Download or read book A Concurrent Timing Error Detection Circuit for CMOS written by Christopher G. Knight and published by . This book was released on 1997 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI SoC Design Methodologies for SoC and SiP written by Christian Piguet and published by Springer. This book was released on 2010-04-08 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers that were p- sented during the 16th edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 16th conference was held at the Grand Hotel of Rhodes Island, Greece (October 13–15, 2008). Previous conferences have taken place in Edinburgh, Trondheim, V- couver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth, Nice and Atlanta. VLSI-SoC 2008 was the 16th in a series of international conferences sponsored by IFIP TC 10 Working Group 10.5 and IEEE CEDA that explores the state of the art and the new developments in the field of VLSI systems and their designs. The purpose of the conference was to provide a forum to exchange ideas and to present industrial and research results in the fields of VLSI/ULSI systems, embedded systems and - croelectronic design and test.
Download or read book Resilient Computer System Design written by Victor Castano and published by Springer. This book was released on 2015-04-15 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a paradigm for designing new generation resilient and evolving computer systems, including their key concepts, elements of supportive theory, methods of analysis and synthesis of ICT with new properties of evolving functioning, as well as implementation schemes and their prototyping. The book explains why new ICT applications require a complete redesign of computer systems to address challenges of extreme reliability, high performance, and power efficiency. The authors present a comprehensive treatment for designing the next generation of computers, especially addressing safety critical, autonomous, real time, military, banking, and wearable health care systems.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book New Methods of Concurrent Checking written by Michael Gössel and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.
Download or read book Proceedings written by and published by . This book was released on 2003 with total page 632 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Recent Trends in Electronics and Communication written by Amit Dhawan and published by Springer Nature. This book was released on 2021-12-13 with total page 1234 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book comprises select proceedings of the International Conference on VLSI, Communication and Signal processing (VCAS 2020). The contents are broadly divided into three topics – VLSI, Communication, and Signal Processing. The book focuses on the latest innovations, trends, and challenges encountered in the different areas of electronics and communication, especially in the area of microelectronics and VLSI design, communication systems and networks, and image and signal processing. It also offers potential solutions and provides an insight into various emerging areas such as Internet of Things (IoT), System on a Chip (SoC), Sensor Networks, underwater and underground communication networks etc. This book will be useful for academicians and professionals alike.
Download or read book Totally Self Checking Circuits and Testable CMOS Circuits written by Niraj K. Jha and published by . This book was released on 1986 with total page 123 pages. Available in PDF, EPUB and Kindle. Book excerpt: A Totally Self-Checking (TSC) circuit belongs to a class of circuits used for Concurrent Error Detection (CED) purposes. It consists of a functional circuit that has encoded inputs and outputs and a checker that monitors these outputs and gives and error indication. It is known that the traditional stuck-at fault model is not sufficient to model realistic physical failures. Techniques for implementing existing gate-level TSC circuits in nMOS. Domino-CMOS and standard CMOS technologies, so that they are TSC with respect to physical failures, are described. Design methods which reduce the transistor count, delay, and the number of tests of TSC checkers are also given. Another problem in the area of TSC circuits concerns embedded checkers whose inputs are not directly controllable. If they do not get all the required codewords to test them they cannot be guaranteed to be TSC. A new encoding technique and a design procedure to solve this problem are presented. It has been shown previously that the two-pattern tests used to test CMOS circuits can be invalidated by timing skews. A necessary and sufficient condition is derived to find out whether or not an AND-OR or and OR-AND CMOS realization exists for a given function so that a valid test set can always be found, even in the presence of arbitrary timing skews. A new Hybrid CMOS realization is introduced to take care of the cases in which this is not possible. Keywords: Encoding; Fault models; Self-checking circuits; and Testability.
Download or read book Reliability of Nanoscale Circuits and Systems written by Miloš Stanisavljević and published by Springer Science & Business Media. This book was released on 2010-10-20 with total page 215 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Download or read book CMOS Analog Integrated Circuits written by Tertulien Ndjountche and published by CRC Press. This book was released on 2019-12-17 with total page 1176 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-speed, power-efficient analog integrated circuits can be used as standalone devices or to interface modern digital signal processors and micro-controllers in various applications, including multimedia, communication, instrumentation, and control systems. New architectures and low device geometry of complementary metaloxidesemiconductor (CMOS) technologies have accelerated the movement toward system on a chip design, which merges analog circuits with digital, and radio-frequency components.
Download or read book On Line Testing Symposium 2003 IOLTS 2003 9th IEEE written by C. Metra and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Concurrent Error Detection written by Steven Scott Gorshe and published by . This book was released on 2002 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt: Concurrent error detection (CED) is the detection of errors or faults in a circuit or data path concurrent with normal operation of that circuit. The general approach for CED is to calculate a check symbol for the inputs to the circuit under operation, predict the check symbol that will result for the output of the circuit for those inputs, and compare the predicted check symbol to the one that is actually calculated for the output. If the predicted and actual check symbols are different, an error or fault has been detected. The alternative to this check symbol prediction is to use a second copy of the circuit under operation and compare the results of the two circuits. For some classes of circuits the prediction of the output check symbol can require less circuitry than a second copy of the circuit being tested. Four examples of these types of circuits are examined in this dissertation: Arithmetic Logic Units (ALUs), array multipliers, self-synchronous scrambler-descrambler pairs with their intervening data path, and switch fabrics. Faults in integrated circuits tend to produce unidirectional errors. Unidirectional errors are those in which all of the errors are in the same direction (e.g., 0 to 1 errors) within the block of data covered by a given check symbol. For this reason, codes that are optimized for unidirectional errors are the focus of investigation for most of the applications. In particular, the Bose-Lin codes are examined for those applications where unidirectional errors are expected to be typical. In order to examine the performance of the Bose-Lin codes in one of these applications, it was necessary to determine the theoretical performance for Bose- Lin codes for error rates beyond what had been previously studied. This analysis of Bose-Lin codes with large numbers of "burst" errors also included a further generalization of the codes.
Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Download or read book Iaeng Transactions on Electrical Engineering written by Sio-Iong Ao and published by World Scientific. This book was released on 2012-10-31 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains revised and extended research articles written by prominent researchers. Topics covered include electrical engineering, circuits, artificial intelligence, data mining, imaging engineering, bioinformatics, internet computing, software engineering, and industrial applications. The book offers tremendous state-of-the-art advances in electrical engineering and also serves as an excellent reference work for researchers and graduate students working with/on electrical engineering.
Download or read book Concurrent Error Detection with Latency in Sequential Circuits written by Lawrence Paul Holmquist and published by . This book was released on 1989 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Analog and Mixed signal Test written by Bapiraju Vinnakota and published by . This book was released on 1998 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.
Download or read book CMOS Circuits for Biological Sensing and Processing written by Srinjoy Mitra and published by Springer. This book was released on 2017-11-18 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the most comprehensive and consistent survey of the field of IC design for Biological Sensing and Processing. The authors describe a multitude of applications that require custom CMOS IC design and highlight the techniques in analog and mixed-signal circuit design that potentially can cross boundaries and benefit the very wide community of bio-medical engineers.
