrow interconnections is introduced, and future challenges on the study of electro migration are outlined and discussed.

Download or read book Proceedings of the Symposium on Electromigration of Metals and First International Symposium on Multilevel Metallization and Packaging written by James R. Lloyd and published by . This book was released on 1985 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electromigration in Thin Metal Films written by Caroline Ross and published by . This book was released on 1988 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: